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1دورية أكاديمية
المؤلفون: Goggi, G., Moro, M., Chilà, A., Fatti, L., Cangiano, B.Aff1, Aff2, Federici, S., Galazzi, E., Carbone, E., Soranna, D., Vezzoli, V., Persani, L.Aff1, Aff2, Bonomi, M.Aff1, Aff2, IDs40618023021469_cor12
المصدر: Journal of Endocrinological Investigation: Official Journal of Italian Society of Endocrinology (SIE). 47(2):315-323
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2دورية أكاديمية
المؤلفون: Cangiano, B.Aff1, Aff2, Goggi, G.Aff1, Aff2, Federici, S.Aff1, Aff2, Bresesti, C., Cotellessa, L., Guizzardi, F., Vezzoli, V., Duminuco, P., Persani, L.Aff1, Aff2, Bonomi, M.Aff1, Aff2
المصدر: Journal of Endocrinological Investigation: Official Journal of Italian Society of Endocrinology (SIE). 44(11):2445-2454
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3دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
4مؤتمر
المؤلفون: Dell'Acqua, A., Alippi, C., Appelquist, G., Berglund, S., Bohm, C., Breveglieri, L., Brigati, S., Del Buono, L., Carlson, P., Cattaneo, P., Dadda, L., David, J., Engstrom, M., Fumagalli, G., Gatti, U., Genat, J.F., Goggi, G., Hansen, M., Hentzell, H., Hoglund, I., Inkinen, S., Kerek, A., Lebbolo, H., LeDortz, O., Lofstedt, B., Maloberti, F., Nayman, P., Persson, S.T., Piuri, V., Salice, F., Sami, M., Savoy-Navarro, A., Stefanelli, R., Sundblad, R., Svensson, C., Torelli, G., Vanuxem, J.P., Yamdagni, N., Yuan, J., Zitoun, R.
المصدر: Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) Wafer Scale Integration, 1994. Proceedings., Sixth Annual IEEE International Conference on. :252-264 1994
Relation: Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI)
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5مؤتمر
المؤلفون: Dell'Acqua, A., Alippi, C., Appelquist, G., Benetta, R., Berglund, S., Bezemat, J., Blouzon, F., Bohm, C., Breveglieri, L., Brigati, S., Carlson, P., Cattaneo, P., Dadda, L., David, J., Engstrom, M., Furnagalli, G., Gatti, U., Genat, J.F., Goggi, G., Hansen, M., Hentzell, H., Hoglund, I., Inkinen, S., Kerek, A., LeDortz, O., Lofstedt, B., Maloberti, F., Nayman, P., Persson, S.T., Piuri, V., Salice, F., Sami, M., Savoy-Navarro, A., Schwemling, P., Stefanelli, R., Sundblad, R., Svensson, C., Torelli, G., Vanuxem, J.P., Yamdagni, N., Yuan, J., Odmark, A.
المصدر: 1993 IEEE Conference Record Nuclear Science Symposium and Medical Imaging Conference Nuclear science and medical imaging Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.. :773-776 1993
Relation: 1993 IEEE Conference Record Nuclear Science Symposium and Medical Imaging Conference
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6مؤتمر
المؤلفون: Dell'Acqua, A., Hansen, M., Ikinen, S., Lofstedt, B., Vanuxem, J.P., Svensson, C., Yuan, J., Hentzell, H., Del Buono, L., David, J., Genat, J.F., Lebbolo, H., LeDortz, O., Nayman, P., Savoy-Navarro, A., Zitoun, R., Alippi, C., Breveglieri, L., Dadda, L., Piuri, V., Salice, F., Sami, M., Stefanelli, R., Cattaneo, P., Fumagalli, G., Goggi, G., Brigati, S., Gatti, U., Maloberti, F., Torelli, G., Carlson, P., Kerek, A., Appelquist, G., Berglund, S., Bohm, C., Engstrom, M., Yamdagni, N., Sundblad, R., Hoglund, I., Persson, S.T.
المصدر: Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on. :1-8 1993
Relation: Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
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7دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9
المؤلفون: Stapelbroek, Koen, Alimento, A., Goggi, G.
المساهمون: Public Administration
المصدر: Autour de l’Abbé Raynal: Genèse et enjeux politiques de l’Histoire de deux Indes, 45-61
STARTPAGE=45;ENDPAGE=61;TITLE=Autour de l’Abbé Raynal: Genèse et enjeux politiques de l’Histoire de deux IndesURL الوصول: https://explore.openaire.eu/search/publication?articleId=narcis______::d83f6954d63b5fa90caa1d608fb68756
https://pure.eur.nl/en/publications/8f52125d-b9e2-4fd3-a31f-beeefcde2dc5 -
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.