-
1مؤتمر
المؤلفون: Andre, Tom, Alam, Syed M., Gogl, Dietmar, Barkatullah, Javed, Qi, Jieming, Lin, Halbert, Zhang, Xiaohu, Meadows, William, Neumeyer, Frederick, Viot, Greg, Hossain, Forhad, Zhang, Yaojun, Janesky, Jason, DeHerrera, Mark, Kang, Bryan
المصدر: 2017 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2017 IEEE International. :1-4 May, 2017
Relation: 2017 IEEE International Memory Workshop (IMW)
-
2دورية أكاديمية
المؤلفون: Dietrich, Stefan, Angerbauer, Michael, Ivanov, Milena, Gogl, Dietmar, Hoenigschmid, Heinz, Kund, Michael, Liaw, Corvin, Markert, Michael, Symanczyk, Ralf, Altimime, Laith, Bournat, Serge, Mueller, Gerhard
المصدر: IEEE Journal of Solid-State Circuits; Apr2007, Vol. 42 Issue 4, p839-845, 7p, 13 Black and White Photographs, 3 Diagrams, 11 Graphs
-
3دورية أكاديمية
المؤلفون: Gogl, Dietmar, Arndt, Christian, Barwin, John C., Bette, Alexander, DeBrosse, John, Gow, Earl, Hoenigschmid, Heinz, Lammers, Stefan, Lamorey, Mark, Yu Lu, Maffitt, Tom, Maloney, Kim, Obermaier, Werner, Sturm, Andre, Viehmann, Hans, Willmott, Dennis, Wood, Mark, Gallagher, William J., Mueller, Gerhard, Sitaram, Arkalgud R.
المصدر: IEEE Journal of Solid-State Circuits; Apr2005, Vol. 40 Issue 4, p902-908, 7p, 15 Color Photographs, 6 Diagrams, 1 Chart, 5 Graphs
-
4دورية أكاديمية
المؤلفون: DeBrosse, John, Gogl, Dietmar, Bette, Alexander, Hoenigschmid, Heinz, Robertazzi, Raphael, Arndt, Christian, Braun, Daniel, Casarotto, D., Havreluk, R., Lammers, Stefan, Obermaier, Werner, Reohr, William R., Viehmann, H., Gallagher, William J., Müller, Gerhard
المصدر: IEEE Journal of Solid-State Circuits; Apr2004, Vol. 39 Issue 4, p678-683, 6p
-
5كتاب إلكتروني