يعرض 1 - 10 نتائج من 35 نتيجة بحث عن '"Fujii, Shuntaro"', وقت الاستعلام: 0.93s تنقيح النتائج
  1. 1
    مؤتمر
    Experimental Analysis of Process Impacts on Fluorine Incorporated Gate Oxide Film Properties Near Gate Edge Region

    المؤلفون: Fujii, Shuntaro, Maru, Isao, Morita, Soichi, Miyazaki, Tsutomu

    المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :268-270 Mar, 2022

    Relation: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

    أضف إلى المفضلة
  2. 2
    مؤتمر
    Impacts of Depth and Lateral Profiles of Fluorine Atoms in Gate Oxide Films on Reliability

    المؤلفون: Fujii, Shuntaro, Hamada, Shohei, Yagi, Tatsushi, Maru, Isao, Katsuki, Shogo, Sakamoto, Toshiro, Okamoto, Atsushi, Morita, Soichi, Miyazaki, Tsutomu

    المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-5 Mar, 2021

    Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

    Full Text Finder
    أضف إلى المفضلة
  3. 3
    مؤتمر
    Experimental Understanding of the Impact of Channel Percolation on Low Frequency Noise Using Transient Enhanced Diffusion of Channel Dopants

    المؤلفون: Fujii, Shuntaro, Morita, Soichi, Miyazaki, Tsutomu

    المصدر: 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2021 5th IEEE. :1-3 Apr, 2021

    Relation: 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

    أضف إلى المفضلة
  4. 4
    مؤتمر
    Analysis of the Effects of Boron Transient Enhanced Diffusion on Threshold Voltage Mismatch in Steep Retrograde Doping NMOSFETs with Inserted Oxygen Layers

    المؤلفون: Fujii, Shuntaro, Takeuchi, Hideki, Morita, Soichi, Yagi, Tatsushi, Hamada, Shohei, Sakamoto, Toshiro, Kawaguchi, Shinji, Ishigami, Naoki, Okamoto, Atsushi, Ikeda, Shuji, Wong, Hiu-Yung, Mears, Robert J., Miyazaki, Tsutomu

    المصدر: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2020 IEEE International Symposium on the. :1-4 Jul, 2020

    Relation: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

    Full Text Finder
    أضف إلى المفضلة
  5. 5
    مؤتمر
    Experimental Study on Effects of Boron Transient Enhanced Diffusion on Channel Size Dependences of Low Frequency Noise in NMOSFETs

    المؤلفون: Fujii, Shuntaro, Maru, Isao, Morita, Soichi, Miyazaki, Tsutomu

    المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-5 Mar, 2019

    Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

    Full Text Finder
    أضف إلى المفضلة
  6. 6
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

    View this record from ISI Web of Science
    أضف إلى المفضلة
  7. 7
    مؤتمر
    Analyzing the effects of boron transient enhanced diffusion on low frequency noise in NMOSFETs

    المؤلفون: Fujii, Shuntaro, Yagi, Tatsushi, Hamada, Shohei, Maru, Isao, Okuaki, Yusuke, Chiaki, Tomohiko, Okamoto, Atsushi, Sakamoto, Toshiro, Miyazaki, Tsutomu

    المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :XT-3.1-XT-3.5 Apr, 2017

    Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)

    Full Text Finder
    أضف إلى المفضلة
  8. 8
    In-Plane Grain Orientation Alignment of Polycrystalline Silicon Films

    المؤلفون: Nakajima, Anri, Kuroki, Shin-Ichiro, Fujii, Shuntaro, Ito, Takashi

    المصدر: Jpn. J. Appl. Phys.. 51:1-4

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=jairo_______::30281b2f97b757faf7ab1d3492cdd985
    http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100639799

    أضف إلى المفضلة
  9. 9
    Large Grain Growth of Silicon Thin Films by using CW Green Laser

    المؤلفون: Kuroki, Shin-Ichiro, Fujii, Shuntaro, Kotani, Koji, Ito, Takashi

    المصدر: 2006 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD2006). 106(No. 137):119-122

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=jairo_______::2e423f0b2819a10178fc9c1fe5aaa15b
    http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100615432

    أضف إلى المفضلة
  10. 10
    Carrier Transport and its variation of lase-lateral-crystallised poly-Si TFTs

    المؤلفون: Kuroki, Shin-Ichiro, Fujii, Shuntaro, Kotani, Koji, Ito, Takashi

    المصدر: ELECTRONICS LETTERS. 47(No. 24)

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=jairo_______::4e84800396021a538819b5f2fa28b9fb
    http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100631771

    أضف إلى المفضلة
أدوات البحث: أحصل على تغذية RSS – أرسل هذا البحث بالبريد الإلكتروني – حفظ البحث – جدول التنبيهات: لا شيء