المؤلفون: Arnaud Simonet, Paul Fourcade, Florent Loete, Arnaud Delafontaine, Eric Yiou

المصدر: Sensors, Vol 24, Iss 11, p 3322 (2024)

مصطلحات موضوعية: markerless motion capture, force plate, gait initiation, margin of stability, Bland–Altman, Bayes factor 01, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/24/11/3322; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/41484b3916ea48a7a0ef1296b2596391

المؤلفون: Florent Loete, Arnaud Simonet, Paul Fourcade, Eric Yiou, Arnaud Delafontaine

المصدر: Sensors, Vol 24, Iss 6, p 1885 (2024)

مصطلحات موضوعية: gait initiation, Parkinson’s disease, principal component analysis, bootstrapping, rehabilitation, unsupervised learning, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/24/6/1885; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/b248e3f212ac4413aa16818760d01ff9

المؤلفون: Ghania Belkacem, Florent Loete, Tanguy Phulpin

المصدر: Sensors, Vol 24, Iss 5, p 1629 (2024)

مصطلحات موضوعية: eddy-currents, non-destructive measurements, epitaxy, GaN, coil probe, electrical conductivity, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/24/5/1629; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/68965d4400cb4062a18aaf1bc9e2f861

المؤلفون: Florent Loete

المصدر: Sensors, Vol 23, Iss 24, p 9867 (2023)

مصطلحات موضوعية: soft defect modeling, reflectometry, electrical harnesses diagnosis, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/23/24/9867; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/dcca7d8eeec3418095b5bdbf53040e92

المؤلفون: Luna Haydar, Florent Loete, Frédéric Houzé, Tanguy Choupin, Fabien Guiche, Philippe Testé

المصدر: Applied Sciences, Vol 13, Iss 18, p 10253 (2023)

مصطلحات موضوعية: health monitoring, failure, deshunting, track circuit, wheel–rail electrical contact, oxidation, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2076-3417/13/18/10253; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/791d398966754915a27d45f3a6db26e5

المؤلفون: Florent Loete

المصدر: IEEE Transactions on Instrumentation and Measurement. 68:4368-4375

مصطلحات موضوعية: Computer science, Acoustics, 020208 electrical & electronic engineering, 02 engineering and technology, Gating, Fixture, Line (electrical engineering), Signature (logic), Time–frequency analysis, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Coaxial, Reflectometry, Instrumentation, Electrical impedance

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2568b293516e1d839800265afa84b333
https://doi.org/10.1109/tim.2018.2886975

المؤلفون: Florent Loete, Yann Le Bihan, Denis Mencaraglia, Hajer Makhloufi

المساهمون: Laboratoire Génie électrique et électronique de Paris ( GeePs ), Université Paris-Sud - Paris 11 ( UP11 ) -CentraleSupélec-Sorbonne Université-Centre National de la Recherche Scientifique ( CNRS ), Équipe Photonique ( LAAS-PHOTO ), Laboratoire d'analyse et d'architecture des systèmes [Toulouse] ( LAAS ), Centre National de la Recherche Scientifique ( CNRS ) -Université Toulouse III - Paul Sabatier ( UPS ), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Institut National des Sciences Appliquées - Toulouse ( INSA Toulouse ), Institut National des Sciences Appliquées ( INSA ) -Institut National des Sciences Appliquées ( INSA ) -Institut National Polytechnique [Toulouse] ( INP ) -Centre National de la Recherche Scientifique ( CNRS ) -Université Toulouse III - Paul Sabatier ( UPS ), Institut National des Sciences Appliquées ( INSA ) -Institut National des Sciences Appliquées ( INSA ) -Institut National Polytechnique [Toulouse] ( INP ), Laboratoire de génie électrique de Paris ( LGEP ), Université Paris-Sud - Paris 11 ( UP11 ) -Université Pierre et Marie Curie - Paris 6 ( UPMC ) -SUPELEC-Centre National de la Recherche Scientifique ( CNRS ), Laboratoire Génie électrique et électronique de Paris (GeePs), Université Paris-Sud - Paris 11 (UP11)-CentraleSupélec-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS)

المصدر: IEEE SENSORS 2018
IEEE SENSORS 2018, Oct 2018, New delhi, India
IEEE SENSORS 2018, Oct 2018, New delhi, India. ⟨10.1109/icsens.2018.8589554⟩
IEEE SENSORS 2018 Conference
IEEE SENSORS 2018 Conference, Oct 2018, New Delhi, India. 2018, Proceedings of IEEE SENSORS 2018 Conference

