يعرض 1 - 5 نتائج من 5 نتيجة بحث عن '"Gaben, Loic"', وقت الاستعلام: 0.87s تنقيح النتائج
  1. 1
    مؤتمر
    Optimization of Trigate-On-Insulator MOSFET aspect ratio with MASTAR

    المؤلفون: Hiblot, Gaspard, Rafhay, Quentin, Gaben, Loic, Ghibaudo, Gerard, Boeuf, Frederic

    المصدر: 2015 45th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2015 45th European. :242-245 Sep, 2015

    Relation: ESSDERC 2015 - 45th European Solid-State Device Research Conference

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  2. 2
    مؤتمر
    Stacked Nanowires FETs: Mechanical robustness evaluation for sub-7nm nodes

    المؤلفون: Gaben, Loic, Arnaud, Arthur, Barlas, Marios, Samson, M. P., Arvet, C., Vizioz, C., Hartmann, J.-M., Barraud, S., Monfray, S., Boeuf, F., Skotnicki, T., Balestra, F., Vinet, M.

    المصدر: 2016 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2016 IEEE. :136-137 Jun, 2016

    Relation: 2016 IEEE Silicon Nanoelectronics Workshop (SNW)

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  3. 3
    Fabrication and Characterization of Gate-All-Around Stacked-Nanowire/Nanosheet MOS transistors realized by a Gate-Last approach for sub-7 nm technology nodes

    المؤلفون: Gaben, Loic

    المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Université Grenoble Alpes, Francis Balestra, Thomas Skotnicki, STAR, ABES

    المصدر: Micro and nanotechnologies/Microelectronics. Université Grenoble Alpes, 2017. English. ⟨NNT : 2017GREAT095⟩

    مصطلحات موضوعية: Gate last, Nanowire, Multi-Grilles, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 7 nm, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Nanofil, Multi-Gates, Snwfet, Nanosheet

    وصف الملف: application/pdf

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::514e8a9b8461c825cd57a440c6896e2e
    https://tel.archives-ouvertes.fr/tel-01780190/document

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  4. 4
    Fabrication et caractérisation de transistors MOS à base de nanofils de silicium empilés et à grille enrobante réalisés par approche Gate-Last pour les noeuds technologiques sub-7 nm

    المؤلفون: Gaben, Loic

    المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Université Grenoble Alpes, Francis Balestra, Thomas Skotnicki

    المصدر: Micro and nanotechnologies/Microelectronics. Université Grenoble Alpes, 2017. English. ⟨NNT : 2017GREAT095⟩

    مصطلحات موضوعية: Gate last, Nanowire, Multi-Grilles, 7 nm, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Nanofil, Multi-Gates, Snwfet, Nanosheet

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______2592::514e8a9b8461c825cd57a440c6896e2e
    https://tel.archives-ouvertes.fr/tel-01780190/document

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  5. 5
    دورية
    (Invited) Evaluation of Stacked Nanowires Transistors for CMOS: Performance and Technology Opportunities

    المؤلفون: Gaben, Loic, Barraud, Sylvain, Samson, Pierre, Jaud, Anne, Martinie, Sebastien, Rozeau, Olivier, Lacord, Joris, Arvet, Christian, Vizioz, Christian, Bustos, Jessy, Dallery, Alexandre, Pauliac, Sebastien, Balan, Viorel, Euvrard, Catherine, Perrot, Cedric, Loup, Virginie, Besson, Pascal, Hartmann, Michel, Monfray, Stephane, Boeuf, Frederic, Skotnicki, Thomas, Balestra, Francis, Vinet, Maud

    المصدر: ECS Transactions; May 2016, Vol. 72 Issue: 4 p43-54, 12p

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