المؤلفون: Veloso, A., Jourdain, A., Radisic, D., Chen, R., Arutchelvan, G., O'Sullivan, B., Arimura, H., Stucchi, M., De Keersgieter, A., Hosseini, M., Hopf, T., D'have, K., Wang, S., Dupuy, E., Mannaert, G., Vandersmissen, K., Iacovo, S., Marien, P., Choudhury, S., Schleicher, F., Sebaai, F., Oniki, Y., Zhou, X., Gupta, A., Schram, T., Briggs, B., Lorant, C., Rosseel, E., Hikavyy, A., Loo, R., Geypen, J., Batuk, D., Martinez, G.T., Soulie, J.P., Devriendt, K., Chan, B.T., Demuynck, S., Hiblot, G., Van der Plas, G., Ryckaert, J., Beyer, G., Litta, E.D., Beyne, E., Horiguchi, N.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):7173-7179 Dec, 2022

المؤلفون: Mertens, H., Hosseini, M., Chiarella, T., Zhou, D., Wang, S., Mannaert, G., Dupuy, E., Radisic, D., Tao, Z., Oniki, Y., Hikavyy, A., Rosseel, R., Mingardi, A., Choudhury, S., Gowda, P. Puttarame, Sebaai, F., Peter, A., Vandersmissen, K., Soulie, J.P., Keersgieter, A. De, Lima, L. Petersen Barbosa, Cavalcante, C., Batuk, D., Martinez, G.T., Geypen, J., Seidel, F., Paulussen, K., Favia, P., Boemmels, J., Loo, R., Wong, P., Marquez, A. Sepulveda, Chan, B.T., Mitard, J., Subramanian, S., Demuynck, S., Litta, E. Dentoni, Horiguchi, N., Samavedam, S., Biesemans, S.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Mertens, H., Ritzenthaler, R., Oniki, Y., Gowda, P. Puttarame, Mannaert, G., Sebaai, F., Hikavyy, A., Rosseel, E., Dupuy, E., Peter, A., Vandersmissen, K., Radisic, D., Briggs, B., Batuk, D., Geypen, J., Martinez-Alanis, G., Seidel, F., Richard, O., Chan, B.T., Mitard, J., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :23.1.1-23.1.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Vega-Gonzalez, V., Montero, D., Versluijs, J., Pedreira, O. Varela, Jourdan, N., Puliyalil, H., Chehab, B., Peissker, T., Haider, A., Batuk, D., Martinez, G. T., Geypen, J., Le, Q. T., Bazzazian, N., Heylen, N., van der Veen, M., El-Mekki, Z., Webers, T., Vats, H., Rynders, L., Cupak, M., Uk-Lee, J., Drissi, Y., Halipre, L., Gillijns, W., Charley, A.-L., Verdonck, P., Witters, T., Gompel, S. V., Kimura, Y., Ciofi, I., De Wachter, B., Swerts, J., Grieten, E., Ercken, M., Kim, R., Croes, K., Leray, P., Jaysankar, M., Nagesh, N., Ramakers, L., Murdoch, G., Park, S., Tokei, Z., Dentoni-Litta, E., Horiguchi, N.

المصدر: 2021 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2021 IEEE International. :1-3 Jul, 2021

Relation: 2021 IEEE International Interconnect Technology Conference (IITC)

المؤلفون: Subhechha, S., Rassoul, N., Belmonte, A., Hody, H., Dekkers, H., van Setten, M. J., Chasin, A., Sharifi, S.H., Sutar, S., Magnarin, L., Celano, U., Puliyalil, H., Kundu, S., Pak, M., Teugels, L., Tsvetanova, D., Bazzazian, N., Vandersmissen, K., Biasotto, C., Batuk, D., Geypen, J., Heijlen, J., Delhougne, R., Kar, G. S.

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :292-293 Jun, 2022

Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Subhechha, S., Rassoul, N., Belmonte, A., Hody, H., Dekkers, H., van Setten, M. J., Chasin, A., Sharifi, S.H., Banerjee, K., Puliyalil, H., Kundu, S., Pak, M., Tsvetanova, D., Bazzazian, N., Vandersmissen, K., Batuk, D., Geypen, J., Heijlen, J., Delhougne, R., Kar, G. S.

المصدر: 2022 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2022 International Conference on. :88-88 Sep, 2022

Relation: 2022 International Conference on IC Design and Technology (ICICDT)

المؤلفون: Veloso, A., Jourdain, A., Hiblot, G., Schleicher, F., D'have, K., Sebaai, F., Radisic, D., Loo, R., Hopf, T., De Keersgieter, A., Arimura, H., Eneman, G., Favia, P., Geypen, J., Arutchelvan, G., Chasin, A., Jang, D., Nyns, L., Rosseel, E., Hikavyy, A., Mannaert, G., Chan, B. T., Devriendt, K., Demuynck, S., Plas, G. Van der, Ryckaert, J., Beyer, G., Litta, E. Dentoni, Beyne, E., Horiguchi, N.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Mertens, H., Ritzenthaler, R., Oniki, Y., Briggs, B., Chan, B.T., Hikavyy, A., Hopf, T., Mannaert, G., Tao, Z., Sebaai, F., Peter, A., Vandersmissen, K., Dupuy, E., Rosseel, E., Batuk, D., Geypen, J., Martinez, G. T., Abigail, D., Grieten, E., Dehave, K., Mitard, J., Subramanian, S., Ragnarsson, L.-A., Weckx, P., Jang, D., Chehab, B., Hellings, G., Ryckaert, J., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Belmonte, A., Oh, H., Subhechha, S., Rassoul, N., Hody, H., Dekkers, H., Delhougne, R., Ricotti, L., Banerjee, K., Chasin, A., van Setten, M. J., Puliyalil, H., Pak, M., Teugels, L., Tsvetanova, D., Vandersmissen, K., Kundu, S., Heijlen, J., Batuk, D., Geypen, J., Goux, L., Kar, G. S.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :10.6.1-10.6.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Gupta, A., Radisic, D., Maes, J. W., Pedreira, O. Varela, Soulie, J-P., Jourdan, N., Mertens, H., Bandyopadhyay, S., Le, Q. T., Pacco, A., Heylen, N., Vandersmissen, K., Devriendt, K., Zhu, C., Datta, S., Sebaai, F., Wang, S., Mousa, M., Lee, J., Geypen, J., De Wachter, B., Chehab, B., Salahuddin, S. M., Murdoch, G., Biesemans, S., Tokei, Zs., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :22.5.1-22.5.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)