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1
المؤلفون: Yong-Ki Cho, Dong-Min Kim, Seung-Jun Bae, Young-Sik Kim, Hyang-ja Yang, Sang-hyup Kwak, Beom-Sig Cho, Jae-Young Lee, Tae-Young Oh, Hye-Ran Kim, Byeong-Cheol Kim, Cheol-Goo Park, Yun-Seok Yang, Jeong-Don Lim, Chang-Ho Shin, Seok-Won Hwang, Min-Sang Park, Sam-Young Bang, Ji-Hoon Lim, Young-Ryeol Choi, Joo Sun Choi, Jin-Kook Kim, Dae Hyun Kim, Young-Hyun Jun, Gil-Shin Moon, Kwang-Il Park, Young-Soo Sohn, Jae-Hyung Lee, Jin-Hyun Kim, Hyun-Joong Kim
المصدر: ISSCC
مصطلحات موضوعية: Engineering, Dynamic random-access memory, business.industry, Sense amplifier, Electrical engineering, Integrated circuit, law.invention, law, Gigabit, Electrical and Electronic Engineering, business, Voltage reference, Dram, Jitter, Data transmission
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2
المؤلفون: Seong-Jin Jang, Young-Hyun Jun, Young-Chul Cho, Kyoung-Ho Kim, Soo-In Cho, Joo Sun Choi, Jeong-Don Ihm, Min-Sang Park, Hong-Kyong Lee, Seung-Jun Bae, Kwang-Il Park, Jae-Sung Kim, Gil-Shin Moon, Ho-young Song, Hyun-Jin Kim, Yoon-Sik Park, Dae Hyun Kim, Ji-Hoon Lim, Sang-Jun Hwang, Sam-Young Bang, Woojin Lee, Sung-Hoon Kim, Kinam Kim, Seok-Won Hwang
المصدر: IEEE Journal of Solid-State Circuits. 43:121-131
مصطلحات موضوعية: Physics, Offset (computer science), business.industry, Electrical engineering, 32-bit, Bottleneck, Electronic engineering, Electrical and Electronic Engineering, Graphics, business, Dram, Jitter, Coding (social sciences), Voltage
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3
المؤلفون: Gil-Shin Moon, Jeong-Don Lim, Hyang-ja Yang, Seung-Jun Bae, Dae Hyun Kim, Hye-Ran Kim, Woo-Seop Kim, Byeong-Cheol Kim, Dong-seok Kang, Cheol-Goo Park, Yong-Ki Cho, Yong-Jae Shin, Yun-Seok Yang, Gong-Heom Han, Young-Soo Sohn, Chang-Ho Shin, Min-Sang Park, Si-Hong Kim, Joo Sun Choi, sunyoung park, Ho-Seok Seol, Kwang-Il Park, Sam-Young Bang, Tae-Young Oh, Young-Ryeol Choi, Su-Yeon Doo, Young-Hyun Jun, Sang-hyup Kwak, Young-Sik Kim
المصدر: ISSCC
مصطلحات موضوعية: Engineering, business.industry, Power integrity, Hardware_PERFORMANCEANDRELIABILITY, Chip, Backward compatibility, Phase-locked loop, Injection locking, Timing margin, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Dram, Jitter
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::17f134797a9a27620a368d25d78b0da6
https://doi.org/10.1109/isscc.2011.5746414 -
4
المؤلفون: Tae-Young Oh, Young-Soo Sohn, Seung-Jun Bae, Min-Sang Park, Ji-Hoon Lim, Yong-Ki Cho, Dae-Hyun Kim, Dong-Min Kim, Hye-Ran Kim, Hyun-Joong Kim, Jin-Hyun Kim, Jin-Kook Kim, Young-Sik Kim, Byeong-Cheol Kim, Sang-Hyup Kwak, Jae-Hyung Lee, Jae-Young Lee, Chang-Ho Shin, Yun-Seok Yang, Beom-Sig Cho, Sam-Young Bang, Hyang-Ja Yang, Young-Ryeol Choi, Gil-Shin Moon, Cheol-Goo Park, Seok-Won Hwang, Jeong-Don Lim, Kwang-Il Park, Joo Sun Choi, Young-Hyun Jun
المصدر: 2010 IEEE International Solid-State Circuits Conference - (ISSCC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6cc843d5d0e2c1ef2d41021d7b3bedcf
