المؤلفون: Li, S., Farha, Y.A., Liu, Y., Cheng, M., Gall, J.

المصدر: IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 45(6):6647-6658 Jun, 2023

المؤلفون: Patnala, A., Stadtler, S., Schultz, M.G., Gall, J.

المصدر: IEEE Geoscience and Remote Sensing Letters IEEE Geosci. Remote Sensing Lett. Geoscience and Remote Sensing Letters, IEEE. 20:1-5 2023

المؤلفون: Shams Eddin, M.H., Roscher, R., Gall, J.

المصدر: IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 61:1-18 2023

المؤلفون: Souri, Y., Fayyaz, M., Minciullo, L., Francesca, G., Gall, J.

المصدر: IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 44(10):6196-6208 Oct, 2022

المؤلفون: ^{Aff48, Aff49, Aff50}, Ahdida, C., Akmete, A., Albanese, R.^{Aff15, Aff47, Aff48}, Alexandrov, A.^{Aff15, Aff47}, Alicante, F.^{Aff15, Aff47}, Alt, J., Aoki, S., Arduini, G., Back, J. J., Dos Santos, F. Baaltasar, Bardou, F., Barker, G. J., Battistin, M., Bauche, J., Bay, A., Bayliss, V., Betancourt, C., Bezshyiko, I., Bezshyyko, O., Bick, D., Bieschke, S., Blanco, A., Boehm, J., Bogomilov, M., Boiarska, I., Bondarenko, K., Bonivento, W. M., Borburgh, J., Boyarsky, A.^{Aff27, Aff43}, Brenner, R., Breton, D., Brignoli, A., Büscher, V., Buonaura, A., Buontempo, S., Cadeddu, S., Calviani, M., Campanelli, M., Casolino, M., Centanni, D.^{Aff15, Aff49}, Charitonidis, N., Chau, P., Chauveau, J., Choi, K.-Y., Chumakov, A., Cicero, V., Climescu, M., Conaboy, A., Congedo, L.^{Aff12, Aff44}, Cornelis, K., Cristinziani, M., Crupano, A., Dallavalle, G. M., Datwyler, A., D’Ambrosio, N., D’Appollonio, G.^{Aff14, Aff46}, de Asmundis, R., De Carvalho Saraiva, J., De Lellis, G.^{Aff15, Aff32, Aff47}, de Magistris, M.^{Aff15, Aff50}, De Roeck, A., De Serio, M.^{Aff12, Aff44}, De Simone, D., Di Crescenzo, A.^{Aff15, Aff32, Aff47, IDs10052024126553_cor65}, Di Giulio, L., Dib, C., Dijkstra, H., Dougherty, L. A., Drohan, V., Dubreuil, A., Durhan, O., Ehlert, M., Elikkaya, E., Fabbri, F., Fedotovs, F., Ferrillo, M., Ferro-Luzzi, M., Fini, R. A., Fischer, H., Fonte, P., Franco, C., Fraser, M., Fresa, R.^{Aff15, Aff48, Aff49}, Froeschl, R., Fukuda, T., Galati, G.^{Aff12, Aff44}, Gall, J., Gatignon, L., Gentile, V.^{Aff15, Aff47}, Goddard, B., Golinka-Bezshyyko, L., Golutvin, A., Gorbounov, P., Gorkavenko, V., Grandchamp, A. L., Graverini, E., Grenard, J.-L., Grenier, D., Guler, A. M., Haefeli, G. J., Hagner, C., Hakobyan, H.^{Aff1, Aff2}, Harris, I. W., van Herwijnen, E., Hessler, C., Hollnagel, A., Hosseini, B., Iaselli, G.^{Aff12, Aff44}, Iuliano, A.^{Aff1, Aff15, Aff47, IDs10052024126553_cor110}, Jacobsson, R., Joković, D., Jonker, M., Kadenko, I., Kain, V., Kaiser, B., Kamiscioglu, C., Kershaw, K., Khoriauli, G., Kim, Y. G., Kitagawa, N., Ko, J.