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1
المؤلفون: Marco Agustoni, Frederic Overney
المصدر: IEEE Transactions on Instrumentation and Measurement. 70:1-8
مصطلحات موضوعية: Physics, Bridging (networking), Acoustics, 020208 electrical & electronic engineering, 02 engineering and technology, Frequency dependence, Impedance parameters, law.invention, Metrology, Capacitor, Cable gland, law, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Resistor, Instrumentation, Electrical impedance
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a896f7e329da723f59858857beb9557f
https://doi.org/10.1109/tim.2020.3036062
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2
المؤلفون: Alain Rufenacht, Samuel P. Benz, Frederic Overney, Blaise Jeanneret, Paul D. Dresselhaus, Nathan E. Flowers-Jacobs, Anna E. Fox
المصدر: 2020 Conference on Precision Electromagnetic Measurements (CPEM).
مصطلحات موضوعية: Physics, Chain (algebraic topology), Mathematical analysis, Astrophysics::Instrumentation and Methods for Astrophysics, Calibration, Impedance bridging, Capacitance, Bridge (interpersonal), Electrical impedance, Quadrature (mathematics), Metrology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::006b1027aebb2a31d0f783e619c648a0
https://doi.org/10.1109/cpem49742.2020.9191748 -
3
المؤلفون: S. Bauer, Frederic Overney, Ralf Behr, Oliver Kieler, Blaise Jeanneret, Yaowaret Pimsut
المصدر: 2020 Conference on Precision Electromagnetic Measurements (CPEM).
مصطلحات موضوعية: Physics, Josephson effect, business.industry, Input impedance, 01 natural sciences, Compensation (engineering), Pulse (physics), 010309 optics, Load management, Optics, 0103 physical sciences, Waveform, Device under test, Voltage source, 010306 general physics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::32eebf5a53a5e378834cea7f73f8d3e3
https://doi.org/10.1109/cpem49742.2020.9191796 -
4
المؤلفون: Marco Agustoni, Frederic Overney
المصدر: 2020 Conference on Precision Electromagnetic Measurements (CPEM).
مصطلحات موضوعية: Materials science, Bridging (networking), Acoustics, 020208 electrical & electronic engineering, 02 engineering and technology, 01 natural sciences, law.invention, Metrology, 010309 optics, Capacitor, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Resistor, Electrical impedance
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2d4ac546b9bbb0432cb524570c02acf9
https://doi.org/10.1109/cpem49742.2020.9191807 -
5
المؤلفون: Antti Manninen, Sivinee Sawatdiaree, S. Bauer, J. Nissila, Frederic Overney, Adrien Michon, Yaowaret Pimsut, Yefei Yin, Dong-Hun Chae, Blaise Jeanneret, Klaus Pierz, Martina Marzano, Massimo Ortolano, Mattias Kruskopf, Karin Cedergren, Félicien Schopfer, Tobias Bergsten, O. Thevenot, Luca Callegaro, Vincenzo D'Elia, Jan Kucera, Ngoc Thanh Mai Tran
المصدر: Callegaro, L, D'Elia, V, Marzano, M, Tran, N T M, Ortolano, M, Kucera, J, Pierz, K, Bauer, S, Kruskopf, M, Yin, Y, Pimsut, Y, Schopfer, F, Thevenot, O, Jeanneret, B, Overney, F, Bergsten, T, Cedergren, K, Manninen, A, Nissilä, J, Michon, A, Sawatdiaree, S & Chae, D H 2020, The EMPIR Project GIQS : Graphene Impedance Quantum Standard . in 2020 Conference on Precision Electromagnetic Measurements, CPEM 2020 . IEEE Institute of Electrical and Electronic Engineers, 2020 Conference on Precision Electromagnetic Measurements, CPEM 2020, Virtual, Denver, United States, 24/08/20 . https://doi.org/10.1109/CPEM49742.2020.9191743
مصطلحات موضوعية: Graphene, Computer science, impedance measurement, Realisation, 020208 electrical & electronic engineering, 02 engineering and technology, Quantum Hall effect, Metrology, calibration, 01 natural sciences, Engineering physics, bridge circuits, law.invention, 010309 optics, law, Metrology, impedance measurement , bridge circuits, measurement uncertainty, calibration, 0103 physical sciences, measurement uncertainty, 0202 electrical engineering, electronic engineering, information engineering, Calibration, Measurement uncertainty, Electrical impedance, Quantum
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::22248dc56c425eb5e74035479ccee606
http://hdl.handle.net/11583/2845733 -
6
المؤلفون: Frederic Overney, Blaise Jeanneret
المصدر: Metrologia. 55:S119-S134
مصطلحات موضوعية: Physics, Wheatstone bridge, business.industry, 020208 electrical & electronic engineering, General Engineering, 02 engineering and technology, 01 natural sciences, law.invention, 010309 optics, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, business, Electrical impedance
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7
المؤلفون: Frederic Overney, Vincenzo D'Elia, Luca Callegaro, Luis Palafox, Martina Marzano, Massimo Ortolano, Jan Kucera, Gulay Gulmez
المصدر: Metrologia. 55:499-512
مصطلحات موضوعية: 010309 optics, Materials science, Optics, business.industry, 020208 electrical & electronic engineering, 0103 physical sciences, Phase angle, 0202 electrical engineering, electronic engineering, information engineering, General Engineering, 02 engineering and technology, business, 01 natural sciences, Electrical impedance
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8
المؤلفون: Felix Lüönd, A. Müller, Franz J. Ahlers, Mattias Kruskopf, Klaus Pierz, Frederic Overney, C.-C. Kalmbach, Jürgen Schurr, Blaise Jeanneret
المصدر: IEEE Transactions on Instrumentation and Measurement. 66:1459-1466
مصطلحات موضوعية: Materials science, Condensed matter physics, Graphene, Negative frequency, Capacitive sensing, Thermal Hall effect, Dissipation, Quantum Hall effect, 01 natural sciences, law.invention, 010309 optics, law, 0103 physical sciences, Electrical and Electronic Engineering, 010306 general physics, Instrumentation, Electrical impedance, Graphene nanoribbons
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d6081bd371081ecd8513b72449073d4
https://doi.org/10.1109/tim.2017.2652501
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9Calibration of an $LCR$ -Meter at Arbitrary Phase Angles Using a Fully Automated Impedance Simulator
المؤلفون: Frederic Overney, Blaise Jeanneret
المصدر: IEEE Transactions on Instrumentation and Measurement. 66:1516-1523
مصطلحات موضوعية: Engineering, business.industry, 020208 electrical & electronic engineering, Impedance matching, Ranging, 02 engineering and technology, 01 natural sciences, Metrology, 010309 optics, 0103 physical sciences, LCR meter, 0202 electrical engineering, electronic engineering, information engineering, Calibration, Metre, Electrical and Electronic Engineering, business, Instrumentation, Complex plane, Electrical impedance, Simulation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e580c46a2f44ab709715bd4baed37835
https://doi.org/10.1109/tim.2017.2652500
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10
المؤلفون: Andreas Elmholdt Christensen, Dongsheng Zhao, T. Lippert, Gert Rietveld, Jean-Pierre Braun, Frederic Overney
المصدر: Metrologia. 53:1384-1394
مصطلحات موضوعية: Computer science, 020208 electrical & electronic engineering, Bandwidth (signal processing), General Engineering, 02 engineering and technology, Input impedance, law.invention, Reliability engineering, Solid-state lighting, law, Harmonics, 0202 electrical engineering, electronic engineering, information engineering, Device under test, Measurement uncertainty, Output impedance, Uncertainty analysis
