المؤلفون: Kang, H. X., Fu, Y. Q., Liu, G. Z.^{Aff2, IDS1063774522100133_cor3}

المصدر: Crystallography Reports. 68(7):1128-1133

المؤلفون: Hasan, Sameer A., Gibson, Des, Song, Shigeng, Wu, Qiang, Ng, Wai Pang, McHale, Glen, Dean, John, Fu, Y. Q.

المصدر: 2017 IEEE SENSORS SENSORS, 2017 IEEE. :1-3 Oct, 2017

Relation: 2017 IEEE SENSORS

المؤلفون: Fu, Y. Q., Luo, J. K., Milne, S., Flewitt, A. J., Milne, W. I.

المصدر: 2016 IEEE 29th International Conference on Micro Electro Mechanical Systems (MEMS) Micro Electro Mechanical Systems (MEMS), 2016 IEEE 29th International Conference on. :1046-1049 Jan, 2016

Relation: 2016 IEEE 29th International Conference on Micro Electro Mechanical Systems (MEMS)

المؤلفون: Fu, Y. Q.^{Aff1, Aff2}, Wang, Y. M., Sang, X. X., Ju, J. S.^{Aff4, IDs11223022004044_cor4}

المصدر: Strength of Materials. 54(2):281-291

المؤلفون: Lalam, N., Ng, W. P., Wu, Q., Dai, X., Fu, Y. Q.

المصدر: 2016 10th International Symposium on Communication Systems, Networks and Digital Signal Processing (CSNDSP) Communication Systems, Networks and Digital Signal Processing (CSNDSP), 2016 10th International Symposium on. :1-3 Jul, 2016

Relation: 2016 10th International Symposium on Communication Systems, Networks and Digital Signal Processing (CSNDSP)

المؤلفون: Bai, J. J., Ma, L. D., Chen, Q., Zhang, G. F., Fu, Y. Q.

المصدر: 2016 IEEE International Conference on Microwave and Millimeter Wave Technology (ICMMT) Microwave and Millimeter Wave Technology (ICMMT), 2016 IEEE International Conference on. 2:668-670 Jun, 2016

Relation: 2016 IEEE International Conference on Microwave and Millimeter Wave Technology (ICMMT)

المؤلفون: Fu, Y. Q.^{Aff1, Aff2}, Zhang, Y., Zhang, D., Ju, J. S.^{Aff3, IDs11223022003818_cor4}

المصدر: Strength of Materials. 54(1):53-60

المؤلفون: Li, Y., Fu, Y. Q., Flynn, B. W., Parkes, W., Liu, Y., Brodie, S., Terry, J. G., Haworth, L. I., Bunting, A. S., Stevenson, J. T. M., Smith, S., Walton, A. J.

المصدر: 2010 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on. :52-57 Mar, 2010

Relation: 2010 International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Wang, J. L., Shang, J. H.^Aff2, Guo, Y. J.^Aff1, Jiang, Y. Y., Xiong, W. K., Li, J. S., Yang, X., Torun, H., Fu, Y. Q., Zu, X. T.^Aff1

المصدر: Journal of Materials Science: Materials in Electronics. 32(14):18551-18564

المؤلفون: Tu, B., Xiao, J., Yao, K., Shen, Y., Yang, Y., Lu, D., Li, W. X., Qiu, M. L., Wang, X., Chen, C. Y., Fu, Y. Q., Wei, B., Zheng, C., Huang, L. Y., Hutton, R., Zou, Y.

مصطلحات موضوعية: Physics - Atomic Physics

URL الوصول: http://arxiv.org/abs/1504.05673