المؤلفون: Cioppa, Anthony, Giancola, Silvio, Somers, Vladimir, Magera, Floriane, Zhou, Xin, Mkhallati, Hassan, Deliège, Adrien, Held, Jan, Hinojosa, Carlos, Mansourian, Amir M., Miralles, Pierre, Barnich, Olivier, De Vleeschouwer, Christophe, Alahi, Alexandre, Ghanem, Bernard, Van Droogenbroeck, Marc, Kamal, Abdullah, Maglo, Adrien, Clapés, Albert, Abdelaziz, Amr, Xarles, Artur, Orcesi, Astrid, Scott, Atom, Liu, Bin, Lim, Byoungkwon, Chen, Chen, Deuser, Fabian, Yan, Feng, Yu, Fufu, Shitrit, Gal, Wang, Guanshuo, Choi, Gyusik, Kim, Hankyul, Guo, Hao, Fahrudin, Hasby, Koguchi, Hidenari, Ardö, Håkan, Salah, Ibrahim, Yerushalmy, Ido, Muhammad, Iftikar, Uchida, Ikuma, Be'ery, Ishay, Rabarisoa, Jaonary, Lee, Jeongae, Fu, Jiajun, Yin, Jianqin, Xu, Jinghang, Nang, Jongho, Denize, Julien, Li, Junjie, Zhang, Junpei, Kim, Juntae, Synowiec, Kamil, Kobayashi, Kenji, Zhang, Kexin, Habel, Konrad, Nakajima, Kota, Jiao, Licheng, Ma, Lin, Wang, Lizhi, Wang, Luping, Li, Menglong, Zhou, Mengying, Nasr, Mohamed, Abdelwahed, Mohamed, Liashuha, Mykola, Falaleev, Nikolay, Oswald, Norbert, Jia, Qiong, Pham, Quoc-Cuong, Song, Ran, Hérault, Romain, Peng, Rui, Chen, Ruilong, Liu, Ruixuan, Baikulov, Ruslan, Fukushima, Ryuto, Escalera, Sergio, Lee, Seungcheon, Chen, Shimin, Ding, Shouhong, Someya, Taiga, Moeslund, Thomas B., Li, Tianjiao, Shen, Wei, Zhang, Wei, Li, Wei, Dai, Wei, Luo, Weixin, Zhao, Wending, Zhang, Wenjie, Yang, Xinquan, Ma, Yanbiao, Joo, Yeeun, Zeng, Yingsen, Gan, Yiyang, Zhu, Yongqiang, Zhong, Yujie, Ruan, Zheng, Li, Zhiheng, Huang, Zhijian, Meng, Ziyu

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition, Computer Science - Artificial Intelligence

URL الوصول: http://arxiv.org/abs/2309.06006

المؤلفون: Fu, Jiajun, Chen, Caixue, Lan, Yonghong

المصدر: IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society Industrial Electronics Society, IECON 2022 – 48th Annual Conference of the IEEE. :1-6 Oct, 2022

Relation: IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society

المؤلفون: Zhang, Shaojie, Yin, Jianqin, Dang, Yonghao, Fu, Jiajun

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2308.16018

المؤلفون: Fu, Jiajun, Dang, Yonghao, Yin, Ruoqi, Zhang, Shaojie, Zhou, Feng, Zhao, Wending, Yin, Jianqin

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2303.07141

المؤلفون: Fu, Qiang, Li, Xun, Guo, Jian, Guo, Shuxiang, Cai, Zhuocong, Fu, Jiajun

المصدر: 2021 IEEE International Conference on Mechatronics and Automation (ICMA) Mechatronics and Automation (ICMA), 2021 IEEE International Conference on. :909-913 Aug, 2021

Relation: 2021 IEEE International Conference on Mechatronics and Automation (ICMA)

المؤلفون: Wang, Yang, Gao, Feng, Zhou, Shuai^{Aff1, IDs4084302325041_cor3}, Hu, Po, Fu, Jiajun^{Aff1, IDs4084302325041_cor5}

المصدر: Science China Materials. 66(9):3696-3705

المؤلفون: Fu, Jiajun, Zhang, Jun

المصدر: 2020 IEEE International Conference on Progress in Informatics and Computing (PIC) Progress in Informatics and Computing (PIC), 2020 IEEE International Conference on. :119-123 Dec, 2020

Relation: 2020 IEEE International Conference on Progress in Informatics and Computing (PIC)

المؤلفون: Fu, Jiajun, Yang, Fuxing, Dang, Yonghao, Liu, Xiaoli, Yin, Jianqin

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2204.01297

المؤلفون: Fu, Qiang, Fu, Jiajun, Guo, Jian, Guo, Shuxiang, Li, Xun

المصدر: 2020 IEEE International Conference on Mechatronics and Automation (ICMA) Mechatronics and Automation (ICMA), 2020 IEEE International Conference on. :1918-1922 Oct, 2020

Relation: 2020 IEEE International Conference on Mechatronics and Automation (ICMA)

المؤلفون: Wang, Lin^{Aff1, Aff2}, Wang, Xuebin, Liu, Tong, Sun, Fuyao, Li, Suning, Geng, Yuhao, Yao, BoWen^{Aff1, IDs41529023004159_cor7}, Xu, Jianhua^{Aff1, Aff2, IDs41529023004159_cor8}, Fu, JiaJun^{Aff1, IDs41529023004159_cor9}

المصدر: npj Materials Degradation. 7(1)