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المؤلفون: François Marc, Cristell Maneux, G.G. Fischer, Marine Couret, Chhandak Mukherjee, Thomas Zimmer

المساهمون: Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, Leibniz-Institut für innovative Mikroelektronik, This work was supported by European Commission through the H2020 ECSEL Project Taranto (No. 737454) and by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) – Project No. 391631565., European Project: 737454,H2020,H2020-ECSEL-2016-1-RIA-two-stage,TARANTO(2017), Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), IHP - Leibniz-Institut für innovative Mikroelektronik

المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2020, 172, pp.107900. ⟨10.1016/j.sse.2020.107900⟩
Solid-State Electronics, 2020, 172, pp.107900. ⟨10.1016/j.sse.2020.107900⟩

مصطلحات موضوعية: safe operating area, Aging, Materials science, Oxide, 02 engineering and technology, 01 natural sciences, Safe operating area, Stress (mechanics), chemistry.chemical_compound, hot-carrier degradation, compact model, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Materials Chemistry, Electrical and Electronic Engineering, Diffusion (business), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electronic circuit, 010302 applied physics, business.industry, 020208 electrical & electronic engineering, Condensed Matter Physics, Mixed mode, Electronic, Optical and Magnetic Materials, chemistry, Optoelectronics, Degradation (geology), business, Hot carrier degradation, complementary SiGe HBTs

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ea4957388e32d75fa6a1b35242060d8
https://hal.archives-ouvertes.fr/hal-03014952/document

المؤلفون: Cristell Maneux, François Marc, Didier Celi, Klaus Aufinger, G.G. Fischer, Chhandak Mukherjee, Thomas Zimmer, Mathieu Jaoul, Marine Couret

المساهمون: Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Crolles] (ST-CROLLES)

المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2020, 163, pp.107635. ⟨10.1016/j.sse.2019.107635⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, Heterojunction bipolar transistor, Transistor, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Engineering physics, Electronic, Optical and Magnetic Materials, law.invention, Safe operating area, law, 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, Diffusion (business), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, Recombination current, Hot carrier degradation, ComputingMilieux_MISCELLANEOUS, Dynamic stress, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5089db6744eb7688e1d13db48a9e464
https://hal.archives-ouvertes.fr/hal-02475429/document

المؤلفون: Chhandak Mukherjee, G.G. Fischer, Cristell Maneux, Thomas Zimmer, Thomas Jacquet

المصدر: IEEE Transactions on Electron Devices

مصطلحات موضوعية: 010302 applied physics, Materials science, Heterojunction bipolar transistor, Interface (computing), Bipolar junction transistor, Heterojunction, 02 engineering and technology, Rate equation, 021001 nanoscience & nanotechnology, 01 natural sciences, Electronic, Optical and Magnetic Materials, Silicon-germanium, chemistry.chemical_compound, chemistry, 0103 physical sciences, Electronic engineering, Node (circuits), Electrical and Electronic Engineering, 0210 nano-technology, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cc51f364436608bf54a29966eb9c9616
https://doi.org/10.1109/ted.2017.2766457

المؤلفون: Roland Sorge, Julian Korn, J. Schmidt, G.G. Fischer

المصدر: IEEE Transactions on Nuclear Science. 64:1037-1041

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, 010308 nuclear & particles physics, business.industry, 020208 electrical & electronic engineering, Bipolar junction transistor, Heterojunction, 02 engineering and technology, 01 natural sciences, Silicon-germanium, Base (group theory), chemistry.chemical_compound, Nuclear Energy and Engineering, chemistry, Depletion region, Ionization, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Breakdown voltage, Optoelectronics, Irradiation, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d711f4c0268e666ca0acbe85bd1b0e9b
https://doi.org/10.1109/tns.2017.2682927

المؤلفون: Thomas Zimmer, Sebastien Fregonese, Cristell Maneux, G.G. Fischer, Marine Couret

المساهمون: Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), IHP - Leibniz-Institut für innovative Mikroelektronik, The research leading to these results has received funding from the European Union's Horizon 2020 research and innovation programme under grant agreement no. 737454, project 'TARANTO'., European Project: 737454,H2020,H2020-ECSEL-2016-1-RIA-two-stage,TARANTO(2017), Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), IHP - Leibniz-Insitut for innovative Mikroelektronik

