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1دورية أكاديمية
المؤلفون: A. Redaelli, A. Gandolfo, G. Samanni, E. Gomiero, E. Petroni, L. Scotti, A. Lippiello, P. Mattavelli, J. Jasse, D. Codegoni, A. Serafini, R. Ranica, C. Boccaccio, J. Sandrini, R. Berthelon, J.-C. Grenier, O. Weber, D. Turgis, A. Valery, S. Del Medico, V. Caubet, J.-P. Reynard, D. Dutartre, L. Favennec, A. Conte, F. Disegni, M. De Tomasi, A. Ventre, M. Baldo, D. Ielmini, A. Maurelli, P. Ferreira, F. Arnaud, F. Piazza, P. Cappelletti, R. Annunziata, R. Gonella
المصدر: IEEE Journal of the Electron Devices Society, Vol 10, Pp 563-568 (2022)
مصطلحات موضوعية: ePCM, reliability, BEOL, 28nm FDSOI, embedded memory, emerging memory, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: E. Gomiero, G. Samanni, J. Jasse, C. Jahan, O. Weber, R. Berthelon, R. Ranica, L. Favennec, V. Caubet, D. Ristoiu, J. P. Reynard, L. Clement, P. Zuliani, R. Annunziata, F. Arnaud
المصدر: IEEE Journal of the Electron Devices Society, Vol 7, Pp 517-521 (2019)
مصطلحات موضوعية: Amorphous, chalcogenide, phase change memory (PCM), Ge-Sb-Te (GST) compounds, quenching time, resistance, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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المؤلفون: L. Laurin, M. Baldo, E. Petroni, G. Samanni, L. Turconi, A. Motta, M. Borghi, A. Serafini, D. Codegoni, M. Scuderi, S. Ran, A. Claverie, D. Ielmini, R. Annunziata, A. Redaelli
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e91b2890e7f8a3ed0d8c624507c9ce83
https://doi.org/10.1109/irps48203.2023.10118155 -
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المؤلفون: R. Ranica, R. Berthelon, A. Gandolfo, G. Samanni, E. Gomiero, J. Jasse, P. Mattavelli, J. Sandrini, M. Querre, Y. Le-Friec, J. Poulet, V. Caubet, L. Favennec, C. Boccaccio, G. Ghezzi, C. Gallon, JC. Grenier, B. Dumont, O. Weber, A. Villaret, R. Beneyton, N. Cherault, D. Ristoiu, S. Del Medico, O. Kermarrec, JP. Reynard, P. Boivin, A. Souhaite, L. Desvoivres, S. Chouteau, PO. Sassoulas, L. Clement, A. Valery, E. Petroni, D. Turgis, A. Lippiello, L. Scotti, F. Disegni, A. Ventre, D. Ornaghi, M. De Tomasi, A. Maurelli, A. Conte, F. Arnaud, A. Redaelli, R. Annunziata, P. Cappelletti, F. Piazza, P. Ferreira, R. Gonella, E. Ciantar
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::652fcb15ec770ffda0355c498b7b0e9e
https://doi.org/10.1109/iedm19574.2021.9720669 -
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المؤلفون: Roberto Annunziata, O. Weber, J. Jasse, Paola Zuliani, V. Caubet, Franck Arnaud, G. Samanni, Enrico Gomiero, L. Favennec, R. Berthelon, D. Ristoiu, C. Jahan, L. Clement, J. P. Reynard, R. Ranica
المصدر: IEEE Journal of the Electron Devices Society, Vol 7, Pp 517-521 (2019)
مصطلحات موضوعية: Materials science, Chalcogenide, Measure (mathematics), law.invention, resistance, chalcogenide, chemistry.chemical_compound, law, Electrical and Electronic Engineering, Crystallization, business.industry, Process (computing), quenching time, Function (mathematics), Ge-Sb-Te (GST) compounds, Electronic, Optical and Magnetic Materials, Amorphous solid, chemistry, phase change memory (PCM), Amorphous, Optoelectronics, lcsh:Electrical engineering. Electronics. Nuclear engineering, State (computer science), business, lcsh:TK1-9971, Reset (computing), Biotechnology
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7High Density Embedded PCM Cell in 28nm FDSOI Technology for Automotive Micro-Controller Applications
المؤلفون: Roberto Annunziata, L. Favennec, F. Disegni, D. Turgis, Jean-Luc Ogier, Remi Beneyton, Xavier Federspiel, N. Cherault, Fausto Piazza, A. Gandolfo, M. Molgg, E. Ciantar, Enrico Gomiero, P.O. Sassoulas, J. P. Reynard, B. Dumont, S. Delmedico, Alexandre Villaret, Olivier Weber, A. Viscuso, Franck Arnaud, L. Clement, L. Desvoivres, Paulo Ferreira, Paolo Mattavelli, C. Gallon, R. Ranica, O. Kermarrec, J. Jasse, S. Chouteau, C. Jahan, C. Boccaccio, Paolo Cappelletti, A. Souhaite, G. Samanni, Paola Zuliani, R. Berthelon, V. Caubet, Philippe Boivin, D. Ristoiu, Alfonso Maurelli, J. C. Grenier
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Computer science, business.industry, Reading (computer), Transistor, Bipolar junction transistor, Automotive industry, High density, law.invention, Microcontroller, Reliability (semiconductor), law, Soldering, Electronic engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cb9d7d45a06fe3730a77e9eea337f87a
https://doi.org/10.1109/iedm13553.2020.9371934 -
8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.