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1دورية أكاديمية
المؤلفون: Jun Hui Park, Jung Nam Kim, Seonhaeng Lee, Gang-Jun Kim, Namhyun Lee, Rock-Hyun Baek, Dae Hwan Kim, Changhyun Kim, Myounggon Kang, Yoon Kim
المصدر: IEEE Access, Vol 12, Pp 23881-23886 (2024)
مصطلحات موضوعية: BSIM-CMG, deep learning, genetic algorithm, I-V modeling, compact modeling, BCAT, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2
المؤلفون: Sungju Choi, Ga Won Yang, Sangwon Lee, Jingyu Park, Changwook Kim, Jun Park, Hyun-Seok Choi, Namhyun Lee, Gang-Jun Kim, Yoon Kim, Myounggon Kang, Changhyun Kim, Jong-Ho Bae, Dae Hwan Kim
المصدر: IEEE Transactions on Electron Devices. 70:48-52
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3
المؤلفون: Hyun-Seok Choi, Chang Hyun Kim, Gang-Jun Kim, Dae Hwan Kim, Jun Park, Yoon Kim, Nam-Hyun Lee, Myounggon Kang
المصدر: IEEE Electron Device Letters. 42:653-656
مصطلحات موضوعية: 010302 applied physics, Dynamic random-access memory, Materials science, business.industry, Transistor, Substrate (electronics), 01 natural sciences, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, Impact ionization, Reliability (semiconductor), law, Logic gate, 0103 physical sciences, Optoelectronics, Electrical and Electronic Engineering, business, Dram
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4
المؤلفون: Moonjee Yoon, Nam-Hyun Lee, Myeongkyu Eo, Taehun You, SungHwan Kim, Shinhyung Kim, Sangwoo Pae, Gang-Jun Kim, Kijin Kim
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Materials science, Negative-bias temperature instability, Annealing (metallurgy), business.industry, 020208 electrical & electronic engineering, Transistor, Gate dielectric, NAND gate, 02 engineering and technology, 01 natural sciences, law.invention, Stress (mechanics), law, 0103 physical sciences, MOSFET, 0202 electrical engineering, electronic engineering, information engineering, Degradation (geology), Optoelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fc059fe5be40f115401fda73dd57ce1d
https://doi.org/10.1109/irps46558.2021.9405108 -
5
المؤلفون: Nam-Hyun Lee, Jongkyun Kim, Jung Eun Seok, Gang-Jun Kim, Yunsung Lee
المصدر: Microelectronics Reliability. :179-182
مصطلحات موضوعية: Materials science, 02 engineering and technology, Dielectric, 01 natural sciences, law.invention, Stress (mechanics), Reliability (semiconductor), law, 0103 physical sciences, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Quantum tunnelling, 010302 applied physics, business.industry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Constant factor, Capacitor, Optoelectronics, 0210 nano-technology, business, Dram, Voltage
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6
المؤلفون: Young-Yun Lee, Jongkyun Kim, Yunsung Lee, Gang-Jun Kim, Nam-Hyun Lee, Jung-Eun Seok
المصدر: Microelectronics Reliability. :183-185
مصطلحات موضوعية: Materials science, Circuit design, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, law.invention, Stress (mechanics), law, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Voltage source, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Electronic circuit, 010302 applied physics, business.industry, 020208 electrical & electronic engineering, Transistor, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Degradation (geology), Optoelectronics, business, Dram, Voltage
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7
المؤلفون: Donghee Son, Nam-Hyun Lee, Ji-Hoon Seo, Bongkoo Kang, YongHa Kang, Gang-Jun Kim
المصدر: Microelectronics Reliability. 64:194-198
مصطلحات موضوعية: Chemical substance, Materials science, Oxide, 02 engineering and technology, Electron, Edge (geometry), 01 natural sciences, Molecular physics, Stress (mechanics), chemistry.chemical_compound, 0103 physical sciences, MOSFET, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, 010302 applied physics, business.industry, 020208 electrical & electronic engineering, Electrical engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, Degradation (geology), business, Communication channel
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8
المؤلفون: YongHa Kang, Gang-Jun Kim, Bongkoo Kang, Nam-Hyun Lee, Donghee Son, Ji-Hoon Seo
المصدر: Microelectronics Reliability. 59:13-17
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Electrical engineering, Electron trapping, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Gate voltage, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Shallow trench isolation, 0103 physical sciences, MOSFET, Optoelectronics, Degradation (geology), Electrical and Electronic Engineering, 0210 nano-technology, Safety, Risk, Reliability and Quality, business, Drain current, Hot electron
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المؤلفون: Donghee Son, Hyeokjin Kim, Seonhaeng Lee, Cheolgyu Kim, Ji-Hoon Seo, Bongkoo Kang, Gang-Jun Kim
المصدر: Microelectronics Reliability. 53:1351-1354
مصطلحات موضوعية: Materials science, Negative-bias temperature instability, business.industry, Transistor, Analytical chemistry, Dielectric, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, Stress (mechanics), law, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Metal gate, High-κ dielectric, Voltage
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10
المؤلفون: Jeongsoo Park, Chiho Lee, Cheolgyu Kim, Dongwoo Kim, Nam-Hyun Lee, Seonhaeng Lee, Gang-Jun Kim, Bongkoo Kang
المصدر: Microelectronics Reliability. 52:1905-1908
مصطلحات موضوعية: Materials science, Scattering, business.industry, Transistor, Oxide, Electron, Substrate (electronics), Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), chemistry.chemical_compound, chemistry, law, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Nanoscopic scale, Electron scattering