المؤلفون: O. Billoint, G. Cibrario, Behnam Samadpoor Rikan, Philipp Hafliger, Mehdi Mouhdach

المصدر: MWSCAS

مصطلحات موضوعية: Sinc function, Computer science, law, Circuit design, Transistor, Process (computing), Volume (computing), Electronic engineering, Mixed-signal integrated circuit, Realization (systems), Electronic circuit, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bca01230232afd7fcc71fe958e0e29b5
https://doi.org/10.1109/mwscas47672.2021.9531677

المؤلفون: Benoit Sklenard, Bastien Giraud, Sebastien Thuries, Mikael Casse, Joris Lacord, Cm. Ribotta, V. Lapras, P. Acosta-Alba, O. Billoint, M. Mouhdach, N. Rambal, Pascal Besson, Francois Andrieu, Perrine Batude, Didier Lattard, Laurent Brunet, Gilles Sicard, Xavier Garros, Christoforos G. Theodorou, L. Brevard, Maud Vinet, V. Mazzocchi, P. Sideris, M. Ribotta, Claire Fenouillet-Beranger, F. Ponthenier, Pascal Vivet, Sebastien Kerdiles, G. Cibrario, J.M. Hartmann, Frank Fournel, Bernard Previtali, Frédéric Mazen, Claude Tabone

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

المصدر: 2021 IEEE International Interconnect Technology Conference (IITC)
2021 IEEE International Interconnect Technology Conference (IITC), Jul 2021, Kyoto, France. pp.1-1, ⟨10.1109/IITC51362.2021.9537356⟩

مصطلحات موضوعية: Presentation, Reliability (semiconductor), Materials science, CMOS, Process (engineering), media_common.quotation_subject, Key (cryptography), Systems engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Active devices, Sketch, ComputingMilieux_MISCELLANEOUS, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5a896dcadaa6b8a425398da1a162204f
https://hal.archives-ouvertes.fr/hal-03434018

المؤلفون: Francois Andrieu, L. Ciampolini, G. Cibrario, F. Balestra, Joris Lacord, Xavier Garros, Perrine Batude, Laurent Brunet, A. Makosiej, D. Lattard, Bastien Giraud, Maud Vinet, Claire Fenouillet-Beranger, J.-P. Colinge, Olivier Weber, J. Cluzel, D. Bosch

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)

المصدر: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2019, Grenoble, France. pp.1-4, ⟨10.1109/EUROSOI-ULIS45800.2019.9041890⟩

مصطلحات موضوعية: Computer science, WNM, 02 engineering and technology, 01 natural sciences, SNM, Stress (mechanics), Planar, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Static noise margin, Static random-access memory, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 010302 applied physics, variability, 020208 electrical & electronic engineering, SRAM margins, 3D-monolithic, FDSOI, Temperature instability, BTI stress, Spatial variability, Back bias, Back/Body Biasing, Voltage, Supply Read Retention Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5a29cff3968e6920ebe18ab7cb26addf
https://hal.archives-ouvertes.fr/hal-02998370

المؤلفون: F. Balestra, A. Makosiej, Joris Lacord, Maud Vinet, Laurent Brunet, E. Esmanhotto, Francois Andrieu, Marco Rios, J. Cluzel, G. Cibrario, Perrine Batude, Olivier Weber, R. Berthelon, D. Lattard, D. Bosch, L. Ciampolini, Claire Fenouillet-Beranger, J.-P. Colinge, Bastien Giraud, S. Lang, Xavier Garros

المصدر: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).

مصطلحات موضوعية: Physics, Hardware_MEMORYSTRUCTURES, Fine grain, Transistor, Order (ring theory), Hardware_PERFORMANCEANDRELIABILITY, Topology, Capacitance, law.invention, Reduction (complexity), Planar, law, Hardware_INTEGRATEDCIRCUITS, Static random-access memory, Access time

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6339fddbd9f229a6f65ff13fd410189d
https://doi.org/10.1109/vlsi-tsa.2019.8804649

المؤلفون: M. Mouhdach, Sebastien Thuries, Didier Lattard, G. Cibrario, O. Billoint, K. Azizi-Mourier, Pascal Vivet

