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المؤلفون: Dominique Schreurs, Konstanty Lukasik, Dylan F. Williams, Jerome Cheron, Gustavo Avolio, Wojciech Wiatr, Arkadiusz Lewandowski
المصدر: IEEE transactions on microwave theory and techniques. 68(8)
مصطلحات موضوعية: Physics, Radiation, Load pull, Phase (waves), 020206 networking & telecommunications, 02 engineering and technology, Fundamental frequency, Mechanics, Condensed Matter Physics, Signal, Power (physics), 0202 electrical engineering, electronic engineering, information engineering, Measurement uncertainty, Electrical and Electronic Engineering, Reflection coefficient, Voltage
وصف الملف: Print
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المؤلفون: Paolo Colantonio, Valeria Vadala, M. Marchetti, Rocco Giofre, Gianni Bosi, Giorgio Vannini, Ernesto Limiti, Antonio Raffo, Gustavo Avolio
المساهمون: Bosi, G, Raffo, A, Vadalà, V, Vannini, G, Avolio, G, Marchetti, M, Giofre', R, Colantonio, P, Limiti, E
المصدر: 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC).
مصطلحات موضوعية: Materials science, power amplifier, Settore ING-INF/01, semiconductor device measurement, load pull measurement, 02 engineering and technology, Electron, NO, law.invention, Harmonic analysis, Computer Science::Hardware Architecture, law, load pull measurements, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, semiconductor device measurements, Electrical impedance, business.industry, Plane (geometry), Amplifier, Load pull, Transistor, 020206 networking & telecommunications, Optoelectronics, power amplifiers, load pull measurements, power amplifiers, semiconductor device measurements, business, Microwave
وصف الملف: ELETTRONICO
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cbd164549cf7b42f489bb4a8e6d683d7
https://doi.org/10.1109/inmmic46721.2020.9160151 -
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المؤلفون: M. Marchetti, Gustavo Avolio, Ajay K. Doggalli, Michele Squillante
المصدر: BCICTS
مصطلحات موضوعية: Impedance control, Computer science, System of measurement, Load pull, Electronic engineering, Mixed-signal integrated circuit, Input impedance, Wideband, Communications system, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::476610ba2d1f41df68a4a43576f944f1
https://doi.org/10.1109/bcicts45179.2019.8972744 -
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المؤلفون: Dominique Schreurs, Troels Studsgaard Nielsen, Konstanty Lukasik, David A. Humphreys, Pawel Barmuta, Gustavo Avolio, Mohammad Rajabi
المصدر: Rajabi, M, Humphreys, D, Avolio, G, Barmuta, P, Lukasik, K R, Nielsen, T S & Schreurs, D 2018, ' Design and Evaluation of Nonlinear Verification Device for Nonlinear Vector Network Analyzers ', IEEE Transactions on Microwave Theory and Techniques, vol. 66, no. 2, pp. 1121-1130 . https://doi.org/10.1109/TMTT.2017.2762659
مصطلحات موضوعية: Radiation, Computer science, 020206 networking & telecommunications, 02 engineering and technology, Condensed Matter Physics, Stability (probability), Harmonic analysis, Nonlinear system, 0202 electrical engineering, electronic engineering, information engineering, Calibration, Electronic engineering, Figure of merit, Sensitivity (control systems), Electrical and Electronic Engineering, Electrical impedance, Simulation, Diode
وصف الملف: application/pdf
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المؤلفون: Dominique Schreurs, M. Marchetti, Valeria Vadala, Gustavo Avolio, Giorgio Vannini, Antonio Raffo
المساهمون: Vadala', V, Raffo, A, Avolio, G, Marchetti, M, Schreurs, D, Vannini, G
المصدر: IEEE Transactions on Microwave Theory and Techniques. 65:218-228
مصطلحات موضوعية: Transistor model, Materials science, 02 engineering and technology, harmonic load–pull measurements, Dynamic bia, 01 natural sciences, Signal, NO, FETs, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, semiconductor device measurements, Electrical and Electronic Engineering, Dynamic bias, FETs, harmonic load–pull measurements, nonlinear measurements, nonlinear models, semiconductor device measurements, 010302 applied physics, Radiation, business.industry, Dynamic bias, nonlinear measurement, System of measurement, Electrical engineering, FET, 020206 networking & telecommunications, Condensed Matter Physics, Nonlinear system, Identification (information), Frequency dispersion, nonlinear model, nonlinear measurements, harmonic load–pull measurement, business, nonlinear models
وصف الملف: STAMPA
