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المؤلفون: Thomas Yang, Man-Ho Kwan, J. L. Yu, Alexander Kalnitsky, H. C. Tuan, Tom Tsai, Gaofei Tang, Lin You-Ru, Chan-Hong Chern, Fu-Wei Yao, Kevin J. Chen, Ru-Yi Su
المصدر: IEEE Electron Device Letters. 39:1362-1365
مصطلحات موضوعية: 010302 applied physics, Frequency response, Fabrication, Materials science, Equivalent series resistance, business.industry, 020208 electrical & electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, Capacitance, Electronic, Optical and Magnetic Materials, law.invention, Power (physics), Capacitor, law, Logic gate, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Power semiconductor device, Electrical and Electronic Engineering, business
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المؤلفون: Ru-Yi Su, H. C. Tuan, Tom Tsai, Zhaofu Zhang, J. L. Yu, Gaofei Tang, Fu-Wei Yao, Chan-Hong Chern, Jiacheng Lei, Man-Ho Kwan, Thomas Yang, Lin You-Ru, Kevin J. Chen, Jiabei He, Alexander Kalnitsky
المصدر: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 020208 electrical & electronic engineering, Gallium nitride, Slew rate, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Current source, 01 natural sciences, Threshold voltage, chemistry.chemical_compound, chemistry, Logic gate, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Gate driver, Optoelectronics, Power semiconductor device, business, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::201d6c63de1c9a5a11c212b708b09916
https://doi.org/10.1109/ispsd.2018.8393606 -
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المؤلفون: King-Yuen Wong, Fu-Wei Yao, Chung-Yi Yu, Chih-Chieh Yeh, Yun-Hsiang Wang, Wen-De Wang, Yu-Syuan Lin, Ru-Yi Su, Ming-Huei Lin, S.-C. Liu, M.-H. Chang, Jan-Wen You, C.H. Tsai, S.-P. Wang, Man-Ho Kwan, Haw-Yun Wu, C. B. Wu, Ching-Ray Chen, Alex Kalnitsky, Tze-Chiang Huang, Chan-Hong Chern, L. Y. Tsai, H. C. Tuan, W.-C. Yang, J. L. Yu, Chen Po-Chih
المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Scheme (programming language), Buck converter, business.industry, Computer science, 020208 electrical & electronic engineering, Electrical engineering, 02 engineering and technology, 01 natural sciences, Aluminum gallium nitride, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Power semiconductor device, Channel modulation, business, Low voltage, computer, computer.programming_language, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3359bea377394fc519c97cbda076c7a6
https://doi.org/10.1109/iedm.2017.8268488 -
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المؤلفون: Mo Di E, Fu Wei Yao, Tao Ding, Hong Ke Wan, Sheng Chao Zhan
المصدر: Advanced Materials Research. :232-235
مصطلحات موضوعية: Chemistry, Potassium, Inorganic chemistry, Chemical oxygen demand, General Engineering, chemistry.chemical_element, Chloride, chemistry.chemical_compound, Potassium permanganate, Wastewater, Environmental chemistry, Oxidizing agent, medicine, Chlorine, Potassium dichromate, medicine.drug
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1469193bb91c6dfe461fb4f0261ee203
https://doi.org/10.4028/www.scientific.net/amr.807-809.232 -
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المؤلفون: C.Y. Chan, J. L. Yu, Chang Yu-Chi, H. C. Tuan, C. B. Wu, Yu-Syuan Lin, Ru-Yi Su, King-Yuen Wong, Tsai Chun-Lin, Ming-Cheng Lin, Nan-Ying Yang, C.L. Yeh, Fu-Wei Yao, Man-Ho Kwan, Chen Po-Chih, M. W. Tsai, F. J. Yang, Alex Kalnitsky, Haw-Yun Wu, J. L. Tsai
المصدر: 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
