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1
المؤلفون: G.M. Swift, S. Rezgui, A. Lesea
المصدر: IEEE Transactions on Nuclear Science. 53:2076-2083
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Error mitigation, Hardware_PERFORMANCEANDRELIABILITY, Fault injection, Upset, Nuclear Energy and Engineering, Error analysis, Electronic engineering, Redundancy (engineering), Static random-access memory, Hardware_ARITHMETICANDLOGICSTRUCTURES, Electrical and Electronic Engineering, Field-programmable gate array
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2
المؤلفون: S. Rezgui, K. Somervill, G.M. Swift, J. George, Gregory R. Allen, C. Carmichael
المصدر: IEEE Transactions on Nuclear Science. 52:2468-2474
مصطلحات موضوعية: Triple modular redundancy, Nuclear and High Energy Physics, Engineering, Spacecraft, business.industry, Measure (physics), Hardware_PERFORMANCEANDRELIABILITY, Upset, Programmable logic array, Computer Science::Hardware Architecture, Radiation testing, Nuclear Energy and Engineering, Embedded system, Static random-access memory, Electrical and Electronic Engineering, Field-programmable gate array, business
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3
المؤلفون: T. F. Wrobel, J. George, C. Carmichael, J. Moore, M. Napier, R. Koga, G.M. Swift, S. Rezgui, J. Maksymowicz, A. Lesea
المصدر: IEEE Transactions on Nuclear Science. 51:3469-3474
مصطلحات موضوعية: Input/output, Nuclear and High Energy Physics, Engineering, Virtex, business.industry, Macrocell array, Hardware_PERFORMANCEANDRELIABILITY, Fault injection, Upset, Programmable logic array, Nuclear Energy and Engineering, Redundancy (engineering), Electronic engineering, Hardware_ARITHMETICANDLOGICSTRUCTURES, Electrical and Electronic Engineering, business, Field-programmable gate array, Computer hardware, Hardware_LOGICDESIGN
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4
المؤلفون: J. George, M. Napier, Larry Edmonds, T. Langley, C. Carmichael, G.M. Swift, C. Yui, P. Murray, R. Koga, K. Lanes
المصدر: IEEE Transactions on Nuclear Science. 51:2825-2833
مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, Virtex, Proton, Scattering, Computational physics, Ion, Nuclear Energy and Engineering, Single event upset, Electronic engineering, Electrical and Electronic Engineering, Interrupt, Field-programmable gate array, Event (particle physics)
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5
المؤلفون: G.L. Yoder, Allan H. Johnston, G.M. Swift, Farokh Irom, F.H. Farmanesh
المصدر: IEEE Transactions on Nuclear Science. 50:2107-2112
مصطلحات موضوعية: Nuclear and High Energy Physics, Hardware_MEMORYSTRUCTURES, Computer science, business.industry, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Upset, law.invention, Microprocessor, Nuclear Energy and Engineering, law, Single event upset, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Hardware_ARITHMETICANDLOGICSTRUCTURES, Electrical and Electronic Engineering, IBM, business, Hardware_LOGICDESIGN, Voltage
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6
المؤلفون: Leif Scheick, G.M. Swift
المصدر: IEEE Transactions on Nuclear Science. 49:2810-2817
مصطلحات موضوعية: Nuclear and High Energy Physics, Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Transistor, law.invention, Ionizing radiation, Nuclear Energy and Engineering, MicroDose, law, Absorbed dose, MOSFET, Electronic engineering, Dosimetry, Optoelectronics, Static random-access memory, Electrical and Electronic Engineering, business
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7
المؤلفون: G.M. Swift, J.M. Ratliff, A.R. Frederickson
المصدر: IEEE Transactions on Nuclear Science. 49:2759-2764
مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, Spacecraft, business.industry, Annealing (metallurgy), Electrical engineering, JFET, Gyroscope, Radiation, law.invention, symbols.namesake, Nuclear Energy and Engineering, law, Control theory, Van Allen radiation belt, symbols, Electrical and Electronic Engineering, business, Leakage (electronics), Voltage
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8
المؤلفون: Farokh Irom, Allan H. Johnston, F.F. Farmanesh, G.M. Swift, D.G. Millward
المصدر: IEEE Transactions on Nuclear Science. 49:3148-3155
مصطلحات موضوعية: Nuclear and High Energy Physics, Engineering, business.industry, PowerPC, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Upset, Nuclear Energy and Engineering, Single event upset, Hardware_INTEGRATEDCIRCUITS, Electrical and Electronic Engineering, business, Order of magnitude, Voltage
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9
المؤلفون: L.D. Edmonds, Leif Scheick, D.N. Nguyen, G.M. Swift, Steven M. Guertin
المصدر: IEEE Transactions on Nuclear Science. 48:1925-1930
مصطلحات موضوعية: Radiation exposure, Nuclear and High Energy Physics, Engineering, Cross section (physics), Nuclear Energy and Engineering, business.industry, Electronic engineering, Electrical and Electronic Engineering, business, CAS latency, Ion, Linear trend
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10
المؤلفون: D.G. Millward, F.F. Fannanesh, Farokh Irom, Steven M. Guertin, G.M. Swift
المصدر: IEEE Transactions on Nuclear Science. 48:1822-1827
مصطلحات موضوعية: Nuclear and High Energy Physics, Engineering, ComputerSystemsOrganization_COMPUTERSYSTEMIMPLEMENTATION, business.industry, Nuclear engineering, Hardware_PERFORMANCEANDRELIABILITY, Upset, law.invention, Microprocessor, Nuclear Energy and Engineering, law, Single event upset, Computer data storage, Electronic engineering, Heavy ion, Electrical and Electronic Engineering, IBM, business