يعرض 1 - 8 نتائج من 8 نتيجة بحث عن '"Goel, Sandeep K."', وقت الاستعلام: 0.84s تنقيح النتائج
  1. 1
    مؤتمر
    Advanced State Estimation Methods for Lithium-Ion Battery Cell- A Comprehensive Review

    المؤلفون: Maithani, Himanshu, Goel, Sandeep K., Uniyal, Ishita, Dubey, Ved Prakash, Salyani, Ekta

    المصدر: 2024 1st International Conference on Innovative Sustainable Technologies for Energy, Mechatronics, and Smart Systems (ISTEMS) Innovative Sustainable Technologies for Energy, Mechatronics, and Smart Systems (ISTEMS), 2024 1st International Conference on. :1-6 Apr, 2024

    Relation: 2024 1st International Conference on Innovative Sustainable Technologies for Energy, Mechatronics, and Smart Systems (ISTEMS)

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  2. 2
    مؤتمر
    Automation of 3D-DfT Insertion

    المؤلفون: Deutsch, Sergej, Chickermane, Vivek, Keller, Brion, Mukherjee, Subhasish, Konijnenburg, Mario, Marinissen, Erik Jan, Goel, Sandeep K.

    المصدر: 2011 Asian Test Symposium Test Symposium (ATS), 2011 20th Asian. :395-400 Nov, 2011

    Relation: 2011 IEEE 20th Asian Test Symposium (ATS)

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  3. 3
    Test and Debug Strategy for TSMC CoWoS ® Stacking Process‐Based Heterogeneous 3D‐IC : A Silicon Study

    المؤلفون: Goel, Sandeep K., Adham, Saman, Wang, Min-Jer, Lee, Frank, Chickermane, Vivek, Keller, Brion L., Valind, Thomas, Marinissen, Erik Jan, Franzon, P.D., Marinissen, E.J., Bakir, M.S.

    المساهمون: Electronic Systems

    المصدر: Handbook of 3D integration: volume 4: design, test, and thermal management, 325-346
    STARTPAGE=325;ENDPAGE=346;TITLE=Handbook of 3D integration

    مصطلحات موضوعية: Interconnection, business.product_category, business.industry, Computer science, media_common.quotation_subject, Stacking, Process (computing), Three-dimensional integrated circuit, Debugging, Embedded system, Hardware_INTEGRATEDCIRCUITS, Die (manufacturing), business, Design paradigm, Dram, media_common

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::be4f477eabebb88e73dfb92ae478f44b
    https://doi.org/10.1002/9783527697052.ch15

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  4. 4
    IEEE Std P1838: 3D test access standard under development

    المؤلفون: Cron, Adam, Marinissen, Erik Jan, Goel, Sandeep K., McLaurin, Teresa, Bhatia, Sandeep, Franzon, P.D., Marinissen, E.J., Bakir, M.S.

    المساهمون: Electronic Systems

    المصدر: Handbook of 3D Integration
    Handbook of 3D integration: volume 4: design, test, and thermal management, 301-323
    STARTPAGE=301;ENDPAGE=323;TITLE=Handbook of 3D integration

    مصطلحات موضوعية: Stack (abstract data type), Computer science, business.industry, Embedded system, Serial port, business, Parallel port, Die (integrated circuit), Test (assessment)

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0877118209d1c69aa1411d0aa89a8f0b
    https://doi.org/10.1002/9783527697052.ch14

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  5. 5
    مؤتمر
    Automatic generation of breakpoint hardware for silicon debug.

    المؤلفون: Vermeulen, Bart, Urfianto, Mohammad Z., Goel, Sandeep K.

    المصدر: DAC: Annual ACM/IEEE Design Automation Conference; Jun2004, p514-517, 4p

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  6. 6
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

    View this record from ISI Web of Science
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  7. 7
    كتاب
    Testing for small-delay defects in nanoscale CMOS integrated circuits
    Testing for small-delay defects in nanoscale Complementary Metal-Oxide Semiconductor integrated circuits

    المساهمون: Goel, Sandeep K., editor., Chakrabarty, Krishnendu, editor.

    مصطلحات موضوعية: Metal oxide semiconductors, Complementary -- Testing.

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  8. 8
    دورية أكاديمية
    Rare sequelae of herpes zoster in HIV positive patient.

    المؤلفون: Goel SK; Department of Skin and VD KMC, Mangalore-575 001, India., Kuruvila M

    المصدر: Indian journal of dermatology, venereology and leprology [Indian J Dermatol Venereol Leprol] 2002 Sep-Oct; Vol. 68 (5), pp. 295.

    نوع المنشور: Journal Article

    بيانات الدورية: Publisher: Scientific Scholar on behalf of Indian Association of Dermatologists, Venereologists & Leprologists Country of Publication: United States NLM ID: 7701852 Publication Model: Print Cited Medium: Internet ISSN: 0973-3922 (Electronic) Linking ISSN: 03786323 NLM ISO Abbreviation: Indian J Dermatol Venereol Leprol Subsets: PubMed not MEDLINE

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