المصدر: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)
2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS), Mar 2019, Kita-Kyushu City, Japan. pp.154-159

مصطلحات موضوعية: Materials science, safe-operating-area, Thermal resistance, 02 engineering and technology, SiGe HBTs, 01 natural sciences, Signal, Safe operating area, multi-finger, Thermal conductivity, Reliability (semiconductor), 0103 physical sciences, Diffusion (business), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 010302 applied physics, business.industry, Bipolar junction transistor, self-heating, Heterojunction, 021001 nanoscience & nanotechnology, thermal impedance modeling, S-parameters measurements, Optoelectronics, pulse measurement, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::026dd5ce66d75f5676dbcbe2204b6cc2
https://hal.science/hal-02276656

المؤلفون: Peter Schley, Bernd Heinemann, J. Borngraber, K. Schulz, Yuji Yamamoto, Juergen Drews, Bernd Tillack, R. Barth, Falk Korndörfer, Daniel Schmidt, A. Fox, Dieter Knoll, Thomas Grabolla, Wolfgang Winkler, Dirk Wolansky, G.G. Fischer, Andreas Mai, Ulrich Haak, Markus Andreas Schubert, Steffen Marschmeyer, Holger Rucker, J. Schmidt

المصدر: IEEE Journal of Solid-State Circuits. 45:1678-1686

مصطلحات موضوعية: Materials science, business.industry, Amplifier, Electrical engineering, Ring oscillator, Low-noise amplifier, Silicon-germanium, chemistry.chemical_compound, CMOS, chemistry, Gate oxide, Logic gate, Optoelectronics, Electrical and Electronic Engineering, business, AND gate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6bd8a4931d12ff4a54aba74b9fdbea53
https://doi.org/10.1109/jssc.2010.2051475

المؤلفون: Jonathan A. Pellish, Gyorgy Vizkelethy, Robert A. Reed, Bernd Heinemann, Paul W. Marshall, A. Appaswamy, Akil K. Sutton, Dieter Knoll, John D. Cressler, G.G. Fischer, S.D. Phillips, Bernd Tillack, Hans Gustat, R.M. Diestelhorst

المصدر: IEEE Transactions on Nuclear Science. 56:3402-3407

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, business.industry, Heterojunction bipolar transistor, Transistor, Doping, law.invention, Silicon-germanium, chemistry.chemical_compound, Nuclear Energy and Engineering, chemistry, law, Optoelectronics, Wafer, Isolation (database systems), Electrical and Electronic Engineering, business, Radiation hardening, Common emitter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ef15e0bce5af5b19415d0e38d064f9d2
https://doi.org/10.1109/tns.2009.2030801

المؤلفون: Ronald D. Schrimpf, Bernd Tillack, G.G. Fischer, Bernd Heinemann, Hans Gustat, R.M. Diestelhorst, Dieter Knoll, Paul W. Marshall, John D. Cressler, S. Finn, Peng Cheng, Daniel M. Fleetwood, Bongim Jun, Akil K. Sutton

المصدر: IEEE Transactions on Nuclear Science. 54:2190-2195

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Proton, Current-feedback operational amplifier, business.industry, Heterojunction bipolar transistor, Transistor, X-ray, law.invention, Silicon-germanium, chemistry.chemical_compound, Nuclear Energy and Engineering, chemistry, law, Optoelectronics, Irradiation, Electrical and Electronic Engineering, business, Current density

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cfb300c136e249dd65cc6bd8b5f7fe32
https://doi.org/10.1109/tns.2007.907869

المؤلفون: D. Knoll, D. Krüger, K.E. Ehwald, D. Wolansky, E. Naumann, B. Heinemann, D. Bolze, T. Morgenstern, Bernd Tillack, Peter Schley, G.G. Fischer

المصدر: Journal of Electronic Materials. 27:1022-1026

مصطلحات موضوعية: Materials science, Silicon, business.industry, Diffusion, Bipolar junction transistor, chemistry.chemical_element, Heterojunction, Condensed Matter Physics, Epitaxy, Electronic, Optical and Magnetic Materials, chemistry, Materials Chemistry, Optoelectronics, Limiting oxygen concentration, Electrical and Electronic Engineering, business, Boron, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9b1bec33ec7f141c6781b2e4abbef45e
https://doi.org/10.1007/s11664-998-0156-6