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1دورية أكاديمية
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المؤلفون: Rajendra Bishnoi, G. Tshagharyan, Mehdi B. Tahoori, Hayk Grigoryan, Sarath Mohanachandran Nair
المصدر: IOLTS
مصطلحات موضوعية: Magnetoresistive random-access memory, Hardware_MEMORYSTRUCTURES, Fabrication, Computer science, Spin-transfer torque, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Variation (game tree), Fault modeling, 021001 nanoscience & nanotechnology, Fault (power engineering), 020202 computer hardware & architecture, CMOS, Hardware_GENERAL, Scalability, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, 0210 nano-technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::03624e8c7b5ebe9ed7409f56943799a8
https://doi.org/10.1109/iolts.2019.8854376 -
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المؤلفون: Gabriele Boschi, Marc Reuben Hutner, J. Mekkoth, Hayk Grigoryan, D. Lazzarotti, G. Tshagharyan, Yervant Zorian, H. Shaheen, S. Bandyopadhyay, D. Luongo, G. Harutyunyan, A. Kumar S. Shoukourian
المصدر: VTS
مصطلحات موضوعية: Interconnection, Hardware_MEMORYSTRUCTURES, Computer science, business.industry, Automotive industry, System testing, Session (computer science), business, Memory array, Reliability (statistics), Dram, Reliability engineering, Test (assessment)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f1576e0e51f6e2468dbea41af9719967
https://doi.org/10.1109/vts.2019.8758675 -
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المؤلفون: Mehdi B. Tahoori, G. Harutyunyan, Rajendra Bishnoi, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Yervant Zorian, G. Tshagharyan
المصدر: ITC
مصطلحات موضوعية: 010302 applied physics, Computer science, business.industry, Automotive industry, 02 engineering and technology, 01 natural sciences, 020202 computer hardware & architecture, Reliability engineering, Semiconductor industry, Operation mode, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Production (economics), business, Reliability (statistics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::db42adf282cadf71535a9e76863a6e8e
https://doi.org/10.1109/test.2018.8624890 -
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المؤلفون: Mehdi B. Tahoori, G. Harutyunyan, Rajendra Bishnoi, G. Tshagharyan, Sarath Mohanachandran Nair, Yervant Zorian, Hayk Grigoryan
المصدر: ITC
مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Hardware_MEMORYSTRUCTURES, Fabrication, Computer science, Spin-transfer torque, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Fault (power engineering), 01 natural sciences, Field (computer science), 020202 computer hardware & architecture, CMOS, Test algorithm, 0103 physical sciences, Scalability, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::89f4e52c9978456f11e49887c61400a2
https://doi.org/10.1109/test.2018.8624725 -
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المؤلفون: Davit Hayrapetyan, G. Tshagharyan, Aleksandr Manukvan
المصدر: EWDTS
مصطلحات موضوعية: Coupling, Computer science, Verilog, Hardware design languages, 02 engineering and technology, Parallel computing, 021001 nanoscience & nanotechnology, 0210 nano-technology, Fault (power engineering), Hardware_REGISTER-TRANSFER-LEVELIMPLEMENTATION, computer, Register-transfer level, computer.programming_language
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bc893d4f3652851dfbbb8451b10227b5
https://doi.org/10.1109/ewdts.2018.8524630 -
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المؤلفون: G. Harutyunyan, Yervant Zorian, G. Tshagharyan
المصدر: ITC
مصطلحات موضوعية: 010302 applied physics, Functional safety, Computer science, business.industry, Automotive industry, Iso standards, 02 engineering and technology, 01 natural sciences, 020202 computer hardware & architecture, Reliability engineering, Automotive systems, Built-in self-test, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, business, Reliability (statistics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::51f77efce99c1258d66ba756d7f77700
https://doi.org/10.1109/test.2017.8242075 -
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المؤلفون: Samvel Shoukourian, G. Tshagharyan, G. Harutyunyan, Yervant Zorian
المصدر: EWDTS
مصطلحات موضوعية: Block code, Embedded applications, Soft error, Computer engineering, business.industry, Computer science, Embedded system, Overhead (computing), Hamming distance, Context (language use), business, Hamming code, Decoding methods
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::95b5cfbcf5a31b5f2734742f95ab4c16
https://doi.org/10.1109/ewdts.2017.8110065 -
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المؤلفون: G. Tshagharyan, G. Harutyunyan, Yervant Zorian
المصدر: IEEE Transactions on Device and Materials Reliability. 15:3-9
مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, Spatial structure, business.industry, Transistor, Spice, Embedded memory, Hardware_PERFORMANCEANDRELIABILITY, Fault modeling, Fault (power engineering), Electronic, Optical and Magnetic Materials, law.invention, law, Test algorithm, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business
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المؤلفون: G. Tshagharyan, G. Harutyunyan, Yervant Zorian, Samvel Shoukourian
المصدر: EWDTS
مصطلحات موضوعية: Structure (mathematical logic), 021110 strategic, defence & security studies, Engineering, Focus (computing), business.industry, media_common.quotation_subject, 0211 other engineering and technologies, 02 engineering and technology, Computer security, computer.software_genre, 020202 computer hardware & architecture, Test (assessment), Debugging, Threat model, 0202 electrical engineering, electronic engineering, information engineering, business, computer, Structured systems analysis and design method, PATH (variable), media_common
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5cd580f760f1a0a97c410f19a136857f
https://doi.org/10.1109/ewdts.2016.7807696