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1دورية أكاديمية
المؤلفون: Chakraborty, S., Frank, D.J., Tien, K., Rosno, P., Yeck, M., Glick, J.A., Robertazzi, R., Richetta, R., Bulzacchelli, J.F., Underwood, D., Ramirez, D., Yilma, D., Davies, A., Joshi, R.V., Chambers, S.D., Lekuch, S., Inoue, K., Wisnieff, D., Baks, C.W., Bethune, D.S., Timmerwilke, J., Fox, T., Song, P., Johnson, B.R., Gaucher, B.P., Friedman, D.J.
المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 57(11):3258-3273 Nov, 2022
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2دورية أكاديمية
المؤلفون: Sumangala, M.P., Shylendra, A., Frank, D.J., Ando, T., Trivedi, A.R.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(9):1396-1399 Sep, 2020
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3مؤتمر
المؤلفون: Aguilar, Frank D.J., Hirata, Nina S.T.
المصدر: 2012 10th IAPR International Workshop on Document Analysis Systems Document Analysis Systems (DAS), 2012 10th IAPR International Workshop on. :155-159 Mar, 2012
Relation: 2012 10th IAPR International Workshop on Document Analysis Systems (DAS)
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4دورية أكاديمية
المؤلفون: Muralidhar, R., Lauer, I., Cai, J., Frank, D.J., Oldiges, P.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(1):524-526 Jan, 2016
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5مؤتمر
المؤلفون: Topol, A.W., La Tulipe, D.C., Shi, L., Alam, S.M., Frank, D.J., Steen, S.E., Vichiconti, J., Posillico, D., Cobb, M., Medd, S., Patel, J., Goma, S., DiMilia, D., Robson, M.T., Duch, E., Farinelli, M., Wang, C., Conti, R.A., Canaperi, D.M., Deligianni, L., Kumar, A., Kwietniak, K.T., D'Emic, C., Ott, J., Young, A.M., Guarini, K.W., Ieong, M.
المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :352-355 2005
Relation: International Electron Devices Meeting 2005
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6مؤتمر
المؤلفون: Fried, D.M., Hergenrother, J.M., Topol, A.W., Chang, L., Sekaric, L., Sleight, J.W., McNab, S.J., Newbury, J., Steen, S.E., Gibson, G., Zhang, Y., Fuller, N.C.M., Bucchignano, J., Lavoie, C., Cabral Jr, C., Canaperi, D., Dokumaci, O., Frank, D.J., Duch, E.A., Babich, I., Wong, K., Ott, J.A., Adams, C.D., Dalton, T.J., Nunes, R., Medeiros, D.R., Viswanathan, R., Ketchen, M., Ieong, M., Haensch, W., Guarini, K.W.
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :261-264 2004
Relation: 2004 International Electron Devices Meeting
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7مؤتمر
المؤلفون: Hulse, J., Frank, D.J., Simard-Normandin, M.
المصدر: The 2nd Annual IEEE Northeast Workshop on Circuits and Systems, 2004. NEWCAS 2004. Workshop on circuits and systems Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on. :77-80 2004
Relation: The 2nd Annual IEEE Northeast Workshop on Circuits and Systems
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8مؤتمر
المؤلفون: Linder, B.P., Stathis, J.H., Frank, D.J., Lombardo, S., Vayshenker, A.
المصدر: 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :402-405 2003
Relation: International Reliability Physics Symposium
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9مؤتمر
المؤلفون: Frank, D.J.
المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :643-646 2002
Relation: IEEE International Electron Devices Meeting
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10مؤتمر
المؤلفون: Linder, B.P., Stathis, J.H., Frank, D.J.
المصدر: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) Reliability physics symposium Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International. :168-171 2001
Relation: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual