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المؤلفون: Jonathan Fales, Binod Kumar G. Nair, Jeffrey E. Nelson, Frank E. Gennari, Philippe Hurat, Jac Condella, Akif Sultan, Aaron Sinnott, Xiaoyuan Qi, Sriram Madhavan, Uwe Paul Schroeder, Rwik Sengupta, Ya-Chieh Lai
المصدر: IEEE Transactions on Semiconductor Manufacturing. 34:372-378
مصطلحات موضوعية: Computer science, Process (engineering), Yield (finance), Semiconductor device modeling, Critical area, Integrated circuit, Condensed Matter Physics, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials, Reliability engineering, law.invention, law, Range (statistics), Electrical and Electronic Engineering, Failure mode and effects analysis, Scaling
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المؤلفون: Philippe Hurat, Ya-Chieh Lai, Atul Chittora, Jeffrey E. Nelson, Xiaoyuan Qi, Rwik Sengupta, Binod Kumar G. Nair, Aaron Sinnott, Frank E. Gennari, Jac Condella, Jonathan Fales, Shobhit Malik
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Adaptive sampling, Computer science, law, Yield (finance), Transistor, Process (computing), Normalization (sociology), Critical area, Projection (set theory), Failure mode and effects analysis, Reliability engineering, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e31d2dd7cd19fd6f640897511ffa93f0
https://doi.org/10.1117/12.2583515 -
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المؤلفون: Frank E. Gennari, Piyush Pathak, Ya-Chieh Lai, Sangah Lee, Jae-Hyun Kang, Jac Condella, Joong-Won Jeon, Jin Kim, Philippe Hurat, Jaehwan Kim, Shin Byung-Chul
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIV.
مصطلحات موضوعية: Set (abstract data type), Optical proximity correction, Computer science, Extreme ultraviolet lithography, Reliability (computer networking), Design pattern, Process (computing), Overhead (computing), Design for manufacturability, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c74af2a2e8bc634694fb1288e684fbd6
https://doi.org/10.1117/12.2551970 -
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المؤلفون: Frank E. Gennari, Haoyu Yang, Ya-Chieh Lai, Piyush Pathak, Bei Yu
المصدر: DAC
مصطلحات موضوعية: Computer science, Linear system, Topology (electrical circuits), 02 engineering and technology, 010501 environmental sciences, Network topology, 01 natural sciences, Autoencoder, 020202 computer hardware & architecture, Design for manufacturability, Computer engineering, Digital pattern generator, 0202 electrical engineering, electronic engineering, information engineering, Node (circuits), 0105 earth and related environmental sciences
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e6eb5e12f43053bd361f0bcb1160a0f3
https://doi.org/10.1145/3316781.3317795 -
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المؤلفون: Piyush Pathak, Jin Kim, Junsu Jeon, Jaehwan Kim, Byung-Moo Kim, Ya-Chieh Lai, Jae-Hyun Kang, Sangah Lee, Frank E. Gennari, Philippe Hurat, Shin Byung-Chul, Seung Weon Paek
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIII.
مصطلحات موضوعية: Interconnection, Robust design, Design for yield, Computer science, Redundancy (engineering), Process window, Cmos process, Scaling, Reliability engineering, Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8dabd7647de85b676db5e0d383ada811
https://doi.org/10.1117/12.2514896 -
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المؤلفون: Ya-Chieh Lai, Frank E. Gennari, Bei Yu, Piyush Pathak, Haoyu Yang
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIII.
مصطلحات موضوعية: Topological complexity, Pixel, Computer science, business.industry, Frequency domain, Squish, Pattern recognition, Pattern matching, Artificial intelligence, business, Convolutional neural network, Data compression, Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ea39c71f0c0434a6cb117d15acea93ea
https://doi.org/10.1117/12.2515172 -
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المؤلفون: Piyush Pathak, Frank E. Gennari, Moutaz Fakhry, Ya-Chieh Lai, Abdullah Yassine, Jeffrey E. Nelson, Jason P. Cain
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIII.
مصطلحات موضوعية: Computer science, media_common.quotation_subject, Volume (computing), Root cause, computer.software_genre, Design for manufacturability, Presentation, Filter (video), Node (circuits), Data mining, Physical design, Root cause analysis, computer, media_common
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f90b1f5fe8ec96d80518acc8324f515c
https://doi.org/10.1117/12.2516571 -
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المؤلفون: Piyush Pathak, Bei Yu, Frank E. Gennari, Ya-Chieh Lai, Haoyu Yang
المصدر: ASP-DAC
مصطلحات موضوعية: Lossless compression, Computer science, Detector, Feature extraction, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Integrated circuit design, 021001 nanoscience & nanotechnology, 01 natural sciences, Convolutional neural network, 010309 optics, Computer engineering, 0103 physical sciences, Hotspot (geology), Hardware_INTEGRATEDCIRCUITS, Squish, 0210 nano-technology, Multi layer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d7512f3def131c7304fb65256dd10ac5
https://doi.org/10.1145/3287624.3288747 -
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المؤلفون: Ya-Chieh Lai, Haoyu Yang, Piyush Pathak, Wen Chen, Bei Yu, Frank E. Gennari
مصطلحات موضوعية: FOS: Computer and information sciences, Computer Science - Machine Learning, Generality, Source code, Computer Science - Artificial Intelligence, Computer science, business.industry, media_common.quotation_subject, Detector, Feature extraction, Machine Learning (stat.ML), Learning models, Hardware_PERFORMANCEANDRELIABILITY, Machine learning, computer.software_genre, Design for manufacturability, Machine Learning (cs.LG), Artificial Intelligence (cs.AI), Statistics - Machine Learning, Hardware_INTEGRATEDCIRCUITS, Artificial intelligence, business, Lithography, computer, media_common
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::384d35d8d09d09a20470684766152299
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المؤلفون: Jason Sweis, Piyush Pathak, Moutaz Fakhry, Jason P. Cain, Frank E. Gennari, Ya-Chieh Lai
المصدر: Design-Process-Technology Co-optimization for Manufacturability XII.
مصطلحات موضوعية: Framingham Risk Score, Process (engineering), Computer science, business.industry, Rank (computer programming), Pattern analysis, Integrated circuit, Machine learning, computer.software_genre, Pattern selection, law.invention, law, Pattern matching, Artificial intelligence, Physical design, business, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::57cf9c5710c64943318d5850a99f8c56
https://doi.org/10.1117/12.2299492