المصدر: 2019 International 3D Systems Integration Conference (3DIC)
3DIC

مصطلحات موضوعية: Interconnection, Computer science, 020208 electrical & electronic engineering, Stacking, Process design, 02 engineering and technology, 020202 computer hardware & architecture, Computer architecture, Proof of concept, Memory architecture, 0202 electrical engineering, electronic engineering, information engineering, Granularity, Engineering design process, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::54d0aecdf0685cada95078adf7e7c291

المؤلفون: Francois Andrieu, Joris Lacord, R. Berthelon, Laurent Brunet, A. Makosiej, Olivier Weber, C. Fenouillet-Beranger, X. Garros, G. Cibrario, D. Lattard, J.-P. Colinge, J. Cluzel, Lorenzo Ciampolini, D. Bosch, Perrine Batude, F. Balestra, Bastien Giraud

المصدر: Solid-State Electronics. 168:107720

مصطلحات موضوعية: 010302 applied physics, Hardware_MEMORYSTRUCTURES, Computer science, Transistor, Spice, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Capacitance, Electronic, Optical and Magnetic Materials, law.invention, Reduction (complexity), Planar, law, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Electronic engineering, Static random-access memory, Back bias, Electrical and Electronic Engineering, 0210 nano-technology, Access time

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::693fb96b0d9182cfb46ea634695f9b9a
https://doi.org/10.1016/j.sse.2019.107720

المؤلفون: John Morgan, Remy Berthelon, Jan Hoentschel, L. Pirro, G. Cibrario, Francois Andrieu, M. Wiatr, M. Vinet

المصدر: 2018 IEEE Symposium on VLSI Technology.

مصطلحات موضوعية: 010302 applied physics, Physics, business.industry, Biasing, FBB, Ring oscillator, 01 natural sciences, 7. Clean energy, PMOS logic, CMOS, 0103 physical sciences, Inverter, Optoelectronics, business, NMOS logic, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2800450d12f1f2a6c0b7ec53aae97eb0
https://doi.org/10.1109/vlsit.2018.8510636

المؤلفون: C. Fenouillet-Beranger, Perrine Batude, G. Cibrario, G. Tricaud, R. Boumchedda, Pierre Morin, Franck Arnaud, Laurent Brunet, O. Rozeau, Bastien Giraud, Sebastien Thuries, M. Vinet, Joris Lacord, R. Berthelon, S. Guissi, D. Fried, B. Mathieu, O. Billoint, Francois Andrieu, J.-P. Noel, A. Ayres de Sousa, E. Avelar

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Transistor, Spice, Electrical engineering, 02 engineering and technology, 01 natural sciences, 020202 computer hardware & architecture, law.invention, Power (physics), law, Logic gate, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Inverter, Static random-access memory, business, Low voltage, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0dc4ba1dc97a9317eb210e8ddb6f1d5d
https://doi.org/10.1109/iedm.2017.8268428

المؤلفون: Perrine Batude, Vincent Lu Cao-Minh, Claire Fenouillet-Beranger, Sebastien Thuries, Laurent Brunet, O. Billoint, Cristiano Santos, B. Mathieu, G. Cibrario, Francois Andrieu, M. Brocard, Jean-Philippe Colonna

المصدر: ISVLSI

مصطلحات موضوعية: 010302 applied physics, Standard cell, Materials science, Circuit design, Spice, Transistor, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, PMOS logic, law.invention, Operating temperature, law, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Transient (oscillation), 0210 nano-technology, NMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b21477c0d4d7f84cc29e8d94460e90b3
https://doi.org/10.1109/isvlsi.2017.100

المؤلفون: X. Garros, N. Rambal, C. Fenouillet-Beranger, M. Brocard, L. Pasini, G. Cibrario, Thomas Skotnicki, M.-P. Samson, A. Ayres, Laurent Brunet, M. Vinet, C. Tallaron, C-M. V., O. Billoint, R. Gassilloud, Francois Andrieu, R. Kies, G. Romano, Perrine Batude, Bernard Previtali, A. Toffoli, M. Casse, P. Besombes, C. Leroux, Claude Tabone, V. Lapras, A. Laurent, D. Barge

المصدر: 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).

مصطلحات موضوعية: Footprint (electronics), Reduction (complexity), Materials science, Reliability (semiconductor), CMOS, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Stacking, Three-dimensional integrated circuit, Hardware_PERFORMANCEANDRELIABILITY, Static random-access memory, NMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8f5a2b330e51e3a5752e754ac6b9e197
https://doi.org/10.1109/vlsi-tsa.2017.7942495