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1مؤتمر
المؤلفون: Barthod, C., Passard, M., Galez, C., Bouillot, J., Farzaneh, M., Volat, C., Teisseyre, Y.
المصدر: CCECE 2003 - Canadian Conference on Electrical and Computer Engineering. Toward a Caring and Humane Technology (Cat. No.03CH37436) Electrical and computer engineering Electrical and Computer Engineering, 2003. IEEE CCECE 2003. Canadian Conference on. 1:635-638 vol.1 2003
Relation: CCECE 2003 - Canadian Conference on Electrical and Computer Engineering. Toward a Caring and Humane Technology
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2مؤتمر
المؤلفون: Passard, M., Barthod, C., Fortin, M., Galez, C., Bouillot, J.
المصدر: Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE. 2:840-845 vol.2 2000
Relation: 17th IEEE Instrumentation and Measurement Technology Conference
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3دورية أكاديمية
المؤلفون: Passard, M., Barthod, C., Fortin, M., Galez, C., Bouillot, J.
المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 50(5):1053-1058 Oct, 2001
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4دورية أكاديمية
المؤلفون: Multian, V.V., Riporto, J., Urbain, M., Mugnier, Y., Djanta, G., Beauquis, S., Galez, C., Gayvoronsky, V. Ya, Le Dantec, R.
المصدر: In Optical Materials October 2018 84:579-585
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5مؤتمر
المؤلفون: Barthod, C., Passard, M., Fortin, M., Galez, C., Bouillot, J.
المصدر: Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031) Precision electromagnetic measurements Precision Electromagnetic Measurements Digest, 2000 Conference on. :423-424 2000
Relation: Proceedings of CPEM 2000
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6دورية أكاديمية
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7دورية أكاديمية
المؤلفون: Extermann, J., Béjot, P., Bonacina, L., Mugnier, Y., Le Dantec, R., Mazingue, T., Galez, C., Wolf, J.-P.
المصدر: Applied Physics B: Lasers and Optics. November 2009 97(3):537-540
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8دورية أكاديمية
المؤلفون: Bonacina, L., Mugnier, Y., Courvoisier, F., Le Dantec, R., Extermann, J., Lambert, Y., Boutou, V., Galez, C., Wolf, J.-P.
المصدر: Applied Physics B: Lasers and Optics. May 2007 87(3):399-403
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9دورية أكاديمية
المؤلفون: Galez, C., Mugnier, Y., Bouillot, J., Lambert, Y., Le Dantec, R.
المصدر: In Journal of Alloys and Compounds 2006 416(1):261-264
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10
المؤلفون: Urbain, M., Riporto, F., Bredillet, K., Dantec, R.Le, Beauquis, S., Monnier, V., Chevolot, Y., Galez, C., Mugnier, Yannick
المساهمون: Mugnier, Yannick, Laboratoire SYstèmes et Matériaux pour la MEcatronique (SYMME), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])
المصدر: EMRS 2019 Fall Meeting
EMRS 2019 Fall Meeting, Sep 2019, Warsaw, Polandمصطلحات موضوعية: [CHIM.MATE] Chemical Sciences/Material chemistry, [CHIM.MATE]Chemical Sciences/Material chemistry, ComputingMilieux_MISCELLANEOUS
URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::56dc9a2ce3b7a11229e0ce9f6c9bdc68
https://hal.archives-ouvertes.fr/hal-02350997
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