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المؤلفون: Frederique Trenteseaux, Francesco La Rosa, Vincenzo Della Marca, Franck Melul, Arnaud Regnier, Marjorie Hesse, Madjid Akbal, Stephan Niel, Pierre Laine, Marc Bocquet, M. Mantelli
المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Rousset] (ST-ROUSSET), STMicroelectronics [Crolles] (ST-CROLLES)
المصدر: Microelectronics Reliability
Microelectronics Reliability, 2021, 126, pp.114266. ⟨10.1016/j.microrel.2021.114266⟩مصطلحات موضوعية: Scheme (programming language), Coupling, Hardware_MEMORYSTRUCTURES, Floating gate memory, Computer science, Window (computing), Endurance degradation, Condensed Matter Physics, Reliability, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), Split-gate memory, Trench, Key (cryptography), Electronic engineering, NVM, Electrical and Electronic Engineering, Architecture, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Safety, Risk, Reliability and Quality, computer, computer.programming_language
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المؤلفون: Franck Melul, M. Mantelli, Thibault Kempf, Vincenzo Della Marca, Marc Bocquet, Frederique Trenteseaux, Madjid Akbal, Stephan Niel, Arnaud Regnier, Francesco La Rosa
المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Rousset] (ST-ROUSSET), STMicroelectronics [Crolles] (ST-CROLLES)
المصدر: 2021 IEEE International Memory Workshop (IMW)
2021 IEEE International Memory Workshop (IMW), May 2021, Dresden, France. pp.1-4, ⟨10.1109/IMW51353.2021.9439613⟩مصطلحات موضوعية: Scheme (programming language), Set (abstract data type), Focus (computing), Computer science, Logic gate, Trench, Scalability, Electronic engineering, Window (computing), Energy consumption, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, computer, computer.programming_language
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bd45918d7a746722ba4b7f243c6de905
https://doi.org/10.1109/imw51353.2021.9439613 -
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المؤلفون: Q. Hubert, M. Mantelli, Y. Escarabajal, B. Duclaux, S. Audran, V. Arnal, Francois Maugain, Frederique Trenteseaux, E. Lepape, Abderrezak Marzaki, F. Baudin, Julien Delalleau, A. Champenois, D. Galpin, E. Beche, L. Baron, L. Parmigiani, Giada Ghezzi, Pascal Gouraud, F. La Rosa, Stephan Niel, Arnaud Regnier, B. Saidi, N. Cherault, T. Cabout
المصدر: 2018 IEEE International Electron Devices Meeting (IEDM)
مصطلحات موضوعية: 010302 applied physics, Class (computer programming), business.industry, Computer science, 020208 electrical & electronic engineering, Process (computing), 02 engineering and technology, 01 natural sciences, Term (time), Microcontroller, Memory cell, Embedded system, 0103 physical sciences, Trench, Process integration, 0202 electrical engineering, electronic engineering, information engineering, Architecture, business
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4كتاب إلكتروني
المؤلفون: Frédérique Trenteseaux
نوع المادة: eBook.
الموضوعات: Sewing, Seams (Sewing)
تصنيفات: CRAFTS & HOBBIES / General