المؤلفون: Jayaraman, B., Leu, D., Viraraghavan, J., Cestero, A., Yin, M., Golz, J., Tummuru, R.R., Raghavan, R., Moy, D., Kempanna, T., Khan, F., Kirihata, T., Iyer, S.S.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 53(3):949-960 Mar, 2018

المؤلفون: Kirihata, T., Golz, J., Wordeman, M., Batra, P., Maier, G. W., Robson, N., Graves-abe, T. L., Berger, D., Iyer, S. S.

المصدر: IEEE Journal on Emerging and Selected Topics in Circuits and Systems IEEE J. Emerg. Sel. Topics Circuits Syst. Emerging and Selected Topics in Circuits and Systems, IEEE Journal on. 6(3):373-384 Sep, 2016

المؤلفون: Klim, P. J., Barth, J., Reohr, W. R., Dick, D., Fredeman, G., Koch, G., Le, H. M., Khargonekar, A., Wilcox, P., Golz, J., Kuang, J. B., Mathews, A., Law, J. C., Luong, T., Ngo, H. C., Freese, R., Hunter, H. C., Nelson, E., Parries, P., Kirihata, T., Iyer, S. S.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 44(4):1216-1226 Apr, 2009

المؤلفون: Barth, J., Reohr, W. R., Parries, P., Fredeman, G., Golz, J., Schuster, S. E., Matick, R. E., Hunter, H., Tanner, C. C., Harig, J., Kim, H., Khan, B. A., Griesemer, J., Havreluk, R. P., Yanagisawa, K., Kirihata, T., Iyer, S. S.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 43(1):86-95 Jan, 2008

المؤلفون: Golz, J., Martin, A., Chen, B.

المصدر: 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI. :300-304 1997

Relation: 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings

المؤلفون: Kirihata, T., Parries, P., Hanson, D.R., Hoki Kim, Golz, J., Fredeman, G., Rajeevakumar, R., Griesemer, J., Robson, N., Cestero, A., Khan, B.A., Geng Wang, Wordeman, M., Iyer, S.S.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 40(6):1377-1387 Jun, 2005

المؤلفون: Barth, J., Reohr, W., Parries, P., Fredeman, G., Golz, J., Schuster, S., Matick, R., Hunter, H., Tanner, C., Harig, J., Kim, H., Khan, B., Griesemer, J., Havreluk, R., Yanagisawa, K., Kirihata, T., Iyer, S.

المصدر: 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International. :486-617 Feb, 2007

Relation: 2007 IEEE International Solid-State Circuits Conference

المؤلفون: Kothandaraman, C., Cohen, S., Parks, C., Golz, J., Tunga, K., Rosenblatt, S., Safran, J., Collins, C., Landers, W., Oakley, J., Liu, J., Martin, A.J., Petrarca, K., Farooq, M., Graves-Abe, T. L., Robson, N., Iyer, S.S.

المصدر: 2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :14.6.1-14.6.3 Dec, 2014

Relation: 2014 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Kothandaraman, C., Himmel, B., Safran, J., Golz, J., Maier, G., Farooq, M. G., Graves-Abe, T., Landers, W., Volant, R., Petrarca, K., Chen, F., Sullivan, T.D., LaRosa, G., Robson, N., Hannon, R., Iyer, S. S.

المصدر: 2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :2B.1.1-2B.1.4 Apr, 2012

Relation: 2012 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Kirihata, T., Parries, P., Hanson, D., Kim, H., Golz, J., Fredeman, G., Rajeevakumar, R., Griesemer, J., Robson, N., Cestero, A., Wordeman, M., Iyer, S.

المصدر: 2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519) Solid-state circuits Solid-State Circuits Conference, 2004. Digest of Technical Papers. ISSCC. 2004 IEEE International. :206-523 Vol.1 2004

Relation: 2004 IEEE International Solid-State Circuits Conference