المؤلفون: Huang, Y., Chiang, M., Wang, S., Fossum, J.G.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(12):6586-6591 Dec, 2021

المؤلفون: Mathew, L., Sadd, M., Kalpat, S., Zavala, M., Stephens, T., Mora, R., Rai, R., Parker, C., Vasek, J., Sing, D., Shimer, R., Prabhu, L., Workman, G.O., Ablen, G., Shi, Z., Saenz, J., Min, B., Burnett, D., Nguyen, B.-Y., Mogab, J., Chowdhury, M.M., Zhang, W., Fossum, J.G.

المصدر: 2006 IEEE International Conference on IC Design and Technology Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on. :1-4 2006

Relation: 2006 IEEE International Conference on IC Design and Technology

المؤلفون: Fossum, J.G., Trivedi, V.P.

المصدر: 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. Integrated circuit design and technology Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on. :179-182 2005

Relation: 2005 International Conference on Integrated Circuit Design and Technology

المؤلفون: Mathew, L., Sadd, M., Kalpat, S., Zavala, M., Stephens, T., Mora, R., Bagchi, S., Parker, C., Vasek, J., Sing, D., Shimer, R., Prabhu, L., Workman, G.O., Ablen, G., Shi, Z., Saenz, J., Min, B., Burnett, D., Nguyen, B.-Y., Mogab, J., Chowdhury, M.M., Zhang, W., Fossum, J.G.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :713-716 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Fossum, J.G., Wang, L.Q., Yang, J.W., Kim, S.H., Trivedi, V.P.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :613-616 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Trivedi, V.P., Fossum, J.G., Gamiz, F.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :763-766 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Keunwoo Kim, Fossum, J.G., Ching-Te Chuang

المصدر: International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. International Conference on. :223-226 2003

Relation: IEEE International Conference on Simulation of Semiconductor Processes and Devices

المؤلفون: Pelella, M.M., Fossum, J.G., Chiang, M.-H., Workman, G.O., Tretz, C.R.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :831-834 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Fossum, J.G.

المصدر: 28th European Solid-State Device Research Conference Solid-State Device Research Conference, 1998. Proceeding of the 28th European. :34-41 1998

Relation: 28th European Solid-State Device Research Conference

المؤلفون: Gautier, J., Pelella, M.M., Fossum, J.G.

المصدر: International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :407-410 1997

Relation: International Electron Devices Meeting. IEDM Technical Digest