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1دورية أكاديمية
المؤلفون: H. Yang, R. N. Rutte, L. Jones, M. Simson, R. Sagawa, H. Ryll, M. Huth, T. J. Pennycook, M.L.H. Green, H. Soltau, Y. Kondo, B. G. Davis, P. D. Nellist
المصدر: Nature Communications, Vol 7, Iss 1, Pp 1-8 (2016)
مصطلحات موضوعية: Science
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2041-1723
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المؤلفون: A. Rauguth, A. Alhassanat, H. Elnaggar, A. A. Athanasopoulou, C. Luo, H. Ryll, F. Radu, T. Mashoff, Frank M. F. de Groot, E. Rentschler, H. J. Elmers
المصدر: Physical Review B. 105
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4ef40fd8221a7843af44c446a5613378
https://doi.org/10.1103/physrevb.105.134415 -
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المؤلفون: H. Ryll, Heike Soltau, Martin Simson, Florian F. Krause, Knut Müller-Caspary, Dennis Marquardt, Robert Ritz, Marco Schowalter, Andreas Rosenauer, Oliver Oppermann, Martin Huth
المصدر: Ultramicroscopy 223, 113221-(2021). doi:10.1016/j.ultramic.2021.113221
مصطلحات موضوعية: 010302 applied physics, Materials science, Spectrometer, business.industry, Detector, Faraday cup, 02 engineering and technology, Electron, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, symbols.namesake, Optics, ddc:570, 0103 physical sciences, Cathode ray, symbols, 0210 nano-technology, business, Electron counting, Instrumentation, Ultrashort pulse, Beam (structure)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::224c59da934c96a4ba7e10730384df86
https://hdl.handle.net/2128/28578 -
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المؤلفون: Martin Huth, Ian M. Griffiths, Robert Ritz, Peter D. Nellist, Colum M. O'Leary, Yukihito Kondo, Ryusuke Sagawa, Heike Soltau, Lothar Strüder, H. Ryll
المصدر: Microscopy and Microanalysis. 25:1654-1655
مصطلحات موضوعية: Materials science, Electron, Atomic physics, Instrumentation
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المؤلفون: Martin Simson, Heike Soltau, Robert Hartmann, Lothar Strüder, H. Ryll, Peter D. Nellist, Ryusuke Sagawa, Yukihito Kondo, Martin Huth, Vadim Migunov, Rafal E. Dunin-Borkowski, Hao Yang, Julia Schmidt, Lewys Jones, Sebastian Ihle, Robert Ritz
مصطلحات موضوعية: Computer science, Computer graphics (images), Data mining, Tomography, computer.software_genre, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0f108d50a9d5970b33f7a70ce918aa98
https://doi.org/10.1002/9783527808465.emc2016.5295 -
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المؤلفون: Heike Soltau, Rowan K. Leary, Rafal E. Dunin-Borkowski, Paul A. Midgley, Sebastian Ihle, Martial Duchamp, Julia Schmidt, Lothar Strüder, H. Ryll, Martin Huth, Duncan N. Johnstone, Robert Ritz, Vadim Migunov, Martin Simson
مصطلحات موضوعية: Diffraction, Optics, Materials science, Scanning electron microscope, business.industry, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b583f3e87cbf221aab94a7d23a401a34
https://doi.org/10.1002/9783527808465.emc2016.5224 -
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المؤلفون: Heike Soltau, Martin Simson, Lothar Strüder, H. Ryll, Martial Duchamp, Rafal E. Dunin-Borkowski, Sebastian Ihle, Robert Ritz, Vadim Migunov, Martin Huth
مصطلحات موضوعية: Computer science, business.industry, Computer graphics (images), Electric field, Computer vision, Artificial intelligence, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::515fccf08598426d01c559cddc274d99
https://doi.org/10.1002/9783527808465.emc2016.6328 -
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المؤلفون: Lothar Strüder, Sebastian Ihle, Martin Huth, Robert Ritz, Rafal E. Dunin-Borkowski, Martin Simson, Vadim Migunov, Martial Duchamp, Heike Soltau, H. Ryll
المصدر: Microscopy and microanalysis 22(S3), 256-257 (2016). doi:10.1017/S1431927616002130
Microscopy and Microanalysis, Columbus, OH, 2016-07-24-2016-07-28مصطلحات موضوعية: 010302 applied physics, Optics, Materials science, business.industry, ddc:570, 0103 physical sciences, 02 engineering and technology, 021001 nanoscience & nanotechnology, 0210 nano-technology, business, 01 natural sciences, Instrumentation, Magnetic field
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f8e80f49804bf04a143b09699ff7c2cf
https://hdl.handle.net/2128/19359 -
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المؤلفون: Rafal E. Dunin-Borkowski, Ryusuke Sagawa, Martin Simson, Martin Huth, Robert Hartmann, H. Ryll, Vadim Migunov, Peter D. Nellist, Lothar Strüder, Heike Soltau, Yukihito Kondo, Robert Ritz, Hao Yang, Julia Schmidt, Lewys Jones, Sebastian Ihle
المصدر: Microscopy and microanalysis 22(S3), 512-513 (2016). doi:10.1017/S143192761600341X
Microscopy and Microanalysis, Columbus, OH, 2016-07-24-2016-07-28مصطلحات موضوعية: Materials science, ddc:570, 0202 electrical engineering, electronic engineering, information engineering, 020201 artificial intelligence & image processing, 02 engineering and technology, Tomography, 021001 nanoscience & nanotechnology, 0210 nano-technology, Instrumentation, Biomedical engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3ef19d2d4c1b9e7651a79dd24db09ef6
https://juser.fz-juelich.de/record/827202 -
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المؤلفون: Lothar Striider, Peter D. Nellist, Yukihito Kondo, Martin Simson, Heike Soltau, Robert Ritz, Martin Hum, Hao Yang, Julia Schmidt, H. Ryll, Ryusuke Sagawa
المصدر: Microscopy and Microanalysis. 23:58-59
مصطلحات موضوعية: 0301 basic medicine, 03 medical and health sciences, 030104 developmental biology, Materials science, 010308 nuclear & particles physics, 0103 physical sciences, 01 natural sciences, Instrumentation