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1دورية أكاديمية
المؤلفون: Seung-Ho Lim, Jae-Bin Lee, Geon-Myeong Kim, Woo Hyun Ahn
المصدر: IEEE Access, Vol 8, Pp 162491-162506 (2020)
مصطلحات موضوعية: NAND flash memory, flash storage, P/E cycle, RC LDPC, PCHK, parity, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2
المؤلفون: Seung-Ho Lim, Jae-Bin Lee, Geon-Myeong Kim
المصدر: Proceedings of the International Conference on Compliers, Architectures and Synthesis for Embedded Systems Companion.
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Computer science, business.industry, NAND gate, Data_CODINGANDINFORMATIONTHEORY, Code rate, Flash memory, Flash (photography), Embedded system, Encoding (memory), Computer data storage, Overhead (computing), Low-density parity-check code, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::62fd1ab346a4534952b926cb7b68b0ef
https://doi.org/10.1145/3349569.3351535