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المؤلفون: H. Y. Ho, Asit Kumar Ray, Erh-Kun Lai, Kuo I-Ting, L. Buzi, Huai-Yu Cheng, Marinus Hopstaken, Wanki Kim, H.L. Lung, Fabio Carta, Y. C. Chou, C. W. Yeh, Christian Lavoie, Robert L. Bruce, Lynne Gignac, C. H. Yang, Wei-Chih Chien, Nanbo Gong, Cheng-Wei Cheng, Matthew J. BrightSky, Ming-Hsiu Lee
المصدر: 2020 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: Materials science, Memory window, Thermal stability, Cross point, Atomic physics, Memory array
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7ac84d3cba365a7eece8e43ff7939fb4
https://doi.org/10.1109/vlsitechnology18217.2020.9265039 -
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المؤلفون: C. W. Yeh, Erh-Kun Lai, Y. C. Chou, Wanki Kim, Robert L. Bruce, H.L. Lung, Yu-Yu Lin, Ning Li, Matthew J. BrightSky, C. H. Yang, Fabio Carta, Henry K. Utomo, Cheng-Wei Cheng, H. Y. Ho, Christopher P. Miller, Huai-Yu Cheng, L. Buzi, Asit Kumar Ray, Nanbo Gong, T. Perri, Lynne Gignac, Kuo I-Ting, Wei-Chih Chien
المصدر: 2020 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Very-large-scale integration, Multi-level cell, business.industry, Computer science, Transistor, 020207 software engineering, 02 engineering and technology, Chip, 01 natural sciences, Threshold voltage, law.invention, Phase-change memory, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, IBM, business, Joint (audio engineering), Computer hardware
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::09ee15f66231eef4a20d5debb82cbe6c
https://doi.org/10.1109/vlsitechnology18217.2020.9265020 -
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المؤلفون: D.-Y. Lee, C.H. Wang, Y.H. Lin, M.L. Wei, M.H. Lee, H.L. Lung, K.Y. Hsieh, K.C. Wang, C.Y. Lu
المصدر: Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Non-volatile memory, Materials science, business.industry, Embedded system, Neural network system, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b67d515be43eb7d01976b736d9140d2b
https://doi.org/10.7567/ssdm.2019.h-6-02 -
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المؤلفون: Y. F. Lin, M. Briahtxky, Y. C. Chou, Erh-Kun Lai, Huai-Yu Cheng, H.L. Lung, Cheng-Wei Cheng, C. H. Yang, Kuo I-Ting, A. Rav, Wei-Chih Chien, Nanbo Gong, Robert L. Bruce, Fabio Carta, C. W. Yeh, Lynne Gignac, H. Y. Ho, John M. Papalia, Wanki Kim
المصدر: 2019 Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Hardware_MEMORYSTRUCTURES, Computer science, business.industry, Electrical engineering, 02 engineering and technology, Chip, 01 natural sciences, Line (electrical engineering), 020202 computer hardware & architecture, Threshold voltage, 0103 physical sciences, Scalability, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Node (circuits), business, Tera, Scaling, Hardware_LOGICDESIGN, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c8b767e227d4c9052b3e492cc915f380
https://doi.org/10.23919/vlsit.2019.8776516 -
5Superb Endurance and Appropriate Vth of PCM Pillar Cell using Buffer Layer for 3D Cross-Point Memory
المؤلفون: Matthew J. BrightSky, Huai-Yu Cheng, N. Gang, Cheng-Wei Cheng, Erh-Kun Lai, C. W. Yeh, Asit Kumar Ray, Robert L. Bruce, H.L. Lung, Kuo I-Ting, L.M. Gignac, Fabio Carta, C. H. Yang, Wanki Kim, John M. Papalia, Wei-Chih Chien
المصدر: 2019 IEEE 11th International Memory Workshop (IMW).
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Memory array, Buffer (optical fiber), Threshold voltage, Phase-change memory, Reliability study, 0103 physical sciences, Electrode, Optoelectronics, Pillar Cell, Cross point, 0210 nano-technology, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8e89a34d21d4029032c2b0c898f1c5e8
https://doi.org/10.1109/imw.2019.8739477 -
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المؤلفون: Erh-Kun Lai, Robert L. Bruce, Huai-Yu Cheng, Fabio Carta, H.L. Lung, Wanki Kim, Lynne Gignac, Cheng-Wei Cheng, C. W. Yeh, Matthew J. BrightSky, Hiroyuki Miyazoe, Nanbo Gong, Asit Kumar Ray, Kuo I-Ting, Wei-Chih Chien, C. H. Yang, John M. Papalia
المصدر: 2019 IEEE 11th International Memory Workshop (IMW).
