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1دورية أكاديمية
المؤلفون: Carlino, M.F., Gielen, G.
المصدر: IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 18(3):511-522 Jun, 2024
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2مؤتمر
المؤلفون: Sangani, D., Kaczer, B., Weckx, P., Roussel, Ph. J., Mishra, S., Marinissen, E. J., Gielen, G.
المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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3دورية أكاديمية
المؤلفون: Chen, Y., Tacca, B., Biswas, D., Gielen, G., Catthoor, F., Verhelst, M., Mora Lopez, C.
المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 58(11):2990-3002 Nov, 2023
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4دورية أكاديمية
المؤلفون: Xama, N., Gomez, J., Dobbelaere, W., Vanhooren, R., Coyette, A., Gielen, G.
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(10):3426-3435 Oct, 2023
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5دورية أكاديميةModeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
المؤلفون: Sangani, D., Diaz-Fortuny, J., Bury, E., Franco, J., Kaczer, B., Gielen, G.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):346-354 Sep, 2023
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6دورية أكاديمية
المؤلفون: Alvero-Gonzalez, L.M., Gielen, G., Gutierrez, E.
المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 70(9):3238-3242 Sep, 2023
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7مؤتمر
المؤلفون: Saraza-Canflanca, P., Sangani, D., Diaz-Fortuny, J., Tyaginov, S., Gielen, G., Bury, E., Kaczer, B.
المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :8A.2-1-8A.2-9 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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8مؤتمر
المؤلفون: Sangani, D., Diaz-Fortuny, J., Bury, E., Kaczer, B., Gielen, G.
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023
Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)
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9مؤتمرAssessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions
المؤلفون: Sangani, D., Diaz-Fortuny, J., Bury, E., Kaczer, B., Gielen, G.
المصدر: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-6 Oct, 2022
Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)
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10مؤتمر
المؤلفون: Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Reorda, M.S., Ullmann, R., Vanhooren, R., Xama, N., Wu, L.
المصدر: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-10 Sep, 2022
Relation: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)
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