https://doi.org/10.1109/isscc.2010.5433889 -
5
المؤلفون: Ki-Woong Yeom, Seung-Jun Bae, Seong-Jin Jang, Hye-Ran Kim, Dae-Hyun Chung, Cheol-Goo Park, Gil-Shin Moon, Hyang-ja Yang, Joo Sun Choi, Jae-Sung Kim, Jae-Young Lee, Min-Sang Park, Kyoung-Ho Kim, Kwang-ll Park, Dae Hyun Kim, Kang-Young Kim, Jingook Kim, Young-Hyun Jun, Yong-Jae Shin, Young-Soo Sohn, Sam-Young Bang, Si-Hong Kim, Jae-Hyung Lee, Kinam Kim, Ho-Kyung Lee, In-Soo Park
المصدر: ISSCC
مصطلحات موضوعية: Reduction (complexity), business.industry, Computer science, Signal integrity, Graphics, business, Computer hardware, Dram, Jitter
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7f59fae5256fcdac88c998be8845e2e0
https://doi.org/10.1109/isscc.2008.4523165 -
6
المؤلفون: Jae-Sung Kim, Ho-young Song, Su-Jin Park, Sang-Jun Hwang, Sam-Young Bang, Young-Chul Cho, Seong-Jin Jang, Soo-In Cho, Sung-Hoon Kim, Seung-Jun Bae, Hyun-Jin Kim, Ji-Hoon Lim, Se-Mi Yang, Ok-Joo Park, Dae Hyun Kim, Young-wook Jang, Suk-Won Hwang, Min-Sang Park, Hyun-Kyu Lee, Kwang-II Park, Gil-Shin Moon, Woojin Lee, Mi-Jin Lee, Young-Hyun Jun, Ho-Kyung Lee, Jeong-Don Ihm, Kyung-Ho Kim, Jinyong Choi, Young-Wook Kim
المصدر: ISSCC
مصطلحات موضوعية: Engineering, Dynamic random-access memory, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, 32-bit, law.invention, Single-ended signaling, law, Low-power electronics, Electronic engineering, business, Dram, System bus, Jitter
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ae6ad4b6bd11d5bc9409a494a50f5844
https://doi.org/10.1109/isscc.2007.373509 -
7مؤتمر
المؤلفون: Seung-Jun Bae, Young-Soo Sohn, Kwang-ll Park, Kyoung-Ho Kim, Dae-Hyun Chung, Jin-Gook Kim, Si-Hong Kim, Min-Sang Park, Jae-Hyung Lee, Sam-Young Bang, Ho-Kyung Lee, In-Soo Park, Jae-Sung Kim, Dae-Hyun Kim, Hye-Ran Kim, Yong-Jae Shin, Cheol-Goo Park, Gil-Shin Moon, Ki-Woong Yeom, Kang-Young Kim
المصدر: 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers; 2008, p278-613, 336p
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8مؤتمر
المؤلفون: Jeong-Don Ihm, Seung-Jun Bae, Kwang-II Park, Ho-Young Song, Woo-Jin Lee, Hyun-Jin Kim, Kyung-Ho Kim, Ho-Kyung Lee, Min-Sang Park, Sam-Young Bang, Mi-Jin Lee, Gil-Shin Moon, Young-Wook Jang, Suk-Won Hwang, Young-Chul Cho, Sang-Jun Hwang, Dae-Hyun Kim, Ji-Hoon Lim, Jae-Sung Kim, Su-Jin Park
المصدر: 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers; 2007, p492-617, 126p
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9دورية أكاديمية
المؤلفون: Seung-Jun Bae, Kwang-Il Park, Jeong-Don Ihm, Ho-Young Song, Woo-Jin Lee, Hyun-Jin Kim, Kyoung-Ho Kim, Yoon-Sik Park, Min-Sang Park, Hong-Kyong Lee, Sam-Young Bang, Gil-Shin Moon, Seok-Won Hwang, Young-Chul Cho, Sang-Jun Hwang, Dae-Hyun Kim, Ji-Hoon Lim, Jae-Sung Kim, Sung-Hoon Kim, Seong-Jin Jang
المصدر: IEEE Journal of Solid-State Circuits; Jan2008, Vol. 43 Issue 1, p121-131, 11p, 1 Black and White Photograph, 1 Chart, 1 Graph