المؤلفون: Arimura, H., Brus, S., Franco, J., Oniki, Y., Vandooren, A., Conard, T., Chan, B.-T., Kannan, B., Samiee, M., Li, W., Deminskyi, P., Shero, E., Bakke, J., Jourdan, N., Verni, G. Alessio, Maes, J. W., Givens, M., Ragnarsson, L.-A., Mitard, J., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Porret, C., Everaert, J.-L., Schaekers, M., Ragnarsson, L.-A., Hikavyy, A., Rosseel, E., Rengo, G., Loo, R., Khazaka, R., Givens, M., Piao, X., Mertens, S., Heylen, N., Mertens, H., De Carvalho Cavalcante, C. Toledo, Sterckx, G., Brus, S., Mehta, A. Nalin, Korytov, M., Batuk, D., Favia, P., Langer, R., Pourtois, G., Swerts, J., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :34.1.1-34.1.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Popovici, M.I., Bizindavyi, J., Favia, P., Clima, S., Alam, Md. Nur K., Ramachandran, R.K., Walke, A.M., Celano, U., Leonhardt, A., Mukherjee, S., Richard, O., Illiberi, A., Givens, M., Delhougne, R., Van Houdt, J., Kar, G. Sankar

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :6.4.1-6.4.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Arimura, H., Ragnarsson, L.-A., Oniki, Y., Franco, J., Vandooren, A., Brus, S., Leonhardt, A., Sippola, P., Ivanova, T., Verni, G. Alessio, Chang, R.-J., Xie, Q., Givens, M., Mitard, J., Biesemans, S., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :13.5.1-13.5.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Stewart, Jamie L., Currin, John, Clark, Sherrie G., Redifer, Tracey, Givens, M. Daniel, Mercadante, Vitor R.G.

المصدر: In Theriogenology 1 April 2023 200:43-48

المؤلفون: Sioncke, S., Franco, J., Vais, A., Putcha, V., Nyns, L., Sibaja-Hernandez, A., Rooyackers, R., Ardila, S. Calderon, Spampinato, V., Franquet, A., Maes, J. W., Xie, Q., Givens, M., Tang, F., Jiang, X., Heyns, M., Linten, D., Mitard, J., Thean, A., Mocuta, D., Collaert, N.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T38-T39 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Franco, J., Vais, A., Sioncke, S., Putcha, V., Kaczer, B., Shie, B.-S., Shi, X., Mahlouji, R., Nyns, L., Zhou, D., Waldron, N., Maes, J.W., Xie, Q., Givens, M., Tang, F., Jiang, X., Arimura, H., Schram, T., Ragnarsson, L.-A, Sibaja Hernandez, A., Hellings, G., Horiguchi, N., Heyns, M., Groeseneken, G., Linten, D., Collaert, N., Thean, A.

المصدر: 2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016

Relation: 2016 IEEE Symposium on VLSI Technology

المؤلفون: Vais, A., Alian, A., Nyns, L., Franco, J., Sioncke, S., Putcha, V., Yu, H., Mols, Y., Rooyackers, R., Lin, D., Maes, J.W., Xie, Q., Givens, M., Tang, F., Jiang, X., Mocuta, A., Collaert, N., De Meyer, K., Thean, A.

المصدر: 2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016

Relation: 2016 IEEE Symposium on VLSI Technology

المؤلفون: Zhou, X., Waldron, N., Boccardi, G., Sebaai, F., Merckling, C., Eneman, G., Sioncke, S., Nyns, L., Opdebeeck, A., Maes, J. W., Xie, Q., Givens, M., Tang, F., Jiang, X., Guo, W., Kunert, B., Teugels, L., Devriendt, K., Hernandez, A. Sibaja, Franco, J., van Dorp, D., Barla, K., Collaert, N., Thean, A. V-Y.

المصدر: 2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016

Relation: 2016 IEEE Symposium on VLSI Technology

المؤلفون: Franco, J., Witters, L., Vandooren, A., Arimura, H., Sioncke, S., Putcha, V., Vais, A., Xie, Q., Givens, M., Tang, F., Jiang, X., Subirats, A., Chasin, A., Ragnarsson, L.-A., Horiguchi, N., Kaczer, B., Linten, D., Collaert, N.

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :2B-3.1-2B-3.5 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)