المؤلفون: Mutlu, Z., Lin, Y., Barin, G. B., Zhang, Z., Pitner, G., Wang, S., Darawish, R., Giovannantonio, M. Di, Wang, H., Cai, J., Passlack, M., Diaz, C. H., Narita, A., Mullen, K., Fischer, F. R., Bandaru, P., Kummel, A. C., Ruffieux, P., Fasel, R., Bokor, J.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :37.4.1-37.4.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)