يعرض 1 - 10 نتائج من 63 نتيجة بحث عن '"Gonon, Patrice"', وقت الاستعلام: 1.11s تنقيح النتائج
  1. 1
    مؤتمر
    Innovative switching mechanism, performance investigations and scaling effects in a-V2O3 based ReRAM devices

    المؤلفون: Veyret, Killian, Laborie, Leo, Bon, Romain, Navaro, Gabriele, Hida, Rachid, Castellani, Niccolo, Carabasse, Catherine, Gonon, Patrice, Jalaguier, Eric

    المصدر: 2024 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2024 IEEE. :81-82 Jun, 2024

    Relation: 2024 IEEE Silicon Nanoelectronics Workshop (SNW)

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  2. 2
    مؤتمر
    Electrical and optical localisation of leakage current and breakdown point in SiOC:H low-k dielectrics

    المؤلفون: Vidal-Dho, Matthias, Hubert, Quentin, Gonon, Patrice, Pelissier, Bernard, Lentrein, Philippe, Ray, Patrice, Moragues, Jean-Michel, Fornara, Pascal

    المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-4 May, 2020

    Relation: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

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  3. 3
    مؤتمر
    Moisture Influence on Reliability and Electrical Characteristics of SiOC:H Low-k Dielectric Material

    المؤلفون: Vidal-Dho, Matthias, Hubert, Quentin, Gonon, Patrice, Pelissier, Bernard, Fornara, Pascal, Escales, Jean-Philippe, Potard, Pascale, Moragues, Jean-Michel, Ogier, Jean-Luc

    المصدر: 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-4 Oct, 2019

    Relation: 2019 IEEE International Integrated Reliability Workshop (IIRW)

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  4. 4
    مؤتمر
    Probing impact on pad moisture tightness: A challenge for pad size reduction

    المؤلفون: Vidal-Dho, Matthias, Hubert, Quentin, Gonon, Patrice, Delorme, Philippe, Jacquot, Jonathan, Marchetti, Maxime, Beauvisage, Ludovic, Moragues, Jean-Michel, Potard, Pascale, Fornara, Pascal, Escales, Jean-Philippe, Sallagoity, Pascal, Pizzuto, Olivier, Maury, Delphine, Mirabel, Jean-Michel

    المصدر: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2019 IEEE 32nd International Conference on. :176-179 Mar, 2019

    Relation: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)

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  5. 5
    مؤتمر
    A fully passive RF switch based on nanometric conductive bridge

    المؤلفون: Vena, Arnaud, Perret, Etienne, Tedjini, Smail, Vallee, Christophe, Gonon, Patrice, Mannequin, Cedric

    المصدر: 2012 IEEE/MTT-S International Microwave Symposium Digest Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International. :1-3 Jun, 2012

    Relation: 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

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  6. 6
    مؤتمر
    Comparing the switching characteristics of two resistive RAM technologies: Cu-SiO2 conductive-bridging-RAMs and HfO2 Oxide-RAMs

    المؤلفون: Gonon, Patrice, Vallee, Christophe, Jousseaume, Vincent, Bernard, Yoann, Mannequin, Cedric, Mougenot, Mathieu, Grampeix, Helen

    المصدر: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on. :1124-1126 Nov, 2010

    Relation: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

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  7. 7
    دورية أكاديمية
    AC and DC bias effect on capacitance–voltage nonlinearities in Au/HfO2/M (M = Pt, TiN, W, and AlCu) MIM capacitors: effect of the bottom electrode material

    المؤلفون: Khaldi, OthmenAff1, Jomni, Fathi, Gonon, Patrice, Vallée, Christophe

    المصدر: Journal of Materials Science: Materials in Electronics. 31(21):19036-19043

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  8. 8
    دورية أكاديمية
    Graphene-HfO2-based resistive RAM memories

    المؤلفون: Mannequin, Cédric, Delamoreanu, Alexandru, Latu-Romain, Laurence, Jousseaume, Vincent, Grampeix, Helen, David, Sylvain, Rabot, Caroline, Zenasni, Aziz, Vallee, Christophe, Gonon, Patrice

    المصدر: In Microelectronic Engineering 1 August 2016 161:82-86

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  9. 9
    An Empirical Investigation on the Effect of Oxygen Vacancy in ZrO₂ Thin Film on the Frequency-Dependent Capacitance Degradation in the Metal-Insulator-Metal Capacitor

    المؤلفون: Han, Dong Hee, Lee, Seungwoo, Hwang, Ji Hyeon, Kim, Youngjin, Bonvalot, Marceline, Vallee, Christophe, Gonon, Patrice, Jeon, Woojin

    المساهمون: Laboratoire des technologies de la microélectronique (LTM ), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)

    المصدر: IEEE Transactions on Electron Devices
    IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2021, 68 (11), pp.1-5. ⟨10.1109/TED.2021.3110837⟩
    IEEE Transactions on Electron Devices, 2021, 68 (11), pp.1-5. ⟨10.1109/TED.2021.3110837⟩

    مصطلحات موضوعية: [PHYS]Physics [physics], ComputingMilieux_MISCELLANEOUS

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::b5a755b087f5c28657d0bcf0ea39557b
    https://hal.univ-grenoble-alpes.fr/hal-03448315

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  10. 10
    Filamentary type non-volatile memory device

    المؤلفون: Navarro, Gabriele, Guillaume, Nicolas, Blonkowski, Serge, Gonon, Patrice, Jalaguier, Eric

    المساهمون: Laboratoire des technologies de la microélectronique (LTM ), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Clot, Marielle

    المصدر: United States, Patent n° : 17/006,041. 2021

    مصطلحات موضوعية: [PHYS]Physics [physics], mental disorders, [PHYS] Physics [physics]

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::9ab3c0fd2c2f2cd935384377d04b0371
    https://hal.univ-grenoble-alpes.fr/hal-03448326

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