مصطلحات موضوعية: 010302 applied physics, Materials science, 020208 electrical & electronic engineering, Analytical equations, Gallium nitride, 02 engineering and technology, 01 natural sciences, Capacitance, Power (physics), chemistry.chemical_compound, chemistry, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Field-effect transistor, Cascode, Zener diode, Energy (signal processing)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8f7357e7649af1273a626ae259d5eb10
https://doi.org/10.1109/ispsd.2016.7520826 -
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المؤلفون: K.-Y. Roy Wong, Chen Po-Chih, C. B. Wu, Ching-Ray Chen, C. W. Hsiung, Ming-Huei Lin, F. J. Yang, Liao Yan-Jie, M. W. Tsai, Yani Lai, Chiu Hsien-Kuang, Tom Tsai, Man-Ho Kwan, Sheng-Da Liu, Burn Jeng Lin, Chang Yu-Chi, Jan-Wen You, Alex Kalnitsky, Chen-Shien Chen, M.-H. Chang, J. L. Yu, L. Y. Tsai, Yu-Syuan Lin, P.-C. Liu, Ru-Yi Su, Fu-Wei Yao, H. C. Tuan, L. C. Chen, Haw-Yun Wu, K.-L. Chiu, Chia-Shiung Tsai, Chung-Yi Yu, S.-P. Wang, G. P. Lansbergen, Chiang Chen-Hao
المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Materials science, business.industry, Transistor, Schottky diode, Gallium nitride, Capacitance, law.invention, chemistry.chemical_compound, chemistry, law, Logic gate, Optoelectronics, business, MISFET, AND gate, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7faa0d215059670d3d4fc905d6e081b
https://doi.org/10.1109/iedm.2015.7409663 -
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المؤلفون: P. C. Chen, Chang Yu-Chi, Haw-Yun Wu, C. W. Hsiung, C. B. Wu, J. L. Tsai, Alex Kalnitsky, Yu-Syuan Lin, J. L. Yu, Fu-Wei Yao, Ru-Yi Su, M. W. Tsai, Yani Lai, Man Ho Kwan, Chung-Yi Yu, Ming-Huei Lin, M.-H. Chang, Chiu Hsien-Kuang, S.-P. Wang, Lin Hsing-Chih, G. P. Lansbergen, P.-C. Liu, King-Yuen Wong, L. C. Chen, Ching-Ray Chen, Wu Cheng-Ta, F. J. Yang, H. C. Tuan
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Electrical engineering, Optoelectronics, Breakdown voltage, Field-effect transistor, Wafer, High voltage, business, Epitaxy, Cmos compatible, Power (physics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ae1841ade0c92d1ddbbd5e8ec22c1875
https://doi.org/10.1109/iedm.2014.7047073 -
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المؤلفون: C. W. Hsiung, Chia-Shiung Tsai, C. L. Tsai, J. L. Yu, Chou Chien-Chih, Chiu Hsien-Kuang, Ping Chen Chen, King-Yuen Wong, F. J. Yang, H. C. Tuan, C. J. Yu, Sheng-Da Liu, Fu-Wei Yao, Chung-Hao Tsai, Yu-Syuan Lin, Ru-Yi Su, Xiaomeng Chen, Alex Kalnitsky, G. P. Lansbergen
المصدر: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
مصطلحات موضوعية: Materials science, Silicon, business.industry, chemistry.chemical_element, Algan gan, Substrate (electronics), Nitride, Threshold voltage, Trap (computing), Reliability (semiconductor), chemistry, Optoelectronics, Positive bias, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d01b1c02f3be2ff85e55ca77c2e4bd9b
https://doi.org/10.1109/ispsd.2014.6856034 -
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المؤلفون: Yu-Syuan Lin, Alex Kalnitsky, Ru-Yi Su, C. W. Hsiung, P.-C. Liu, Ming-Huei Lin, Chiu Hsien-Kuang, F. J. Yang, H. C. Tuan, King-Yuen Wong, S. D. Liu, J. L. Yu, Fu-Wei Yao, C. J. Yu, Xiaomeng Chen, C. L. Tsai, Yani Lai, Chia-Shiung Tsai, Ching-Ray Chen, Chen Po-Chih, G. P. Lansbergen, Chung-Yi Yu, Chiang Chen-Hao
المصدر: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Contact resistance, Electrical engineering, Optoelectronics, Breakdown voltage, Algan gan, Substrate (electronics), business, Epitaxy, Layer (electronics), Bias stress
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::15f0b75d4642c065a0ced749472125e9
https://doi.org/10.1109/ispsd.2014.6855974