المؤلفون: Rideau, D., Uhring, W., Bianchi, R. A., Helleboid, R., Mugny, G., Grebot, J., Manouvrier, J.R., Neri, R., Brun, F., Lakeh, M. Dolatpoor, Rink, S., Kammerer, J-B., Lallement, C., Lacombe, E., Golanski, D., Rae, B., Bah, T. M., Twaddle, F., Quenette, V., Marchand, G., Buj, C., Fillon, R., Henrion, Y., Nicholson, I., Agnew, M., Basset, M., Perrier, R., Al-Rawhani, M., Mamdy, B., Pellegrin, S., Gouget, G., Maciazek, P., Juge, A., Dartigues, A., Alause, H. Wehbe

المصدر: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :144-147 Sep, 2023

Relation: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Rink, S., Quenette, V., Manouvrier, J.R., Juge, A., Gouget, G., Rideau, D., Bianchi, R.A., Golanski, D., Mamdy, B., Kammerer, J.B., Uhring, W., Lallement, C., Pellegrini, S., Agnew, M., Rae, B.

المصدر: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2022 - IEEE 52nd European. :281-284 Sep, 2022

Relation: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Pradeep, Krishna, Karatsori, T. A., Poiroux, T., Juge, A., Scheer, P., Gouget, G., Josse, E., Ghibando, G.

المصدر: 2018 48th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2018 48th European. :242-245 Sep, 2018

Relation: ESSDERC 2018 - 48th European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Juge, A., Franco, J., Gouget, G., Scheer, P., Poiroux, Thierry

المصدر: 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2016 International Conference on. :7-14 Sep, 2016

Relation: 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

المؤلفون: El Ghouli, S., Rideau, D., Monsieur, F., Scheer, P., Gouget, G., Juge, A., Poiroux, T., Sallese, J., Lallement, C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(1):11-18 Jan, 2018

المؤلفون: Rideau, D., Monsieur, F., Nier, O., Niquet, Y. M., Lacord, J., Quenette, V., Mugny, G., Hiblot, G., Gouget, G., Quoirin, M., Silvestri, L., Nallet, F., Tavernier, C., Jaouen, H.

المصدر: 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on. :101-104 Sep, 2014

Relation: 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

المؤلفون: Monsieur, F., Denis, Y., Rideau, D., Quenette, V., Gouget, G., Tavernier, C., Jaouen, H., Ghibaudo, G., Lacord, J.

المصدر: 2014 44th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2014 44th European. :254-257 Sep, 2014

Relation: ESSDERC 2014 - 44th European Solid State Device Research Conference

المؤلفون: Rideau, D., Dray, A., Gilibert, F., Agut, F., Giguerre, L., Gouget, G., Minondo, M., Juge, A.

المصدر: Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :149-154 2004

Relation: Proceedings of the 2004 International Conference on Microelectronic Test Structures

المؤلفون: Rideau, D., Scheer, P., Roy, D., Gouget, G., Minondo, M., Juge, A.

المصدر: International Conference on Microelectronic Test Structures, 2003. Microelectronic test structures Microelectronic Test Structures, 2003. International Conference on. :191-196 2003

Relation: ICMTS 2002. Proceedings of the 2003 International Conference on Microelectronic Test Structures

المؤلفون: Minondo, M., Gouget, G., Juge, A.

المصدر: ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :263-267 2001

Relation: ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures