المؤلفون: Strane, Jay, Brown, David, Lavoie, Christian, Suenaga, Jun, Haran, Bala, Press, Patrick, Besser, Paul, Flaitz, Philip, Gribelyuk, Michael, Kammler, Thorsten, Peidous, Igor, Chen, Huajie, Waidmann, Stephan, Frye, Asa, DeHaven, Patrick, Domenicucci, Anthony, Murray, Conal, Knarr, Randolph, Engelmann, H.J., Streck, Christof, Kahlert, Volker, Deshpande, Sadanand, Leobandung, Effendi, Pellerin, John, Jagannathan, Jaga

المصدر: 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications, 2007. VLSI-TSA 2007. International Symposium on. :1-2 Apr, 2007

Relation: 2007 International Symposium on VLSI Technology, Systems and Applications

المؤلفون: Mochizuki, Shogo, Loesing, Rainer, Zhu, Zhengmao, Domenicucci, Anthony G., Flaitz, Philip L., Li, Jinghong, Paruchuri, Vamsi

المصدر: In Thin Solid Films 30 April 2014 557:94-100

المؤلفون: Loquet, Yannick, Mignot, Yann, Waskiewicz, Christopher, Chen, James Hsueh-Chung, Sankarapandian, Muthumanickam, Chen, Shyng-Tsong, Flaitz, Philip, Tomizawa, Hideyuki, Tseng, Chia-Hsun, Beard, Marcy, Morris, Bryan, Kleemeier, Walter, Liniger, E., Spooner, Terry

المصدر: In Microelectronic Engineering July 2013 107:138-144

المؤلفون: Thompson, Keith, Flaitz, Philip L., Ronsheim, Paul, Larson, David J., Kelly, Thomas F.

المصدر: Science, 2007 Sep 01. 317(5843), 1370-1374.

URL الوصول: https://www.jstor.org/stable/20037755

المؤلفون: Lauhon, Lincoln J., Adusumilli, Praneet, Ronsheim, Paul, Flaitz, Philip L., Lawrence, Dan

المصدر: MRS Bulletin. 34(10):738-743

المؤلفون: Zhang, John H.^Aff1, Tseng, Wei-Tsu, Chen, Tien, Kim, Ben, Flaitz, Philip, Kleemier, Walter, Goldberg, Cindy, Truong, Connie, Grunow, Stephan

المصدر: MRS Online Proceedings Library. 1560(1)

المؤلفون: Moon, Bum Ki^{Aff1, Aff2}, Iijima, Tadashi^{Aff1, Aff2}, Malhotra, Sandra^{Aff1, Aff3}, Simon, Andrew^{Aff1, Aff4}, Shaw, Thomas^{Aff1, Aff4}, Ryan, Todd^{Aff1, Aff5}, Labelle, Cathy^{Aff1, Aff5}, Fuller, Nick^{Aff1, Aff4}, Bolom, Tibor^{Aff1, Aff5}, Dunn, Derren^{Aff1, Aff4}, Flaitz, Philip^{Aff1, Aff4}, Mehta, Sanjay^{Aff1, Aff4}, Inoue, Keishi^{Aff1, Aff6}, McGahay, Vincent^{Aff1, Aff4}

المصدر: MRS Online Proceedings Library. 863(1)

المؤلفون: Lu, Minhua, Shih, Da-Yuan, Kang, Sung K., Goldsmith, Charles, Flaitz, Philip

المصدر: Journal of Applied Physics; Sep2009, Vol. 106 Issue 5, p053509-053517, 8p, 2 Color Photographs, 10 Black and White Photographs, 9 Graphs

مصطلحات موضوعية: SEMICONDUCTOR doping, ZINC, MICROSTRUCTURE, ELECTRODIFFUSION, SOLDER & soldering, ELECTRON probe microanalysis, TRANSMISSION electron microscopy, ELECTRON backscattering

المؤلفون: Ryan, E. Todd, Gates, Stephen M., Grill, Alfred, Molis, Steven, Flaitz, Philip, Arnold, John, Sankarapandian, Muthumanickam, Cohen, Stephan A., Ostrovski, Yuri, Dimitrakopoulos, Christos

المصدر: Journal of Applied Physics; Nov2008, Vol. 104 Issue 9, p094109, 7p, 1 Diagram, 3 Charts, 11 Graphs

مصطلحات موضوعية: DIELECTRICS, PLASMA gases, POROUS materials, INTEGRATED circuits, DIELECTRIC films

المؤلفون: Bruley, John, Burr, Geoffrey, Davis, Robert E., Flaitz, Philip, Hinsberg, William D., Houle, Frances A., Miller, Dolores C., Pike, Michael, Rankin, Jed, Wagner, Alfred, Watts, Andrew

المصدر: Proceedings of SPIE; Nov2009, Issue 1, p727215-727215-6, 6p