المؤلفون: Joshi, K., Nminibapiel, D., Ghoneim, M., Ali, D., Ramamurthy, R., Pantisano, L., Meric, I., Ramey, S.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Jamil, M., Mukhopadhay, S., Ghoneim, M., Shailos, A., Prasad, C., Meric, I., Ramey, S.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Ghoneim, M. M., El-Hallag, I. S.

المصدر: Journal of the Brazilian Chemical Society. January 2010 21(1)

مصطلحات موضوعية: ruthenium-borane complexe, convolutive voltammetry, chronoamperometry, chronopotentiometry, digital simulation

وصف الملف: text/html

URL الوصول: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50532010000100003

المؤلفون: Sell, B., An, S., Armstrong, J., Bahr, D., Bains, B., Bambery, R., Bang, K., Basu, D., Bendapudi, S., Bergstrom, D., Bhandavat, R., Bhowmick, S., Buehler, M., Caselli, D., Cekli, S., Chaganti, Vrsk., Chang, Y. J., Chikkadi, K., Chu, T., Crimmins, T., Darby, G., Ege, C., Elfick, P., Elko-Hansen, T., Fang, S., Gaddam, C., Ghoneim, M., Gomez, H., Govindaraju, S., Guo, Z., Hafez, W., Haran, M., Hattendorf, M., Hu, S., Jain, A., Jaloviar, S., Jang, M., Kameswaran, J., Kapinus, V., Kennedy, A., Klopcic, S., Krishnan, D., Leib, J., Lin, Y.-T., Lindert, N., Liu, G., Loh, O., Luo, Y., Mani, S., Mleczko, M., Mocherla, S., Packan, P., Paik, M., Paliwal, A., Pandey, R., Patankar, K., Pipes, L., Plekhanov, P., Prasad, C., Prince, M., Ramalingam, G., Ramaswamy, R., Riley, J., Perez, J. R. Sanchez, Sandford, J., Sathe, A., Shah, F., Shim, H., Subramanian, S., Tandon, S., Tanniru, M., Thakurta, D., Troeger, T., Wang, X., Ward, C., Welsh, A., Wickramaratne, S., Wnuk, J., Xu, S. Q., Yashar, P., Yaung, J., Yoon, K., Young, N.

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :282-283 Jun, 2022

Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Tawfik, Abdel Nasser, Greiner, Carsten, Diab, Abdel Magied, Ghoneim, M. T., Anwer, H.

المصدر: Phys. Rev. C 101, 035210 (2020)

مصطلحات موضوعية: High Energy Physics - Phenomenology, High Energy Physics - Theory

URL الوصول: http://arxiv.org/abs/1908.05939

المؤلفون: Tawfik, Abdel Nasser, Diab, Abdel Magied, Ghoneim, M. T., Anwer, H.

المصدر: Int.J.Mod.Phys. A34 (2019) 1950199

مصطلحات موضوعية: High Energy Physics - Phenomenology

URL الوصول: http://arxiv.org/abs/1904.09890

المؤلفون: Bahabry, R. R., Gumus, A., Kutbee, A. T., Wehbe, N., Ahmed, S. M., Ghoneim, M. T., Lee, K.-T., Rogers, J. A., Hussain, M. M.

المصدر: 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2016 IEEE 43rd. :0602-0605 Jun, 2016

Relation: 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)

المؤلفون: Othman, S. M., Ghoneim, M. T., Hussein, M. T., El-Smman, H., Hussein, A.

المصدر: International 1 Journal of Modern Physics E, Vol. 27, No. 1 (2018) 1850007

مصطلحات موضوعية: Nuclear Experiment, High Energy Physics - Experiment, High Energy Physics - Phenomenology, Physics - Instrumentation and Detectors

URL الوصول: http://arxiv.org/abs/1801.05468

المؤلفون: Qaisi, R. M., Smith, C. E., Ghoneim, M. T., Yu, Q., Hussain, M. M.

المصدر: 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013) Nanotechnology (IEEE-NANO), 2013 13th IEEE Conference on. :890-893 Aug, 2013

Relation: 2013 IEEE 13th International Conference on Nanotechnology (IEEE-NANO)

المؤلفون: Ghoneim, M. T., Rojas, J. P., Young, C. D., Bersuker, G., Hussain, M. M.

المصدر: IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 64(2):579-585 Jun, 2015