المؤلفون: Frederique Trenteseaux, Francesco La Rosa, Vincenzo Della Marca, Franck Melul, Arnaud Regnier, Marjorie Hesse, Madjid Akbal, Stephan Niel, Pierre Laine, Marc Bocquet, M. Mantelli

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Rousset] (ST-ROUSSET), STMicroelectronics [Crolles] (ST-CROLLES)

المصدر: Microelectronics Reliability
Microelectronics Reliability, 2021, 126, pp.114266. ⟨10.1016/j.microrel.2021.114266⟩

مصطلحات موضوعية: Scheme (programming language), Coupling, Hardware_MEMORYSTRUCTURES, Floating gate memory, Computer science, Window (computing), Endurance degradation, Condensed Matter Physics, Reliability, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), Split-gate memory, Trench, Key (cryptography), Electronic engineering, NVM, Electrical and Electronic Engineering, Architecture, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Safety, Risk, Reliability and Quality, computer, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8b3b5d2f5593cfd412f8954a43bb3d15
https://hal.science/hal-03596892/document

المؤلفون: Franck Melul, M. Mantelli, Thibault Kempf, Vincenzo Della Marca, Marc Bocquet, Frederique Trenteseaux, Madjid Akbal, Stephan Niel, Arnaud Regnier, Francesco La Rosa

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Rousset] (ST-ROUSSET), STMicroelectronics [Crolles] (ST-CROLLES)

المصدر: 2021 IEEE International Memory Workshop (IMW)
2021 IEEE International Memory Workshop (IMW), May 2021, Dresden, France. pp.1-4, ⟨10.1109/IMW51353.2021.9439613⟩

مصطلحات موضوعية: Scheme (programming language), Set (abstract data type), Focus (computing), Computer science, Logic gate, Trench, Scalability, Electronic engineering, Window (computing), Energy consumption, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, computer, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bd45918d7a746722ba4b7f243c6de905
https://doi.org/10.1109/imw51353.2021.9439613

المؤلفون: Q. Hubert, M. Mantelli, Y. Escarabajal, B. Duclaux, S. Audran, V. Arnal, Francois Maugain, Frederique Trenteseaux, E. Lepape, Abderrezak Marzaki, F. Baudin, Julien Delalleau, A. Champenois, D. Galpin, E. Beche, L. Baron, L. Parmigiani, Giada Ghezzi, Pascal Gouraud, F. La Rosa, Stephan Niel, Arnaud Regnier, B. Saidi, N. Cherault, T. Cabout

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM)

مصطلحات موضوعية: 010302 applied physics, Class (computer programming), business.industry, Computer science, 020208 electrical & electronic engineering, Process (computing), 02 engineering and technology, 01 natural sciences, Term (time), Microcontroller, Memory cell, Embedded system, 0103 physical sciences, Trench, Process integration, 0202 electrical engineering, electronic engineering, information engineering, Architecture, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::447efcabc0f00c8688ad6ef70ad093bd

المؤلفون: Frédérique Trenteseaux

نوع المادة: eBook.

الموضوعات: Sewing, Seams (Sewing)

تصنيفات: CRAFTS & HOBBIES / General