المؤلفون: Danouchi, K., Soumah, L., Bouchard, C., Disdier, F., Fassatoui, A., Phan, N.-T., Ezzadeen, M., Delaet, B., Viala, B., Prenat, G., Anghel, L., Talatchian, P., Prejbeanu, I. -L., Andrieu, F., Garello, K., Hutin, L.

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Shao, Q., Li, P., Liu, L., Yang, H., Fukami, S., Razavi, A., Wu, H., Wang, K., Freimuth, F., Mokrousov, Y., Stiles, M.D., Emori, S., Hoffmann, A., Akerman, J., Roy, K., Wang, J., Yang, S., Garello, K., Zhang, W.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 57(7):1-39 Jul, 2021

المؤلفون: Nair, S.M., Mayahinia, M., Tahoori, M.B., Perumkunnil, M., Zahedmanesh, H., Croes, K., Garello, K., Marinelli, T., Evenblij, T., Kar, G.S., Catthoor, F.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 21(2):258-266 Jun, 2021

المؤلفون: Raymenants, E., Wan, D., Couet, S., Souriau, L., Thiam, A., Tsvetanova, D., Canvel, Y., Garello, K., Kar, G.S., Heyns, M., Asselberghs, I., Nikonov, D.E., Young, I.A., Pizzini, S., Radu, I., Dai Nguyen, V.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(4):2116-2122 Apr, 2021

المؤلفون: Wu, Y. C., Garello, K., Kim, W., Gupta, M., Perumkunnil, M., Kateel, V., Couet, S., Carpenter, R., Rao, S., Van Beek, S., Sethu, K. K. Vudya, Yasin, F., Crotti, D., Kar, G. S.

المصدر: Phys. Rev. Applied 15, 064015 (2021)

مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/2104.09599

المؤلفون: Doevenspeck, J., Garello, K., Rao, S., Yasin, F., Couet, S., Jayakumar, G., Mallik, A., Cosemans, S., Debacker, P., Verkest, D., Lauwereins, R., Dehaene, W., Kar, G.S.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Couet, S., Rao, S., Van Beek, S., Nguyen, V.D., Garello, K., Kateel, V., Jayakumar, G., Costa, J.D., Cai, K., Yasin, F., Crotti, D., Kar, G.S.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Raymenants, E., Wan, D., Couet, S., Canvel, Y., Thiam, A., Tsvetanova, D., Souriau, L., Asselberghs, I., Carpenter, R., Jossart, N., Manfrini, M., Vaysset, A., Bultynck, O., Van Beek, S., Heyns, M., Nikonov, D.E., Young, I.A., Ghosh, S., Vila, L., Garello, K., Pizzini, S., Nguyen, V.D., Radu, I.P.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :32.3.1-32.3.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Wu, Y. C., Kim, W., Garello, K., Yasin, F., Jayakumar, G., Couet, S., Carpenter, R., Kundu, S., Rao, S., Crotti, D., Van Houdt, J., Groeseneken, G., Kar, G. S.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Doevenspeck, J., Garello, K., Verhoef, B., Degraeve, R., Van Beek, S., Crotti, D., Yasin, F., Couet, S., Jayakumar, G., Papistas, I. A, Debacker, P., Lauwereins, R., Dehaene, W., Kar, G. S., Cosemans, S., Mallik, A., Verkest, D.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology