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1مؤتمر
المؤلفون: Park, Jongwoo, Gunrae Kim, Ming Zhang, Kyungsik Park, Miji Lee, Ilgon Kim, Jongsun Bae, Sangwoo Pae, Jinwoo Choi, Dongsuk Shin, Nae-In Lee, Kee Sup Kim
المصدر: 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :2B.4.1-2B.4.3 Jun, 2014
Relation: 2014 IEEE International Reliability Physics Symposium (IRPS)
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2
المؤلفون: Jaehee Choi, Seungbae Lee, Mijoung Kim, Brandon Lee, Jeongmin Jo, Dalhee Lee, Taesjoong Song, Byungjin Chung, Gunrae Kim, Hwa-Sung Rhee, Taiki Uemura
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Random access memory, Materials science, 010308 nuclear & particles physics, business.industry, Extreme ultraviolet lithography, 01 natural sciences, Upset, law.invention, Soft error, law, 0103 physical sciences, Optoelectronics, Static random-access memory, business, Flip-flop
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::91bd174cab3981c9026ccef7955619b5
https://doi.org/10.1109/irps46558.2021.9405101 -
3
المؤلفون: Kangjung Kim, Gunrae Kim, Yoohwan Kim, Hyewon Shim, Sangwoo Pae, Jinju Kim, Minjung Jin
المصدر: Microelectronics Reliability. 81:201-209
مصطلحات موضوعية: Materials science, business.industry, 020208 electrical & electronic engineering, Transistor, 02 engineering and technology, Ring oscillator, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, 020202 computer hardware & architecture, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Reliability (semiconductor), Stack (abstract data type), Modulation, law, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Static random-access memory, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, High-κ dielectric, Electronic circuit
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4
المؤلفون: Il-gon Kim, Gunrae Kim, Sanghyeon Baeg, Sang Hoon Jeon, Soonyoung Lee
المصدر: IEEE Transactions on Nuclear Science. 61:2711-2717
مصطلحات موضوعية: Nuclear and High Energy Physics, Interleaving, Computer science, Concatenated error correction code, Upset, Multidimensional parity-check code, Soft error, Nuclear Energy and Engineering, Electronic engineering, Turbo code, Static random-access memory, Electrical and Electronic Engineering, Error detection and correction, Algorithm
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5
المؤلفون: Sangsu Ha, Sangkwon Park, Miji Lee, Gunrae Kim, Sang-chul Shin, Han-Byul Kang, Sangwoo Pae
المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
مصطلحات موضوعية: 010302 applied physics, Materials science, Scanning electron microscope, Intermetallic, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Tetragonal crystal system, Crystallography, Nickel, chemistry, Transmission electron microscopy, Soldering, 0103 physical sciences, X-ray crystallography, Orthorhombic crystal system, 0210 nano-technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::aa09e221ee88459280516f5f2d02b961
https://doi.org/10.1109/ipfa.2017.8060200 -
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المؤلفون: Taiki Uemura, Jungin Kim, Jinju Kim, Hyun Chul Sagong, Gunrae Kim, Ukjin Jung, Changze Liu, Sangwoo Pae, Sang-chul Shin, Junekyun Park, Minjung Jin
المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: 010302 applied physics, Engineering, Variation (linguistics), business.industry, 0103 physical sciences, Electronic engineering, Node (circuits), Static random-access memory, business, 01 natural sciences, Reliability (statistics), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9895eb26a05ceb92006dad815918217e
https://doi.org/10.1109/irps.2017.7936416 -
7
المؤلفون: Gunrae Kim, Soonyoung Lee, Sangwoo Pae, Taiki Uemura
المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: 010302 applied physics, Design modification, Engineering, Hardware_MEMORYSTRUCTURES, 010308 nuclear & particles physics, business.industry, Hardware_PERFORMANCEANDRELIABILITY, 01 natural sciences, Soft error, Error analysis, Scaling effect, Logic gate, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Technology scaling, Electronic engineering, Static random-access memory, Hardware_ARITHMETICANDLOGICSTRUCTURES, business, Scaling, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::282b105f4513d9b9d7074e99359907f8
https://doi.org/10.1109/irps.2017.7936269 -
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المؤلفون: Junekyun Park, Taiki Uemura, Taehyun An, Soonyoung Lee, Sangwoo Pae, Man Chang, Minjung Jin, Jinju Kim, Changze Liu, Jungin Kim, Kangjung Kim, Hyewon Shim, Gunrae Kim
المصدر: 2016 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, 020208 electrical & electronic engineering, Transistor, Electrical engineering, Time-dependent gate oxide breakdown, 02 engineering and technology, 01 natural sciences, PMOS logic, law.invention, Reliability (semiconductor), Stack (abstract data type), law, Logic gate, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Node (circuits), Static random-access memory, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9958675bab4dfade9e2c908d044ef77b
https://doi.org/10.1109/iedm.2016.7838420 -
9
المؤلفون: Gunrae Kim, Jongwoo Park, Yong-Bum Jo, Junekyun Park
المصدر: IEEE Transactions on Device and Materials Reliability. 8:368-374
مصطلحات موضوعية: Resistive touchscreen, Auger electron spectroscopy, Materials science, Electronic packaging, Analytical chemistry, Molding (process), Electronic, Optical and Magnetic Materials, Stress (mechanics), Dendrite (crystal), Adhesive, Electrical and Electronic Engineering, Quad Flat Package, Composite material, Safety, Risk, Reliability and Quality
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10
المؤلفون: Gunrae Kim, Nae-In Lee, Kyungsik Park, Miji Lee, Ming Zhang, Sangwoo Pae, Jinwoo Choi, Dong-Suk Shin, Jongwoo Park, Il-gon Kim, Jongsun Bae, Kee Sup Kim
المصدر: 2014 IEEE International Reliability Physics Symposium.
مصطلحات موضوعية: Materials science, Soft error, law, Nuclear engineering, Transistor, Thermal, Electronic engineering, Neutron, Static random-access memory, Metal gate, Neutron temperature, law.invention, High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1d8a115c245eda64dc5dff51504d177f
https://doi.org/10.1109/irps.2014.6860587