المؤلفون: Weber, J., Fung, R., Wong, R., Wolf, H., Gieser, H.A., Maurer, L.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 19(4):591-601 Dec, 2019

المؤلفون: Koch, S., Orr, B.J., Gossner, H., Gieser, H.A., Maurer, L.

المصدر: IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 61(1):20-28 Feb, 2019

المؤلفون: Gieser, H.A., Bonfert, D., Hengelmann, H., Wolf, H., Bock, K., Zollmer, V., Werner, C., Domann, G., Bahr, J., Ndip, I., Curran, B., Oehler, F., Milosiu, H.

المصدر: 3rd Electronics System Integration Technology Conference ESTC Electronic System-Integration Technology Conference (ESTC), 2010 3rd. :1-6 Sep, 2010

Relation: 2010 3rd Electronic System-Integration Technology Conference (ESTC)

المؤلفون: Doerr, I., Gieser, H.A., Sommer, G., Wolf, H., Wilkening, W., Willemen, J., Andreini, A., Salhi, F., Fotheringham, G., John, W., Reichl, H.

المصدر: 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Electromagnetic compatibility Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on. 1:390-393 Vol.1 2003

Relation: 2003 IEEE International Symposium on Electromagnetic Compatibility (EMC)

المؤلفون: Blaho, M., Zullino, L., Wolf, H., Stella, R., Andreini, A., Gieser, H.A., Pogany, D., Gornik, E.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 4(3):535-541 Sep, 2004

المؤلفون: Gieser, H.A.

المساهمون: Publica

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od_______610::0e2ff8adf8d09fec4ca84bd836c5d6b9
https://publica.fraunhofer.de/handle/publica/203263

المؤلفون: Gieser, H.A., Egger, P., Reiner, J.C., Herrmann, M.R.

المساهمون: Publica

مصطلحات موضوعية: reliability, leakage, CDM, ESD, input protection, MOS, burn-in, HBM, latency, failure signature

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od_______610::3039c2b699f1bf2a36efa488bc3f9c46
https://publica.fraunhofer.de/handle/publica/184311

المؤلفون: Gieser, H.A., Wolf, H.

المصدر: 2007 IEEE International Reliability Physics Symposium Proceedings 45th Annual; 2007, p324-333, 10p

المؤلفون: Gieser, H.A., Wolf, H., Soldner, W., Reichl, H., Andreini, A., Natarajan, M.I., Stadler, W.

المصدر: 2003 Electrical Overstress/Electrostatic Discharge Symposium; 2003, p1-10, 10p

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