المؤلفون: Gerard Ghibaudo, G. Bidal, Flore Kergomard, A. Bajolet, Antoine Cros, Cheikh Diouf, Julien Rosa, R.A. Bianchi, Lama Rahhal

المساهمون: Science et Ingénierie des Matériaux et Procédés (SIMaP), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Centre National de la Recherche Scientifique (CNRS)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Grenoble Alpes (UGA), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)

المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2013, 85, pp.15-22. ⟨10.1016/j.sse.2013.03.001⟩

مصطلحات موضوعية: Materials science, chemistry.chemical_element, Germanium, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, law.invention, law, 0103 physical sciences, MOSFET, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Materials Chemistry, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical and Electronic Engineering, Metal gate, ComputingMilieux_MISCELLANEOUS, High-κ dielectric, 010302 applied physics, business.industry, 020208 electrical & electronic engineering, Transistor, Electrical engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Threshold voltage, Gain factor, chemistry, Optoelectronics, business, Hardware_LOGICDESIGN, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9dda9e947662c00b1f46be90d3048d1a
https://doi.org/10.1016/j.sse.2013.03.001

المؤلفون: Damien Jeanjean, Guillaume Briend, Philippe Garnier, Didier Lévy, Denis Tanon-Pellissier, Olivier Gourhant, G. Bidal, Didier Dutartre, Nicolas Breil, Yves Campidelli

المصدر: ECS Transactions. 41:179-186

مصطلحات موضوعية: Front and back ends, Surface (mathematics), Materials science, business.industry, Optoelectronics, business, Sensitivity (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a0757f887e0feeac509d4ca85360fe41
https://doi.org/10.1149/1.3630842

المؤلفون: C. Leyris, G. Bidal, D. Lopez, Sebastien Haendler, Gerard Ghibaudo

المصدر: IEEE Transactions on Electron Devices. 58:2310-2316

مصطلحات موضوعية: Noise temperature, Materials science, CMOS, Logic gate, Electronic engineering, Y-factor, Flicker noise, Electrical and Electronic Engineering, Noise (electronics), NMOS logic, Electronic, Optical and Magnetic Materials, PMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ba57b316d4b197cbf117eff9ed7bfe4c
https://doi.org/10.1109/ted.2011.2141139

المؤلفون: Sébastien Barnola, Francois Leverd, Pierre Perreau, B. Orlando, Frederic Boeuf, D. Fleury, Gerard Ghibaudo, L. Clement, G. Bidal, Nicolas Loubet, Stephane Denorme, Remi Beneyton, Stephane Monfray, Thomas Skotnicki, A. Pouydebasque, Pascal Gouraud, J.-L. Huguenin, T. Salvetat

المصدر: Solid-State Electronics. 54:883-889

مصطلحات موضوعية: Engineering, Silicon, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, Parasitic capacitance, Stack (abstract data type), Ballistic conduction, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Electronic engineering, Electrical and Electronic Engineering, High-κ dielectric, Electronic circuit, 010302 applied physics, business.industry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, chemistry, Current (fluid), 0210 nano-technology, business, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b15447fc322b8864d7c7380048d76eb6
https://doi.org/10.1016/j.sse.2010.04.029

المؤلفون: L. Clement, J.-L. Huguenin, Frederic Boeuf, J.M. Hartmann, V Destefanis, Thomas Skotnicki, Stephane Denorme, Stephane Monfray, Y. Campidelli, C. Fenouillet-Beranger, Christian Arvet, G. Bidal, O. Faynot, M.-P. Samson, K. Benotmane, Nicolas Loubet

المصدر: Solid-State Electronics

مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Electrical engineering, Context (language use), 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Power (physics), ComputingMethodologies_PATTERNRECOGNITION, Depletion region, CMOS, Power consumption, Low-power electronics, 0103 physical sciences, Materials Chemistry, Optoelectronics, Node (circuits), Electrical and Electronic Engineering, Thin film, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2add85a01df4d4c91e52639871e9f05f
https://doi.org/10.1016/j.sse.2009.12.013

المؤلفون: R. A. Pilatti, G. Bidal, N. Montú, A. C. Vegetti, J. C. Tivano

المصدر: Natura Neotropicalis; Vol. 1 Núm. 11 (1980): Natura Neotropicalis; 13-19
Natura Neotropicalis; Vol 1 No 11 (1980): Natura Neotropicalis; 13-19
Biblioteca Virtual (UNL)
Universidad Nacional del Litoral
instacron:UNL

مصطلحات موضوعية: General Earth and Planetary Sciences, General Environmental Science

