المؤلفون: Lu, J.P., Miles, D.S., DeLoach, J., Yue, D.F., Chen, P.J., Bonifield, T., Crank, S., Yu, S.F., Mehrad, F., Obeng, Y., Ramappa, D.A., Corum, D., Guldi, R.L., Robertson, L.S., Liu, X., Hall, L.H., Xu, Y.Q., Lin, B.Y., Griffin, A.J., Johnson, F.S., Grider, T., Mercer, D., Montgomery, C.

المصدر: 2006 International Workshop on Junction Technology Junction Technology, 2006. IWJT '06. International Workshop on. :127-133 2006

Relation: 2006 International Workshop on Junction Technology

المؤلفون: Campbell, J.P., Boyer, M., Griffin, A.J., Imam, Z., Lee, H., Montgomery, C., Pak, R., Vialpando, B.

المصدر: 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259) Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop. :368-371 2002

Relation: 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002

المؤلفون: Tsui, T.Y., Griffin, A.J., Jr., Jacques, J., Fields, R., McKerrow, A.J., Kraft, R.

المصدر: Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005. Interconnect technology Interconnect Technology Conference, 2005. Proceedings of the IEEE 2005 International. :63-65 2005

Relation: Proceedings of the IEEE 2005 International Interconnect Technology Conference

المؤلفون: Griffin, A.J., Jr., Hernandez, S.E., Brotzen, F.R., Lawrence, J.D., McPherson, J.W., Dunn, C.F.

المصدر: 31st Annual Proceedings Reliability Physics 1993 Reliability Physics Symposium, 1993. 31st Annual Proceedings., International. :327-333 1993

Relation: Proceedings of IEEE International Reliability Physics Symposium

المؤلفون: Griffin, A.J., Jr., Brotzen, F.R., McPherson, J.W., Dunn, C.F.

المصدر: 30th Annual Proceedings Reliability Physics 1992 Reliability Physics Symposium 1992. 30th Annual Proceedings., International. :239-246 1992

Relation: 1992 30th Annual Proceedings Reliability Physics

المؤلفون: Callahan, D.L., Yang, H., Brotzen, F.R., Griffin, A.J., Jr., Dunn, C.F.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 19(3):65-67 Mar, 1998

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Griffin, A.J.

المصدر: IEEE Transactions on Engineering Management IEEE Trans. Eng. Manage. Engineering Management, IEEE Transactions on. 36(2):148-154 May, 1989

المؤلفون: Tsui, Ting Y., Griffin, A.J., Jr., Fields, Russell, Jacques, Jeannette M., McKerrow, Andrew J., Vlassak, Joost J.

المصدر: In Thin Solid Films 5 December 2006 515(4):2257-2261