يعرض 1 - 10 نتائج من 4,354 نتيجة بحث عن '"Fried, M."', وقت الاستعلام: 0.94s تنقيح النتائج
  1. 1
    مؤتمر
    Electrochemical Sensors for Detection of Different Ionic Species (Nitrites/Nitrates and Heavy Metals) in Natural Water Sources

    المؤلفون: Gartner, M., Lete, C., Chelu, M., Stroescu, H., Zaharescu, M., Moldovan, C., Brasoveanu, C., Gheorghe, M., Gheorghe, S., Duta, A., Labadi, Z., Kalas, B., Saftics, A., Fried, M., Petrik, P., Toth, E., Jankovics, H., Vonderviszt, F.

    المصدر: 2018 International Semiconductor Conference (CAS) International Semiconductor Conference (CAS), 2018. :329-332 Oct, 2018

    Relation: 2018 International Semiconductor Conference (CAS)

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  2. 2
    مؤتمر
    Recent progress in ion beam fabrication of integrated optical elements

    المؤلفون: Banyasz, I., Nagy, G.U.L., Havranek, V., Vosecek, V., Agocs, E., Fried, M., Rakovics, V., Pelli, S.

    المصدر: 2017 19th International Conference on Transparent Optical Networks (ICTON) Transparent Optical Networks (ICTON), 2017 19th International Conference on. :1-4 Jul, 2017

    Relation: 2017 19th International Conference on Transparent Optical Networks (ICTON)

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  3. 3
    تقرير
    Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method

    المؤلفون: Fodor, B., Kozma, P., Burger, S., Fried, M., Petrik, P.

    المصدر: Thin Solid Films 617, 20 (2016)

    مصطلحات موضوعية: Physics - Computational Physics

    URL الوصول: http://arxiv.org/abs/1902.09903

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  4. 4
    مؤتمر
    The use of ion beam techniques for the fabrication of integrated optical elements

    المؤلفون: Banyasz, I., Berneschi, S., Fried, M., Havranek, V., Khanh, N. Q., Nagy, G.U.L., Nemeth, A., Nunzi-Conti, G., Pelli, S., Rajta, I., Righini, C., Szilagyi, E., Veres, M., Zolnai, Z.

    المصدر: 2016 18th International Conference on Transparent Optical Networks (ICTON) Transparent Optical Networks (ICTON), 2016 18th International Conference on. :1-4 Jul, 2016

    Relation: 2016 18th International Conference on Transparent Optical Networks (ICTON)

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  5. 5
    مؤتمر
    High speed spectroscopic ellipsometry technique for on-line monitoring in large area thin layer production

    المؤلفون: Major, C., Juhasz, G., Labadi, Z., Fried, M.

    المصدر: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd. :1-6 Jun, 2015

    Relation: 2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC)

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  6. 6
    دورية أكاديمية
    High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin-Film Photovoltaics

    المؤلفون: Shan, A., Fried, M., Juhasz, G., Major, C., Polgar, O., Nemeth, A., Petrik, P., Dahal, L. R., Chen, J., Huang, Z., Podraza, N. J., Collins, R. W.

    المصدر: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 4(1):355-361 Jan, 2014

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  7. 7
    مؤتمر
    Ellipsometric characterization of shallow damage profiles created by Xe-implantation into silicon

    المؤلفون: Petrik, P., Polgar, O., Lohner, T., Fried, M., Khanh, N.Q., Gyulai, J., Ramadan, E.

    المصدر: Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on Ion implantation technology proceedings Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on. :601-604 2002

    Relation: Proceedings of the 2002 14th International Conference on Ion Implantation Technology

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  8. 8
    دورية أكاديمية
    MeV Energy $\hbox{N}^{+}$-Implanted Planar Optical Waveguides in Er-Doped Tungsten-Tellurite Glass Operating at 1.55 $\mu\hbox{m}$

    المؤلفون: Banyasz, I., Berneschi, S., Bettinelli, M., Brenci, M., Fried, M., Khanh, N. Q., Lohner, T., Conti, G. N., Pelli, S., Petrik, P., Righini, G. C., Speghini, A., Watterich, A., Zolnai, Z.

    المصدر: IEEE Photonics Journal IEEE Photonics J. Photonics Journal, IEEE. 4(3):721-727 Jun, 2012

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  9. 9
    مؤتمر
    Advanced optical model for the ellipsometric study of ion implantation-caused damage depth profiles in single-crystalline silicon

    المؤلفون: Petrik, P., Polgar, O., Fried, M., Lohner, T., Khanh, N.Q., Gyulai, J.

    المصدر: 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) Ion implantation technology Ion Implantation Technology, 2000. Conference on. :151-154 2000

    Relation: 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000

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  10. 10
    مؤتمر
    Homogeneity check of ion implantation in silicon by wide-angle ellipsometry

    المؤلفون: Fried, M., Juhasz, G., Major, C., Petrik, P., Battistig, G.

    المصدر: 2009 17th International Conference on Advanced Thermal Processing of Semiconductors Advanced Thermal Processing of Semiconductors, 2009. RTP '09. 17th International Conference on. :1-4 Sep, 2009

    Relation: 2009 17th International Conference on Advanced Thermal Processing of Semiconductors (RTP)

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