المؤلفون: Goel, Sandeep Kumar, Patidar, Ankita, Lee, Frank

المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-4 May, 2024

Relation: 2024 IEEE European Test Symposium (ETS)

المؤلفون: Goel, Sandeep Kumar, Pendharkar, Sandeep, Liu, Chunsheng

المصدر: 2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-1 Apr, 2022

Relation: 2022 IEEE 40th VLSI Test Symposium (VTS)

المؤلفون: Li, Zipeng, Goel, Sandeep Kumar, Lee, Frank, Chakrabarty, Krishnendu

المصدر: 2015 IEEE International Test Conference (ITC) Test Conference (ITC), 2015 IEEE International. :1-10 Oct, 2015

Relation: 2015 IEEE International Test Conference (ITC)

المؤلفون: Lin, Mu-Shan, Huang, Tze-Chiang, Tsai, Chien-Chun, Tam, King-Ho, Hsieh, Cheng-Hsiang, Chen, Tom, Huang, Wen-Hung, Hu, Jack, Chen, Yu-Chi, Goel, Sandeep Kumar, Fu, Chin-Ming, Rusu, Stefan, Li, Chao-Chieh, Yang, Sheng-Yao, Wong, Mei, Yang, Shu-Chun, Lee, Frank

المصدر: 2019 Symposium on VLSI Circuits VLSI Circuits, 2019 Symposium on. :C28-C29 Jun, 2019

Relation: 2019 Symposium on VLSI Circuits

المؤلفون: Goel, Sandeep Kumar, Min-Jer-Wang, Adham, Saman, Mehta, Ashok, Lee, Frank

المصدر: Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on. :1-4 Apr, 2014

Relation: 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

المؤلفون: Goel, Sandeep Kumar, Adham, Saman, Wang, Min-Jer, Chen, Ji-Jan, Huang, Tze-Chiang, Mehta, Ashok, Lee, Frank, Chickermane, Vivek, Keller, Brion, Valind, Thomas, Mukherjee, Subhasish, Sood, Navdeep, Cho, Jeongho, Lee, Hayden Hyungdong, Choi, Jungi, Kim, Sangdoo

المصدر: 2013 IEEE International Test Conference (ITC) Test Conference (ITC), 2013 IEEE International. :1-10 Sep, 2013

Relation: 2013 IEEE International Test Conference (ITC)

المؤلفون: Deutsch, Sergej, Keller, Brion, Chickermane, Vivek, Mukherjee, Subhasish, Sood, Navdeep, Goel, Sandeep Kumar, Chen, Ji-Jan, Mehta, Ashok, Lee, Frank, Marinissen, Erik Jan

المصدر: 2012 IEEE International Test Conference Test Conference (ITC), 2012 IEEE International. :1-10 Nov, 2012

Relation: 2012 IEEE International Test Conference (ITC)

المؤلفون: Marinissen, Erik Jan, Vandling, Gilbert, Goel, Sandeep Kumar, Hapke, Friedrich, Rivers, Jason, Mittermaier, Nikolaus, Bahl, Swapnil

المصدر: 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012. :123-128 Mar, 2012

Relation: 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)

المؤلفون: Chi, Chun-Chuan, Marinissen, Erik Jan, Goel, Sandeep Kumar, Wu, Cheng-Wen

المصدر: 2011 Asian Test Symposium Test Symposium (ATS), 2011 20th Asian. :451-456 Nov, 2011

Relation: 2011 IEEE 20th Asian Test Symposium (ATS)

المؤلفون: Chi, Chun-Chuan, Marinissen, Erik Jan, Goel, Sandeep Kumar, Wu, Cheng-Wen

المصدر: 2011 IEEE International Test Conference Test Conference (ITC), 2011 IEEE International. :1-10 Sep, 2011

Relation: 2011 IEEE International Test Conference (ITC)