مصطلحات موضوعية: Phase-change memory, business.industry, Annealing (metallurgy), Reliability study, Optoelectronics, Degradation (geology), Cross point, Thermal treatment, business, Layer (electronics), Threshold voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::67b5a2c530a6a6f4b666c01999293fb1
https://doi.org/10.1109/imw.2019.8739648 -
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المؤلفون: Keh-Chung Wang, Feng-Ming Lee, Yu-Yu Lin, G.Y. Chen, Chun-Chang Lu, Po-Hao Tseng, K.Y. Hsieh, Meng-Chyi Wu, H.L. Lung, Dai-Ying Lee, Ming-Hsiu Lee, K.C. Hsu
المصدر: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).
مصطلحات موضوعية: Materials science, Reliability (semiconductor), business.industry, Optoelectronics, Data retention, business, Resistive random-access memory, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c42ca870061dcab74ec90149213f83f0
https://doi.org/10.1109/vlsi-tsa.2019.8804662 -
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المؤلفون: Kwok Hung Au, Valentin Baloche, Beth M. Beadle, Pierre Blanchard, Pierre Busson, Jason W. Chan, Jimmy Y.W. Chan, Yap-Hang Chan, Amy T.Y. Chang, Honglin Chen, Zhi-Jian Chen, A.K.S. Chiang, Chi Leung Chiang, Horace C.W. Choi, Vincent Chong, James C.H. Chow, Wei Dai, W. Deng, Andy Futreal, Fei Han, Sai-Yin Ho, S.C.M. Huang, Shao Hui Huang, K.F. Hui, Amit Jain, Mingfang Ji, Michael K.M. Kam, Pek-Lan Khong, Damian Khor, Josephine Mun-Yee Ko, Dora L.W. Kwong, Jessica W.Y. Lai, Ka On Lam, Tai Chung Lam, Tai-Hing Lam, Quynh-Thu Le, Anne W.M. Lee, Nancy Y. Lee, Victor H.F. Lee, Kenneth W.S. Li, Jia-Huang Lin, W.T. Lin, Fei-Fei Liu, K.W. Lo, Taixiang Lu, H.L. Lung, Maria Li Lung, Zhi-Ming Mai, N.K. Mak, Jaap M. Middeldorp, Dennis Kai Ming Ip, Alice W.Y. Ng, Wai Tong Ng, Roger K.C. Ngan, John M. Nicholls, Brian O'Sullivan, Jian Ji Pan, Jean Pierre Pignon, A.B. Rickinson, Danny Rischin, Esdy Rozali, Eric Stanbridge, Henry C.K. Sze, Han Chong Toh, C.M. Tsang, S.W. Tsao, Vince Vardhanabhuti, Who-Whong Wang, William Ignace Wei, Weimin Ye, Timothy T.C. Yip, Y.L. Yip, Sue S. Yom, Lawrence S. Young, Yao Yu, Hui Yuan, Kam Tong Yuen, Jing Feng Zong
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::00912442395b7d107ca24b4d2e6d43c5
https://doi.org/10.1016/b978-0-12-814936-2.01002-6 -
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المؤلفون: Wei-Chih Chien, Lynne Gignac, Erh-Kun Lai, Cheng-Wei Cheng, F. M. Lee, Wanki Kim, H. Y. Ho, Huai-Yu Cheng, C. H. Yang, H.L. Lung, Robert L. Bruce, Christian Lavoie, Fabio Carta, Ming-Hsiu Lee, C. W. Yeh, Y. F. Lin, Matthew J. BrightSky, Asit Kumar Ray, Kuo I-Ting
المصدر: 2018 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Materials science, Fast speed, business.industry, Pillar, 020207 software engineering, 02 engineering and technology, 01 natural sciences, 0103 physical sciences, Memory window, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, business, Reset (computing)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::66269e97578f8205658512bd2f732602
https://doi.org/10.1109/iedm.2018.8614580 -
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المؤلفون: C.H. Wang, F.M. Lee, Y.Y. Lin, P.H. Tseng, K.C. Hsu, D.Y. Lee, M.H. Lee, H.L. Lung, K.Y. Hsieh, K.C. Wang, C.Y. Lu
المصدر: Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Materials science, business.industry, Soldering, Optoelectronics, business, Resistive random-access memory, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e32b193dcf623f8644e87d3660de6f5d
https://doi.org/10.7567/ssdm.2018.b-1-04