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المساهمون: Avolio, G, Raffo, A, Vadala', V, Vannini, G, Schreurs, D
المصدر: IEEE Transactions on Microwave Theory and Techniques. 64:3946-3955
مصطلحات موضوعية: Dynamic-bia, Engineering, S-parameter, Condensed Matter Physic, 02 engineering and technology, High-electron-mobility transistor, 01 natural sciences, Dynamic-bias, large-signal network analyzer (LSNA), microwave transistors, nonlinear measurements, S-parameters, Condensed Matter Physics, Electrical and Electronic Engineering, Dynamic-bias, NO, law.invention, large-signal network analyzer (LSNA), law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Scattering parameters, microwave transistor, Point (geometry), S-parameters, Electrical and Electronic Engineering, Monolithic microwave integrated circuit, 010302 applied physics, Operating point, Radiation, Scattering, business.industry, nonlinear measurement, microwave transistors, Transistor, 020206 networking & telecommunications, Condensed Matter Physics, Computational physics, Nonlinear system, nonlinear measurements, ING-INF/01 - ELETTRONICA, business
وصف الملف: STAMPA
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المؤلفون: Dominique Schreurs, Giovanni Crupi, Valeria Vadala, Giorgio Vannini, Antonio Raffo, Gustavo Avolio, Alina Caddemi
المساهمون: Crupi, G, Raffo, A, Vadala, V, Avolio, G, Schreurs, D, Vannini, G, Caddemi, A
المصدر: IEEE Microwave and Wireless Components Letters. 28:326-328
مصطلحات موضوعية: Current-gain peak (CGP), Materials science, Gallium nitride, 02 engineering and technology, High-electron-mobility transistor, Impedance parameters, 01 natural sciences, Capacitance, NO, chemistry.chemical_compound, scattering parameter, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Electrical impedance, 010302 applied physics, Current-gain peak (CGP), Equivalent circuit, Scattering parameters, Semiconductor device modeling, Temperature, business.industry, equivalent circuit, temperature, Resonance, 020206 networking & telecommunications, Condensed Matter Physics, chemistry, Extremely high frequency, Optoelectronics, Current (fluid), business, semiconductor device modeling, scattering parameters
وصف الملف: STAMPA
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المؤلفون: Gustavo Avolio, Dylan F. Williams, Paul D. Hale, Alirio Boaventura
المصدر: 2019 IEEE MTT-S International Microwave Symposium (IMS).
مصطلحات موضوعية: Physics, Frequency response, Amplitude, Sampling (signal processing), Acoustics, Frequency domain, 0202 electrical engineering, electronic engineering, information engineering, Calibration, 020206 networking & telecommunications, 02 engineering and technology, Oscilloscope, Network analyzer (electrical), Signal
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6ca5f72f852e8cc75f7d5ff723891cf1
https://doi.org/10.1109/mwsym.2019.8700742 -
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المؤلفون: Gianni Bosi, Giorgio Vannini, Antonio Raffo, Valeria Vadala, M. Marchetti, Gustavo Avolio
المساهمون: Avolio, G, Raffo, A, Marchetti, M, Bosi, G, Vadalà, V, Vannini, G
مصطلحات موضوعية: Computer science, Computer Science::Neural and Evolutionary Computation, Extrapolation, CAD, 02 engineering and technology, Electronic circuit simulation, NO, law.invention, law, frequency-domain, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, PE7_5, Simulation, Artificial neural network, high-frequency load-pull, 020208 electrical & electronic engineering, Load pull, Transistor, 020206 networking & telecommunications, look-up table, Frequency domain, active load-pull, Lookup table, artificial neural network, Hardware_LOGICDESIGN
وصف الملف: ELETTRONICO
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5d5729c388e6a8e21e2e7e72574020c6
http://hdl.handle.net/10281/343340 -
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المصدر: 2019 92nd ARFTG Microwave Measurement Conference (ARFTG).
مصطلحات موضوعية: Computer science, Amplifier, System of measurement, 020208 electrical & electronic engineering, Load pull, 020206 networking & telecommunications, Mixed-signal integrated circuit, 02 engineering and technology, Input impedance, Impedance control, 0202 electrical engineering, electronic engineering, information engineering, Baseband, Electronic engineering, Wideband
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b76971b097e67567496804e553d8debf
https://doi.org/10.1109/arftg.2019.8637240