المؤلفون: Chakraborty, S., Frank, D.J., Tien, K., Rosno, P., Yeck, M., Glick, J.A., Robertazzi, R., Richetta, R., Bulzacchelli, J.F., Underwood, D., Ramirez, D., Yilma, D., Davies, A., Joshi, R.V., Chambers, S.D., Lekuch, S., Inoue, K., Wisnieff, D., Baks, C.W., Bethune, D.S., Timmerwilke, J., Fox, T., Song, P., Johnson, B.R., Gaucher, B.P., Friedman, D.J.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 57(11):3258-3273 Nov, 2022

المؤلفون: Sumangala, M.P., Shylendra, A., Frank, D.J., Ando, T., Trivedi, A.R.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(9):1396-1399 Sep, 2020

المؤلفون: Aguilar, Frank D.J., Hirata, Nina S.T.

المصدر: 2012 10th IAPR International Workshop on Document Analysis Systems Document Analysis Systems (DAS), 2012 10th IAPR International Workshop on. :155-159 Mar, 2012

Relation: 2012 10th IAPR International Workshop on Document Analysis Systems (DAS)

المؤلفون: Muralidhar, R., Lauer, I., Cai, J., Frank, D.J., Oldiges, P.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(1):524-526 Jan, 2016

المؤلفون: Topol, A.W., La Tulipe, D.C., Shi, L., Alam, S.M., Frank, D.J., Steen, S.E., Vichiconti, J., Posillico, D., Cobb, M., Medd, S., Patel, J., Goma, S., DiMilia, D., Robson, M.T., Duch, E., Farinelli, M., Wang, C., Conti, R.A., Canaperi, D.M., Deligianni, L., Kumar, A., Kwietniak, K.T., D'Emic, C., Ott, J., Young, A.M., Guarini, K.W., Ieong, M.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :352-355 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Fried, D.M., Hergenrother, J.M., Topol, A.W., Chang, L., Sekaric, L., Sleight, J.W., McNab, S.J., Newbury, J., Steen, S.E., Gibson, G., Zhang, Y., Fuller, N.C.M., Bucchignano, J., Lavoie, C., Cabral Jr, C., Canaperi, D., Dokumaci, O., Frank, D.J., Duch, E.A., Babich, I., Wong, K., Ott, J.A., Adams, C.D., Dalton, T.J., Nunes, R., Medeiros, D.R., Viswanathan, R., Ketchen, M., Ieong, M., Haensch, W., Guarini, K.W.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :261-264 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Hulse, J., Frank, D.J., Simard-Normandin, M.

المصدر: The 2nd Annual IEEE Northeast Workshop on Circuits and Systems, 2004. NEWCAS 2004. Workshop on circuits and systems Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on. :77-80 2004

Relation: The 2nd Annual IEEE Northeast Workshop on Circuits and Systems

المؤلفون: Linder, B.P., Stathis, J.H., Frank, D.J., Lombardo, S., Vayshenker, A.

المصدر: 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :402-405 2003

Relation: International Reliability Physics Symposium

المؤلفون: Frank, D.J.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :643-646 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Linder, B.P., Stathis, J.H., Frank, D.J.

المصدر: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) Reliability physics symposium Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International. :168-171 2001

Relation: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual