المؤلفون: A. Pasquini, M. Pisani, G.B. Picotto

المصدر: Sensors and Actuators A: Physical. :655-659

مصطلحات موضوعية: Materials science, Fabrication, business.industry, Metals and Alloys, Nanotechnology, Scanning gate microscopy, Carbon nanotube, Grating, Condensed Matter Physics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Condensed Matter::Materials Science, Scanning probe microscopy, law, Scanning ion-conductance microscopy, Optoelectronics, Electrical and Electronic Engineering, Scanning tunneling microscope, business, Instrumentation, Critical dimension

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1c1660e8431fb13f2d745dbacc58b410
https://doi.org/10.1016/j.sna.2005.02.036

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المؤلفون: G.B. Picotto, W. Pasin, A. Sacconi

المصدر: IEEE Transactions on Instrumentation and Measurement. 48:483-487

مصطلحات موضوعية: Physics, business.industry, Linear variable differential transformer, Astrophysics::Instrumentation and Methods for Astrophysics, Laser, Roundness (object), law.invention, symbols.namesake, Interferometry, Optics, law, Avogadro constant, symbols, Calibration, Measurement uncertainty, Electrical and Electronic Engineering, business, Instrumentation, Optical path length

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::69f249ce022c47dba5c218d0b2a93ac6
https://doi.org/10.1109/19.769635

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المؤلفون: R. Nerino, G.B. Picotto, A. Sosso

المصدر: IEEE Transactions on Instrumentation and Measurement. 46:640-643

مصطلحات موضوعية: Materials science, business.industry, Capacitive sensing, Acoustics, Buffer amplifier, Electrical engineering, Impedance bridging, Input impedance, Current source, Capacitance, Hardware_INTEGRATEDCIRCUITS, Output impedance, Voltage source, Electrical and Electronic Engineering, business, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2eaf4ed21faa3db2cf2eacc1832efb37
https://doi.org/10.1109/19.572051

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المؤلفون: C. Ferrero, E. Bava, S. D’Emilio (INRIM, C. Marinari, R. Kumme, U. Pogliano, M.L. RASTELLO, P. Tavella, S. Leschiutta, A. Godone, F. Cordara, M. Battuello, P.P.M. Steur, A. Merlone, F. Pavese, V. Fernicola, F. Girard, G.B. Picotto, A. Balsamo

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::460d7046cc2208345a93d4dbe25d3cc6

المؤلفون: A. Pasquini, E. Massa, M. Bisi, G.B. Picotto, M. Pisani

المصدر: Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro-and Nanometer Range

مصطلحات موضوعية: Nanometrology, Materials science, Surface metrology, Nanotechnology, Instrumentation (computer programming)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fa8928a6f547d316174311f674a02e60
https://doi.org/10.1002/3527606661.ch2

المؤلفون: G.B. Picotto, M. Pisani, A. Pasquini

المصدر: Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials ISBN: 1402030177

مصطلحات موضوعية: Fabrication, Materials science, business.industry, chemistry.chemical_element, Sharpening, Tungsten, law.invention, Electrical discharge machining, chemistry, Optical microscope, law, Meniscus, Optoelectronics, Thin film, business, Critical dimension

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d5341cc4b568308b7c84d9698db3677b
https://doi.org/10.1007/1-4020-3019-3_16

المؤلفون: G.B. Picotto, E. Massa, M. Pisani, M. Bisi, A. Pasquini, G.C. D'Agostino, D. Mari

المصدر: EuroNanoForum 2003, Trieste, 2003
info:cnr-pdr/source/autori:G.B. Picotto, E. Massa, M. Pisani, M. Bisi, A. Pasquini, G.C. D'Agostino, D. Mari/congresso_nome:EuroNanoForum 2003/congresso_luogo:Trieste/congresso_data:2003/anno:2003/pagina_da:/pagina_a:/intervallo_pagine

URL الوصول: https://explore.openaire.eu/search/publication?articleId=cnr_________::fa68a8e34a8b9caea65f259dd63861ac
http://www.cnr.it/prodotto/i/99551