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المؤلفون: Niklas Dellby, Luca Piazza, M.V. Hoffman, Sacha De Carlo, Radosav S. Pantelic, Andreas Mittelberger, Ondrej L. Krivanek, Tracy C. Lovejoy, Christoph Hoermann, Benjamin Plotkin-Swing, G.J. Corbin, C.E. Meyer
المصدر: Ultramicroscopy. 217
مصطلحات موضوعية: 010302 applied physics, Point spread function, Materials science, Pixel, business.industry, Electron energy loss spectroscopy, Detector, 02 engineering and technology, Electron, 021001 nanoscience & nanotechnology, 01 natural sciences, Noise (electronics), Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Detective quantum efficiency, Optics, 0103 physical sciences, 0210 nano-technology, business, Instrumentation, Dark current
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المؤلفون: Ondrej L. Krivanek, Andrew Bleloch, Jordan A. Hachtel, Benjamin Plotkin-Swing, G.J. Corbin, M.V. Hoffman, C.E. Meyer, Juan C. Idrobo, N.J. Bacon, M.T. Hotz, Niklas Dellby, Tracy C. Lovejoy
المصدر: Ultramicroscopy. 203
مصطلحات موضوعية: 010302 applied physics, Materials science, Spectrometer, business.industry, Electron energy loss spectroscopy, Resolution (electron density), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, law, 0103 physical sciences, Scanning transmission electron microscopy, Optoelectronics, Electron microscope, 0210 nano-technology, business, Spectroscopy, Instrumentation, Image resolution, Monochromator
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المؤلفون: Benjamin Plotkin-Swing, G.J. Corbin, Z.S. Szilagyi, M.V. Hoffman, C.E. Meyer, Andreas Mittelberger, Tracy C. Lovejoy, P. Hrncirik, Ondrej L. Krivanek, Niklas Dellby, N. Johnson, Andrew Bleloch, N.J. Bacon, G.S. Skone, M.T. Hotz
المصدر: Microscopy and Microanalysis. 25:512-513
مصطلحات موضوعية: Software, Materials science, business.industry, Detector, Electronic engineering, business, Instrumentation
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المؤلفون: Stephen J. Pennycook, Timothy J. Pennycook, Niklas Dellby, Christopher S. Own, M.F. Murfitt, Matthew F. Chisholm, Z.S. Szilagyi, Sokrates T. Pantelides, Ondrej L. Krivanek, Valeria Nicolosi, Mark P. Oxley, G.J. Corbin
المصدر: Nature
مصطلحات موضوعية: Boron Compounds, Physics, Multidisciplinary, chemistry.chemical_element, Molecular physics, Dark field microscopy, Chemistry Techniques, Analytical, Microscopy, Electron, chemistry.chemical_compound, chemistry, Transmission electron microscopy, Boron nitride, Quantum mechanics, Monolayer, Atom, Scanning transmission electron microscopy, Density functional theory, Boron, Engineering sciences. Technology
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المؤلفون: Niklas Dellby, Christopher S. Own, M.F. Murfitt, N.J. Bacon, G.J. Corbin, Z.S. Szilagyi, Ondrej L. Krivanek, Petr Hrncirik, Jonathan P. Ursin
المصدر: Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. 367:3683-3697
مصطلحات موضوعية: Conventional transmission electron microscope, Materials science, Electron spectrometer, Physics::Instrumentation and Detectors, business.industry, General Mathematics, Electron energy loss spectroscopy, General Engineering, Scanning confocal electron microscopy, General Physics and Astronomy, law.invention, Optics, law, Scanning transmission electron microscopy, Physics::Accelerator Physics, Energy filtered transmission electron microscopy, Electron beam-induced deposition, Nuclear Experiment, business, Monochromator
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2d166dc25a1235928aa03cf1c2ed9e55
https://doi.org/10.1098/rsta.2009.0087 -
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المؤلفون: Niklas Dellby, M.T. Hotz, Ondrej L. Krivanek, Jannik C. Meyer, G.J. Corbin, C. Mangier
المصدر: Microscopy and Microanalysis. 22:34-35
مصطلحات موضوعية: In situ, Materials science, business.industry, 0103 physical sciences, Ultra-high vacuum, Optoelectronics, 02 engineering and technology, 021001 nanoscience & nanotechnology, 010306 general physics, 0210 nano-technology, business, 01 natural sciences, Instrumentation
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المؤلفون: Ondrej L. Krivanek, G.J. Corbin, A. Kaeppel, P. Hrncirik, Nabil Bassim, Tracy C. Lovejoy, Meiken Falke, Niklas Dellby, W. Hahn, M Rohde, Rhonda M. Stroud
المصدر: Microscopy and Microanalysis. 21:339-340
مصطلحات موضوعية: Materials science, Analytical chemistry, Sensitivity (control systems), Instrumentation
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المؤلفون: Niklas Dellby, Rhonda M. Stroud, Tracy C. Lovejoy, Ondrej L. Krivanek, G.J. Corbin, M Rohde, Nabil Bassim, Meiken Falke, P. Hrncirik, A. Kaeppel
المصدر: Microscopy and Microanalysis. 21:1427-1428
مصطلحات موضوعية: Chemistry, Heteroatom, Energy-dispersive X-ray spectroscopy, Atom (order theory), Atomic physics, Instrumentation
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المؤلفون: Meiken Falke, Rhonda M. Stroud, Ondrej L. Krivanek, Niklas Dellby, G.J. Corbin, Tracy C. Lovejoy, M Rohde, W. Hahn, A. Kaeppel, Nabil Bassim, P. Hrncirik, M. Noack
المصدر: Applied Physics Letters. 108:163101
مصطلحات موضوعية: X-ray spectroscopy, Physics and Astronomy (miscellaneous), Chemistry, Electron energy loss spectroscopy, Heteroatom, Analytical chemistry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Dwell time, 0103 physical sciences, Scanning transmission electron microscopy, 010306 general physics, 0210 nano-technology, Spectroscopy, Nanoscopic scale, Energy (signal processing)
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المؤلفون: G.J. Corbin, M. F. Chisholm, Z.S. Szilagyi, Ondrej L. Krivanek, Z. Dellby, Niklas Dellby, Tracy C. Lovejoy
المصدر: Microscopy and Microanalysis. 20:928-929
مصطلحات موضوعية: Physics, Quadrupole, Atomic physics, High order, Instrumentation