-W., Kodama, K., Kolev, D. I., Komatsu, M., Kono, A., Kormannshaus, S., Korol, I., Korzenev, A., Kostyukhin, V., Platia, E. Koukovini, Kovalenko, S., Lacker, H. M., Lamont, M., Lantwin, O., Lauria, A.^{Aff15, Aff47}, Lee, K. S., Lee, K. Y., Leonardo, N., Lévy, J.-M., Loschiavo, V. P.^{Aff15, Aff48}, Lopes, L., Sola, E. Lopez, Lyons, F., Lyubovitskij, V., Maalmi, J., Magnan, A.-M., Manabe, Y., Manfredi, M., Marsh, S., Marshall, A. M., Mermod, P., Miano, A.^{Aff15, Aff47}, Mikado, S., Mikulenko, A., Milstead, D. A., Montanari, A., Montesi, M. C.^{Aff15, Aff47}, Morishima, K., Muttoni, Y., Naganawa, N., Nakamura, M., Nakano, T., Ninin, P., Nishio, A., Ogawa, S., Osborne, J., Ovchynnikov, M.^{Aff27, Aff43}, Owtscharenko, N., Owen, P. H., Pacholek, P., Park, B. D., Pastore, A., Patel, M., Perillo-Marcone, A., Petkov, G. L., Petridis, K., Prieto, J. Prieto, Prota, A.^{Aff15, Aff47}, Quercia, A.^{Aff15, Aff47}, Rademakers, A., Rakai, A., Rawlings, T., Redi, F., Reghunath, A., Ricciardi, S., Rinaldesi, M., Rodin, Volodymyr, Rodin, Viktor, Robbe, P., Cavalcante, A. B. Rodrigues, Rokujo, H., Rovelli, T.^{Aff13, Aff45}, Ruchayskiy, O., Ruf, T., Galan, F. Sanchez, Diaz, P. Santos, Ull, A. Sanz, Sato, O., Schliwinski, J. S., Schmidt-Parzefall, W., Schumann, M., Serra, N., Sgobba, S., Shadura, O., Shaposhnikov, M., Shchutska, L., Shibuya, H., Shihora, L., Shirobokov, S., Silverstein, S. B., Simone, S.^{Aff12, Aff44}, Simoniello, R., Soares, G., Sohn, J. Y., Sokolenko, A., Solodko, E., Stoel, L., Stramaglia, M. E., Sukhonos, D., Suzuki, Y., Takahashi, S., Tastet, J. L., Timiryasov, I., Tioukov, V., Tommasini, D., Torii, M., Tosi, N., Treille, D., Tsenov, R., Vankova-Kirilova, G., Vannucci, F., Venkova, P., Venturi, V., Vilchinski, S., Vincke, Heinz, Vincke, Helmut, Visone, C.^{Aff15, Aff47}, van Waasen, S., Wanke, R., Wertelaers, P., Williams, O., Woo, J.-K., Wurm, M., Xella, S., Yilmaz, D., Yilmazer, A. U., Yoon, C. S., Zimmerman, J.

المصدر: The European Physical Journal C: Particles and Fields. 84(6)

المؤلفون: Li, S., Chen, X., Liu, Y., Dai, D., Stachniss, C., Gall, J.

المصدر: IEEE Robotics and Automation Letters IEEE Robot. Autom. Lett. Robotics and Automation Letters, IEEE. 7(2):738-745 Apr, 2022

المؤلفون: Chen, X., Li, S., Mersch, B., Wiesmann, L., Gall, J., Behley, J., Stachniss, C.

المصدر: IEEE Robotics and Automation Letters IEEE Robot. Autom. Lett. Robotics and Automation Letters, IEEE. 6(4):6529-6536 Oct, 2021

المؤلفون: Li, S., Yi, J., Farha, Y.A., Gall, J.

المصدر: IEEE Robotics and Automation Letters IEEE Robot. Autom. Lett. Robotics and Automation Letters, IEEE. 6(2):1028-1035 Apr, 2021

المؤلفون: Kuehne, H., Richard, A., Gall, J.

المصدر: IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 42(4):765-779 Apr, 2020

المؤلفون: Panareda Busto, P., Iqbal, A., Gall, J.

المصدر: IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 42(2):413-429 Feb, 2020