مصطلحات موضوعية: [ PHYS ] Physics [physics], Materials science, business.industry, Electromagnetic spectrum, 010401 analytical chemistry, Low frequency, Conductivity, 01 natural sciences, 0104 chemical sciences, Indium tin oxide, [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism, Semiconductor, Electromagnetic coil, [ SPI ] Engineering Sciences [physics], [ SPI.ELEC ] Engineering Sciences [physics]/Electromagnetism, Optoelectronics, Reflectometry, business, Electrical impedance, ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::32f20c2f955c95bc7f0a0bf22098c738
https://hal-centralesupelec.archives-ouvertes.fr/hal-01943876/file/sensors2018.pdf

المؤلفون: Odile Picon, Anthony Manet, Florent Loete, Jérôme Genoulaz, Abelin Kameni, Lionel Pichon

المساهمون: Laboratoire Génie électrique et électronique de Paris (GeePs), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), SAFRAN Electrical & Power Div EWISe, Electronique, Systèmes de communication et Microsystèmes (ESYCOM), Conservatoire National des Arts et Métiers [CNAM] (CNAM), HESAM Université - Communauté d'universités et d'établissements Hautes écoles Sorbonne Arts et métiers université (HESAM)-HESAM Université - Communauté d'universités et d'établissements Hautes écoles Sorbonne Arts et métiers université (HESAM)-Université Paris-Est Marne-la-Vallée (UPEM)-ESIEE Paris, Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Est Marne-la-Vallée (UPEM)-ESIEE Paris

المصدر: IEEE Transactions on Electromagnetic Compatibility
IEEE Transactions on Electromagnetic Compatibility, 2017, 59 (2), pp.533-536. ⟨10.1109/TEMC.2016.2612719⟩
IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2017, 59 (2), pp.533-536. ⟨10.1109/TEMC.2016.2612719⟩

مصطلحات موضوعية: Engineering, Coaxial cable, 02 engineering and technology, Fault (power engineering), 01 natural sciences, law.invention, [SPI]Engineering Sciences [physics], law, Discontinuous Galerkin method, 0103 physical sciences, Shielded cable, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Electrical and Electronic Engineering, ComputingMilieux_MISCELLANEOUS, 010302 applied physics, Computer simulation, business.industry, 020208 electrical & electronic engineering, Structural engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism, Electromagnetic shielding, Equivalent circuit, Coaxial, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3bbb580ebc2b54c1397ffbc21f26ecba
https://hal.science/hal-01451176

المؤلفون: Y. Le Bihan, Denis Mencaraglia, Florent Loete

المساهمون: Laboratoire Génie électrique et électronique de Paris (GeePs), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS)

المصدر: International Symposium on Semiconductor Manufacturing (ISSM 2016)
International Symposium on Semiconductor Manufacturing (ISSM 2016), Dec 2016, Tokyo, Japan. 4p., ⟨10.1109/issm.2016.7934522⟩

مصطلحات موضوعية: Materials science, semiconductor materials, electromagnetic model, conductivity measurement range, Conductivity, broadband multicarrier test signal, 01 natural sciences, law.invention, fast transient conditions, crystalline silicon wafers, transport properties, law, Hardware_INTEGRATEDCIRCUITS, Eddy current, Wafer, Reflectometry, contactless conductivity measurement system, Electrical impedance, coil-wafer interaction, reflectometry, business.industry, System of measurement, eddy current probe, 010401 analytical chemistry, generic apparatus, Electrical engineering, transmission line, 0104 chemical sciences, contactless method, [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism, Semiconductor, Electromagnetic coil, Optoelectronics, semiconductor wafer, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::93a475b4fab438d012c2f417ba195d42
https://hal.archives-ouvertes.fr/hal-01637727

المؤلفون: Yann Le Bihan, Josue Ferreira, Denis Mencaraglia, Florent Loete

المساهمون: Laboratoire Génie électrique et électronique de Paris (GeePs), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS)

المصدر: 2016 IEEE Conference on Electromagnetic Field Computation (CEFC)
2016 IEEE Conference on Electromagnetic Field Computation (CEFC), Nov 2016, Miami, United States. ⟨10.1109/cefc.2016.7816375⟩

مصطلحات موضوعية: Materials science, Semiconductor device modeling, semiconductor wafers, Conductivity, 01 natural sciences, law.invention, [SPI]Engineering Sciences [physics], law, Electrical resistivity and conductivity, Eddy current, Electronic engineering, Wafer, model-based eddy current determination, conductivity estimation, Electrical impedance, eddy current technique, electrical conductivity, business.industry, 010401 analytical chemistry, Inversion (meteorology), direct inversion, 0104 chemical sciences, Computational physics, Semiconductor, business, iterative inversion

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::763f6d3b2053895cb901779c4fd7b8ff
https://hal.science/hal-01460536