يعرض 1 - 10 نتائج من 717 نتيجة بحث عن '"Gear fault"', وقت الاستعلام: 1.70s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2024 IEEE International Conference on Prognostics and Health Management (ICPHM) Prognostics and Health Management (ICPHM), 2024 IEEE International Conference on. :15-22 Jun, 2024

    Relation: 2024 IEEE International Conference on Prognostics and Health Management (ICPHM)

  2. 2
    مؤتمر

    المؤلفون: Goswami, Priyom, Rai, Rajiv Nandan

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-6 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

  3. 3
    مؤتمر

    المؤلفون: Bechhoefer, Eric, Janke, Christian

    المصدر: 2024 International Conference on Control, Automation and Diagnosis (ICCAD) Control, Automation and Diagnosis (ICCAD), 2024 International Conference on. :1-6 May, 2024

    Relation: 2024 International Conference on Control, Automation and Diagnosis (ICCAD)

  4. 4
    دورية أكاديمية

    المؤلفون: Liu, W., Zhu, R., Yu, H., Zhou, W., Wang, J.

    المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(10):16419-16428 May, 2024

  5. 5
    مؤتمر

    المصدر: 2023 IEEE International Conference on Electrical, Automation and Computer Engineering (ICEACE) Electrical, Automation and Computer Engineering (ICEACE), 2023 IEEE International Conference on. :16-21 Dec, 2023

    Relation: 2023 IEEE International Conference on Electrical, Automation and Computer Engineering (ICEACE)

  6. 6
    دورية أكاديمية

    المؤلفون: Yang, N., Liu, J., Zhao, W., Tan, Y.

    المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(4):4758-4770 Feb, 2024

  7. 7
    دورية أكاديمية

    المؤلفون: Wang, B., Xu, Y., Wang, M., Li, Y.

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-11 2024

  8. 8
    دورية أكاديمية

    المؤلفون: Wang, M., Yang, Y., Wei, L., Li, Y.

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-11 2024

  9. 9
    مؤتمر

    المؤلفون: Wan, Xin, Wang, Manyi

    المصدر: 2023 IEEE International Conference on Mechatronics and Automation (ICMA) Mechatronics and Automation (ICMA), 2023 IEEE International Conference on. :2348-2353 Aug, 2023

    Relation: 2023 IEEE International Conference on Mechatronics and Automation (ICMA)

  10. 10
    مؤتمر

    المؤلفون: Yang, Yunxin, Wang, Manyi

    المصدر: 2023 IEEE International Conference on Mechatronics and Automation (ICMA) Mechatronics and Automation (ICMA), 2023 IEEE International Conference on. :1877-1882 Aug, 2023

    Relation: 2023 IEEE International Conference on Mechatronics and Automation (ICMA)