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a83dc98006df1487319b4f4377912a31
https://doi.org/10.14409/natura.v1i11.3367

المؤلفون: D. Barge, Gerard Ghibaudo, C. Leroux, D. Pellissier-Tanon, F. Abbate, Denis Rideau, G. Bidal, Clement Tavernier, O. Saxod, G. Reimbold, Alain Toffoli, A. Soussou, G. Romano

المساهمون: Institut des Matériaux Jean Rouxel (IMN), Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST), Université de Nantes (UN)-Université de Nantes (UN)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Ecole Polytechnique de l'Université de Nantes (EPUN), Université de Nantes (UN)-Université de Nantes (UN), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)

المصدر: Microelectronic Engineering
Microelectronic Engineering, Elsevier, 2013, 109, pp.282-285. ⟨10.1016/j.mee.2013.03.008⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Gate stack, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Dipole, 0103 physical sciences, Optoelectronics, Work function, Flat band, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, business, ComputingMilieux_MISCELLANEOUS, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4a250045984f0f0de0160a27ad361368
https://hal.archives-ouvertes.fr/hal-00996510

المؤلفون: Francois Leverd, B. Le-Gratiet, C. Borowiak, Thomas Ernst, Frederic Boeuf, L. Pinzelli, S. Barraud, T. Morel, Stephane Denorme, J.-L. Huguenin, Romain Wacquez, Sébastien Barnola, Pascal Gouraud, J. Bustos, G. Bidal, Stephane Monfray, M.-P. Samson, O. Faynot, Jf. Dalemcourt, K. Benotmane, B. Icard, Christian Arvet, Laurent Pain, Y. Campidelli, Thomas Skotnicki, P. Perreau, M. Martin, Remi Beneyton, C. De-Buttet

المصدر: 2010 International Electron Devices Meeting.

مصطلحات موضوعية: Very-large-scale integration, Materials science, Silicon, business.industry, Transistor, Electrical engineering, chemistry.chemical_element, Silicon-germanium, law.invention, chemistry.chemical_compound, Planar, CMOS, chemistry, Direct exposure, law, Logic gate, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8f28f8ef509130416e0f809c762831fb
https://doi.org/10.1109/iedm.2010.5703339

المؤلفون: Remi Beneyton, T. Salvetat, Stephane Monfray, Stephane Denorme, Nicolas Loubet, A. Pouydebasque, Sébastien Barnola, G. Bidal, Francois Leverd, Frederic Boeuf, L. Clement, Thomas Skotnicki, Gerard Ghibaudo, J.-L. Huguenin, Pascal Gouraud, P. Perreau, B. Orlando, D. Fleury

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), Domenget, Chahla

المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2010, 54 (9), pp.883-889
HAL

مصطلحات موضوعية: Electron mobility, Materials science, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 02 engineering and technology, 01 natural sciences, chemistry.chemical_compound, Stack (abstract data type), [PHYS.COND.CM-GEN] Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], Ballistic conduction, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, ComputingMilieux_MISCELLANEOUS, High-κ dielectric, Electronic circuit, 010302 applied physics, business.industry, Electrical engineering, Semiconductor device, 021001 nanoscience & nanotechnology, Engineering physics, Silicon-germanium, chemistry, Logic gate, [PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e2a44e81fe5a368e89f13ddbafce5c0d
https://hal.archives-ouvertes.fr/hal-00596345

المؤلفون: C. Borowiak, Stephane Denorme, M.-P. Samson, L. Clement, Francois Leverd, G. Bidal, Sébastien Barnola, F. Abbate, K. Benotmane, Y. Campidelli, C. Fenouillet-Beranger, Thomas Skotnicki, Frederic Boeuf, Gerard Ghibaudo, Stephane Monfray, Dominique Golanski, P. Perreau, J.-L. Huguenin, Nicolas Loubet

المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Laboratoire de physiopathologie de la nutrition (LPN), Université Paris Diderot - Paris 7 (UPD7)-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), Domenget, Chahla, Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)

المصدر: International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), 2010, Taiwan
HAL

مصطلحات موضوعية: Materials science, Silicon, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, chemistry.chemical_element, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, law.invention, Stack (abstract data type), law, Low-power electronics, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Wafer, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, ComputingMilieux_MISCELLANEOUS, 010302 applied physics, business.industry, Transistor, Electrical engineering, 021001 nanoscience & nanotechnology, chemistry, Logic gate, Optoelectronics, 0210 nano-technology, Tin, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::82bf0d61aebef7940501c0cc121ab605
https://hal.science/hal-00604654