المؤلفون: Christopher, Moore^Aff7, Katherine, Woods^Aff8, Philip, Sharrock^Aff7, Francis, Lilley^Aff9, Michael, Lalor^Aff9, David, Burton^Aff9

المساهمون: Lemke, Heinz U., editor^Aff1, Inamura, Kiyonari, editor^Aff2, Doi, Kunio, editor^Aff3, Vannier, Michael W., editor^Aff4, Farman, Allan G., editor^Aff5, Reiber, Johan H. C., editor^Aff6

المصدر: CARS 2002 Computer Assisted Radiology and Surgery : Proceedings of the 16th International Congress and Exhibition Paris, June 26–29,2002. :533-538

Degree: PhD
MD
PhD, DSc

المؤلفون: Taybia Mohammed, Frederic Bezombes, David R. Burton, Francis Lilley, Mark F. Murphy

المصدر: Materials Science and Engineering: C. 69:1256-1262

مصطلحات موضوعية: 0301 basic medicine, Materials science, Cell Survival, Cell, Cell Count, Bioengineering, Stimulation, Vibration, Cell Line, RS, Biomaterials, Extracellular matrix, Mice, 03 medical and health sciences, 0302 clinical medicine, Cell Movement, Image Processing, Computer-Assisted, medicine, Animals, Humans, Fibroblast, Cell migration, Acoustics, Anatomy, Fibroblasts, Actins, Cell biology, 030104 developmental biology, medicine.anatomical_structure, TA, Mechanics of Materials, Calibration, Stress, Mechanical, Lamellipodium, Wound healing, Filopodia, 030217 neurology & neurosurgery

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ed1c1501d7a6d1f1b57e5d9ba0e8e43a
https://doi.org/10.1016/j.msec.2016.07.037

المؤلفون: Francis Lilley, Miguel Arevalillo-Herráez, David R. Burton, Munther A. Gdeisat

المصدر: Optics and Lasers in Engineering

مصطلحات موضوعية: Computer science, Plane (geometry), TK, Mechanical Engineering, Phase (waves), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Signal, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, 010309 optics, Reduction (complexity), symbols.namesake, Distribution (mathematics), Fringe projection profilometry, Fourier analysis, Frequency domain, 0103 physical sciences, symbols, Electrical and Electronic Engineering, 0210 nano-technology, Algorithm, QC

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8f0912eacb61480c42ce38b295720a60
https://doi.org/10.1016/j.optlaseng.2015.11.009

المؤلفون: Mark F. Murphy, G. Johnston, Francis Lilley, G. Madden, David R. Burton, S. R. Crosby, Michael J. Lalor

المصدر: Microscopy Research and Technique. 76:36-41

مصطلحات موضوعية: Male, Histology, Nanotechnology, Microscopy, Atomic Force, Cell Line, Prostate cancer, medicine, Humans, Instrumentation, Physics, Atomic force microscopy, Linear elasticity, Prostate, Prostatic Neoplasms, Stiffness, Models, Theoretical, medicine.disease, Actins, Biomechanical Phenomena, Medical Laboratory Technology, Nonlinear system, Nonlinear Dynamics, Stress, Mechanical, Anatomy, medicine.symptom, Biological system, Prostate cells

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7d8f4f9807794a13e4e89386302c299e
https://doi.org/10.1002/jemt.22132

المؤلفون: Miguel Arevalillo-Herráez, Francis Lilley, Munther A. Gdeisat, Marwan M. M. Ammous, David R. Burton

المصدر: Applied Optics

مصطلحات موضوعية: Synthetic aperture radar, Residue (complex analysis), Computer science, business.industry, Materials Science (miscellaneous), Classification of discontinuities, Phase unwrapping, Industrial and Manufacturing Engineering, Discrete Fourier transform, Structured-light 3D scanner, Optics, TA, Phase noise, Business and International Management, business, Algorithm

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c1206e5f78ed92285a16e4a263e09e66
https://pubmed.ncbi.nlm.nih.gov/26836663

المؤلفون: Francis Lilley, David R. Burton, Munther A. Gdeisat, Mohammed Qudeisat

المصدر: Optics Communications. 284:5105-5109

مصطلحات موضوعية: business.industry, Adaptive-additive algorithm, Noise (signal processing), Computer science, Short-time Fourier transform, Phase (waves), Atomic and Molecular Physics, and Optics, Fractional Fourier transform, Electronic, Optical and Magnetic Materials, symbols.namesake, Optics, Fourier transform, Phase correlation, symbols, Inverse trigonometric functions, Electrical and Electronic Engineering, Physical and Theoretical Chemistry, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::01ef50e5ef224f15d529b4a108450b4d
https://doi.org/10.1016/j.optcom.2011.07.024

المؤلفون: Francis Lilley, Michael J. Lalor, Abdulbasit Z. Abid, Mohammed Qudeisat, Christopher J Moore, David R. Burton, Munther A. Gdeisat

المصدر: Optics and Lasers in Engineering. 47:1348-1361

مصطلحات موضوعية: business.industry, Computer science, Mechanical Engineering, Second-generation wavelet transform, Phase (waves), Wavelet transform, Context (language use), Pattern recognition, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, symbols.namesake, Fourier transform, Wavelet, symbols, Computer vision, Artificial intelligence, Electrical and Electronic Engineering, business, Phase retrieval, Continuous wavelet transform

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7806aca44db069f5815972cb3a00879c
https://doi.org/10.1016/j.optlaseng.2009.07.009

المؤلفون: Francis Lilley, Hussein S. Abdul-Rahman, Abdulbasit Z. Abid, Michael J. Lalor, David R. Burton, Munther A. Gdeisat

المصدر: Optics and Lasers in Engineering. 46:446-455

مصطلحات موضوعية: business.industry, Computer science, Mechanical Engineering, Moving body, Video sequence, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, symbols.namesake, Fourier transform, Robustness (computer science), Fringe pattern, symbols, Demodulation, Computer vision, Artificial intelligence, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d1f32f6624b18c4b5e3ac86ff9ae5743
https://doi.org/10.1016/j.optlaseng.2008.01.004

المؤلفون: Wenqi, Deng, Guang-Ming, Zhang, Mark F, Murphy, Francis, Lilley, David M, Harvey, David R, Burton

المصدر: Microscopy research and technique. 78(10)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=pmid________::25d336b1ac45f9205e6999a755782915
https://pubmed.ncbi.nlm.nih.gov/26303510

المؤلفون: Francis Lilley, A. Ahtaiba, Munther A. Gdeisat, David R. Burton

المصدر: ICAC

مصطلحات موضوعية: Error signal, Weight function, Scanner, Optics, Cantilever, Materials science, business.industry, Deflection (engineering), Atomic force microscopy, business, Non-contact atomic force microscopy, Set point

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ae11dbcb8c1bb85e03d18c3223009238
https://doi.org/10.1109/iconac.2014.6935500