المؤلفون: Kirawanich, P., Gleason, D., Cornell, A., Islam, N.E.

المصدر: 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Electromagnetic Compatibility Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on. 3:883-887 Vol. 3 2005

Relation: 2005 IEEE International Symposium on Electromagnetic Compatibility

المؤلفون: Liessner, C., Barrett, J., Palma, J., Gleason, D., Mil'shtein, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 54(3):391-397 Mar, 2007

المؤلفون: Kirawanich, P., Gleason, D., Islam, N.E.

المصدر: 2005 IEEE Pulsed Power Conference Pulsed Power Conference, 2005 IEEE. :1441-1444 Jun, 2005

Relation: 2005 IEEE Pulsed Power Conference

المؤلفون: Gleason, D., Andrisani, D., II

المصدر: IEEE Transactions on Automatic Control IEEE Trans. Automat. Contr. Automatic Control, IEEE Transactions on. 35(8):932-935 Aug, 1990

المؤلفون: McCormack, L., Gleason, D.

المصدر: Proceedings of the IEEE National Aerospace and Electronics Conference Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National. :294-298 vol.1 1989

Relation: Proceedings of the IEEE National Aerospace and Electronics Conference

المؤلفون: Goddard, D.G., Gleason, D.

المصدر: Proceedings of the IEEE 1988 National Aerospace and Electronics Conference Aerospace and Electronics Conference, 1988. NAECON 1988., Proceedings of the IEEE 1988 National. :470-478 vol.2 1988

Relation: Proceedings of the IEEE 1988 National Aerospace and Electronics Conference

المؤلفون: Gleason, D., Andrisani, D.

المصدر: Proceedings of the IEEE 1988 National Aerospace and Electronics Conference Aerospace and Electronics Conference, 1988. NAECON 1988., Proceedings of the IEEE 1988 National. :287-291 vol.1 1988

Relation: Proceedings of the IEEE 1988 National Aerospace and Electronics Conference

المؤلفون: Gleason, D., Andrisani, D., II.

المصدر: IEEE Transactions on Aerospace and Electronic Systems IEEE Trans. Aerosp. Electron. Syst. Aerospace and Electronic Systems, IEEE Transactions on. 25(5):768-771 Sep, 1989

المؤلفون: Galiano, K., Deitz, J. I., Carnevale, S. D., Gleason, D. A., Paul, P. K., Zhang, Z., McSkimming, B. M., Speck, J. S., Ringel, S. A., Grassman, T. J., Arehart, A. R., Pelz, J. P.

المصدر: Journal of Applied Physics; 2018, Vol. 123 Issue 22, pN.PAG-N.PAG, 8p, 4 Diagrams, 1 Graph

مصطلحات موضوعية: SEMICONDUCTOR defects, GALLIUM nitride epitaxy, GALLIUM nitride, ELECTRON mobility measurement, RADIO frequency measurement, SCANNING probe microscopy, CRYSTALLOGRAPHY

المؤلفون: Gleason, D. F., Danilowicz, B. S., Nolan, C. J.

المصدر: Coral Reefs: Journal of the International Society for Reef Studies. June 2009 28(2):549-554