المؤلفون: Chuang, Shun-Pin, Guo, Jia-Yu, Tian, Xiu-Jia, Xiao, Bing-Hong, Kuo, Szu-Yu, Chen, Liang-Bi

المصدر: 2022 IEEE 11th Global Conference on Consumer Electronics (GCCE) Consumer Electronics (GCCE), 2022 IEEE 11th Global Conference on. :557-558 Oct, 2022

Relation: 2022 IEEE 11th Global Conference on Consumer Electronics (GCCE)

المؤلفون: Huang, Tian-Hsiang, Guo, Jia-Yu, Hsieh, Meng-Heng, Chen, Liang-Bi

المصدر: 2022 IEEE International Conference on Consumer Electronics - Taiwan Consumer Electronics - Taiwan, 2022 IEEE International Conference on. :371-372 Jul, 2022

Relation: 2022 IEEE International Conference on Consumer Electronics - Taiwan

المؤلفون: Wang, Zhao, Wang, Ben-Ran, Ma, Qing-Lin, Guo, Jia-Yu, Li, Ming-Shen, Wang, Yu, Rao, Xin-Xin, Huang, Zhi-Qi, Luo, Le

مصطلحات موضوعية: Quantum Physics, Physics - Atomic Physics

URL الوصول: http://arxiv.org/abs/2004.08845

المؤلفون: Guo, Jia Yu, Li Zhang, Wei, Rao, Yun Jiang, Hui Zhang, Hua, Ma, Rui, Lins, Izabella C. X., Lopes, Daniela S., Gomes, Anderson S. L.

المصدر: 2019 18th International Conference on Optical Communications and Networks (ICOCN) Optical Communications and Networks (ICOCN), 2019 18th International Conference on. :1-2 Aug, 2019

Relation: 2019 18th International Conference on Optical Communications and Networks (ICOCN)

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المؤلفون: Wang, Dan-Dan, Zhu, Qiu-Meng, Song, Li, Guo, Jia-Yu, Shen, Hang-Yan, Wang, Xiao-Rong, Chai, Wen-Xiang

المصدر: In Polyhedron 1 January 2020 175

المؤلفون: Jiang, Yu-Xiang, Wang, You-Yu, Song, Li^Aff2, Wang, Dan-Dan, Guo, Jia-Yu, Shen, Hang-Yan, Wang, Xiao-Rong, Chai, Wen-Xiang^Aff1

المصدر: Journal of Cluster Science: Including Nanoclusters and Nanoparticles. 30(6):1443-1454

المؤلفون: Lin, Chen-Fu, Tsai, Hann-Huei, Juang, Ying-Zong, Su, Yan-Kuin, Li, Wang-Long, Wang, Ruey-Lue, Lin, Hung-Yin, Guo, Jia-Yu, Tsai, Tian-Jun, Liu, Bin-Da

المصدر: 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on. :1-4 Apr, 2009

Relation: 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis

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