المؤلفون: Bastos, J. P., O'Sullivan, B. J., Franco, J., Tyaginov, S., Truijen, B., Chasin, A., Degraeve, R., Kaczer, B., Ritzenthaler, R., Capogreco, E., Litta, E. D., Spessot, A., Higashi, Y., Yoon, Y., Machkaoutsan, V., Fazan, P., Horiguchi, N.

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :1-6 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Haliza Mohd Zahari, Mohd Muhaimin Ridwan Wong, Noor Diyana Fazan Ahmad, Fuad Abas

المصدر: MethodsX, Vol 12, Iss , Pp 102733- (2024)

مصطلحات موضوعية: Risk Profiling for Firefighters, Science

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2215016124001869; https://doaj.org/toc/2215-0161

URL الوصول: https://doaj.org/article/7ce821b6492c41c78be15d074fa24089

المؤلفون: Leonardo Henrique Fazan, Maria Elizete Kunkel, Denise Stringhini

المصدر: Revista Brasileira de Extensão Universitária, Vol 15, Iss 1 (2024)

مصطلحات موضوعية: Assistive Technology, 3D Printing, Inclusive Design, Tetraplegia, Computer Peripheral, Education, Special aspects of education, LC8-6691

وصف الملف: electronic resource

Relation: https://periodicos.uffs.edu.br/index.php/RBEU/article/view/13650; https://doaj.org/toc/1806-2695; https://doaj.org/toc/2358-0399

URL الوصول: https://doaj.org/article/0ba7461bd53d401e92921e3d7053c8ab

المؤلفون: Capogreco, E., Arimura, H., Ritzenthaler, R., Brus, S., Oniki, Y., Dupuy, E., Sebaai, F., Radisic, D., Chan, B. T., Zhou, D., Machkaoutsan, V., Yoon, S., Itokawa, H., Yamaguchi, M., Gao, Z., Fazan, P., Chen, Y., Subramanian, S., Ragnarsson, L.-A., Spessot, A., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :26.2.1-26.2.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Ritzenthaler, R., Capogreco, E., Dupuy, E., Arimura, H., Bastos, J. P., Favia, P., Sebaai, F., Radisic, D., Nguyen, V. T. H., Mannaert, G., Chan, B. T., Machkaoutsan, V., Yoon, Y., Itokawa, H., Yamaguchi, M., Chen, Y., Fazan, P., Subramanian, S., Spessot, A., Dentoni Litta, E., Samavedam, S., Horiguchi, N.

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :306-307 Jun, 2022

Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Galles, Grace D.^{Aff1, Aff2}, Infield, Daniel T., Clark, Colin J., Hemshorn, Marcus L., Manikandan, Shivani, Fazan, Frederico, Rasouli, Ali, Tajkhorshid, Emad, Galpin, Jason D., Cooley, Richard B., Mehl, Ryan A., Ahern, Christopher A.^{Aff1, IDs4146702235761w_cor12}

المصدر: Nature Communications. 14(1)

المؤلفون: O'Sullivan, B. J., Ritzenthaler, R., Litta, E. Dentoni, Simoen, E., Machkaoutsan, V., Fazan, P., Ji, Y. H., Kim, C., Spessot, A., Linten, D., Horiguchi, N.

المصدر: 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-11 Oct, 2019

Relation: 2019 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Boubaaya, M., O'Sullivan, B. J., Franco, J., Litta, E. D., Ritzenthaler, R., Dupuy, E., Machkaoutsan, V., Fazan, P., Kim, C., Benaceur-Doumaz, D., Ferhat Hamida, A., Djezzar, B., Spessot, A., Linten, D., Horiguchi, N.

المصدر: 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-5 Oct, 2019

Relation: 2019 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: O'Sullivan, B.J., Ritzenthaler, R., Rzepa, G., Wu, Z., Litta, E. Dentoni, Richard, O., Conard, T., Machkaoutsan, V., Fazan, P., Kim, C., Franco, J., Kaczer, B., Grasser, T., Spessot, A., Linten, D, Horiguchi, N.

المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-8 Mar, 2019

Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: O'Sullivan, B.J., Ritzenthaler, R., Dentoni Litta, E., Simoen, E., Machkaoutsan, V., Fazan, P., Ji, Y., Kim, C., Spessot, A., Linten, D., Horiguchi, N.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 20(2):258-268 Jun, 2020